摘要:
An ESD circuit is connected to a power pad and a first node. The ESD circuit includes a RC circuit and a first ESD current path. The RC circuit is connected between the power pad and the first node. The RC circuit is capable of providing a first control voltage and a second control voltage. The first ESD current path is connected between the power pad and the first node. When the power pad receives a positive ESD zap, the first ESD current path is turned on in response to the first control voltage and the second control voltages provided by the RC circuit, so that an ESD current flows from the power pad to the first node through the first ESD current path.
摘要:
A random code generator is installed in a semiconductor chip and includes a PUF cell array, a control circuit and a verification circuit. The PUF cell array includes m×n PUF cells. The control circuit is connected with the PUF cell array. While a enroll action is performed, the control circuit enrolls the PUF cell array. The verification circuit is connected with the PUF cell array. While a verification action is performed, the verification circuit determines that p PUF cells of the PUF cell array are normal PUF cells and generates a corresponding a mapping information, wherein p is smaller than m×n. While the semiconductor chip is enabled, the control circuit reads states of the p normal PUF cells of the PUF cell array according to the mapping information and generates a random code according to the states.
摘要:
A non-volatile memory system includes one or more non-volatile memory cells (20, 40). Each non-volatile memory cell (20, 40) comprises a floating gate, a coupling device (300, 500), a first floating gate transistor (310, 510), and a second floating gate transistor (320, 520). The coupling device (300, 500) is located in a first conductivity region. The first floating gate transistor (310, 510) is located in a second conductivity region, and supplies read current sensed during a read operation. The second floating gate transistor (320, 520) is located in a third conductivity region. Such non-volatile memory cell (20, 40) further comprises two transistors (330, 340, 530, 540) for injecting negative charge into the floating gate during a programming operation, and removing negative charge from the second floating gate transistor (320, 520) during an erase operation. The floating gate is shared by the first floating gate transistor (310, 510), the coupling device (300, 500), and the second floating gate transistor (320, 520), and extends over active regions of the first floating gate transistor (310, 510), the coupling device (300, 500) and the second floating gate transistor (320, 520).
摘要:
The invention provides a code generating apparatus and an OTP memory block. The code generating apparatus of present disclosure includes a plurality of first one time programming (OTP) memory cells, a reference signal provider and a sense amplifier. The first OTP memory cells are coupled to a first bit line. The reference signal provider provides a reference signal. Wherein, at least one of the first OTP memory cells provides a read current to the first bit line, and the sense amplifier compares the read current and the reference signal to generate an output code. A current value of the reference signal is set within a range, and the range is set by the bit current corresponding to a maximum bit count, such as that the output code is determined by a manufacturing variation of the at least one first OTP memory cell.
摘要:
An ESD circuit is connected with a pad. The ESD circuit includes a P-type transistor, an N-type transistor and a control circuit. A first source/drain terminal of the P-type transistor is connected with the pad. A first source/drain terminal of the N-type transistor is connected with a second source/drain terminal of the P-type transistor. A second source/drain terminal of the N-type transistor is connected with a first node. The control circuit is connected with the pad, the first node, a gate terminal of the P-type transistor and a gate terminal of the N-type transistor. When the pad receives an ESD zap, the control circuit provides a first voltage drop to the P-type transistor and provides a second voltage drop to the N-type transistor, so that the P-type transistor and the N-type transistor are turned on.
摘要:
A charge pump apparatus is provided. A two-phase clock signal and a four-phase clock signal for respectively driving a two-phase charge pump circuit and a four-phase charge pump circuit are generated according to delay signals of coupling nodes between delay circuits of a ring oscillator circuit.
摘要:
A power switch circuit includes a first transistor, a second transistor and a current source. A first source/drain terminal and a gate terminal of the first transistor receive a first supply voltage and a second supply voltage, respectively. A second source/drain terminal and a body terminal of the first transistor are connected with a node z. An output signal is outputted from the node z. A first source/drain terminal and a gate terminal of the second transistor receive the second supply voltage and the first supply voltage, respectively. A second source/drain terminal and a body terminal of the second transistor are connected with the node z. The current source is connected between a bias voltage and the node z. The first supply voltage, the second supply voltage or the bias voltage is selected as the output signal.
摘要:
A memory array (300) includes a first memory page (MP1) and a second memory page (MP2). The first memory page (MP1) includes a plurality of first memory cells (M1C 1 to M1C N ) each coupled to a first word line (WL 1 ), a first select gate line (SG 1 ), a first control line (CL 1 ), and a first erase line (EL 1 ), and for receiving a bit line signal (SBL 1 , SBL n , SBL N ) and a source line signal (SSL 1 , SSL n , SSL N ). The second memory page (MP2) includes a plurality of second memory cells (M2C 1 to M2C N ) each coupled to the first word line (WL 1 ), the first select gate line (SG 1 ), a second control line (CL 12 ), and a second erase line (EL 12 ), and for receiving a bit line signal (SBL 11 to SBL 1N ) and a source line signal (SSL 11 to SSL 1N ). By arranging memory cells in different memory pages, the flexibility of memory operations is achieved.