Abstract:
A sensor and method for remotely determining a presence of a particular substance based on spectral data of the particular substance is disclosed. The sensor includes a sampling module configured to detect radiation from a particular substance using an interferometer, wherein the sampling module includes a control module that is configured to guide and measure spacing of samples taken by the sampling module; a focal plane module configured to detect and convert an interference pattern produced by the interferometer into a series of digital samples; a reference spectra modification module configured to modify reference spectra by modifying according to the measured spacing of samples and an instrument line shape of the sampling module; an estimation module configured to receive the converted series of digital samples and transform the non-uniformly spaced digital samples into frequency space using band centers determined from reference spectra as modified by the instrument line shape of the sampling module; a comparison module configured to compare the transformed digital samples against a database of known chemical signatures; and a determination module configured to determine the presence of the particular substance based on the results of the comparison.
Abstract:
The invention relates to a miniature spectrometer (8) comprising an optical system, a polarization interferometer (15) comprising a polarizer (2), a Savart element (14) and an analyzer (5), a detection unit (12) comprising a detector (7), and a data unit (13). Said miniature spectrometer is characterized in that the optical system is embodied as a diffuser (1).
Abstract:
Interferometer system, including optical means (2, 3, 4, 5) arranged for directing light along a first interferometer path and (separate) second interferometer path, and for combining the light for allowing interferometry, characterized in that the first interferometer path (P1) is provided with a first light transmitting structure (10) having a rotational position that is adjustable with respect to an optical axis of the first path.
Abstract:
An interferometer (1) measures a measuring interference beam, while detecting the position of a moving mirror (16) on the basis of detection results obtained from a reference beam detector (25). In the interferometer, a reference beam source (21) is configured by including a light source (21a) composed of a semiconductor laser device. A reference optical system (20) has a collimating optical system (22) for a reference beam, said collimating optical system converting a laser beam outputted from the reference beam source (21) into a collimated beam, and the collimated beam is diagonally inputted to a fixed mirror (15).
Abstract:
A spectrometer with increased optical throughput and/or spectral resolution includes a plurality of interferometers coupled in parallel. An optical splitter divides a source light beam into a plurality of input beams and directs each of the input beams to a respective one of the plurality of interferometers. One or more detectors are optically coupled to receive a respective output from each of the plurality of interferometers and is configured to detect an interferogram produced as a result of the outputs.