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    SURFACE TEXTURE INDEXING DEVICE, SURFACE TEXTURE INDEXING METHOD, AND PROGRAM
    52.
    发明公开
    SURFACE TEXTURE INDEXING DEVICE, SURFACE TEXTURE INDEXING METHOD, AND PROGRAM 审中-公开
    OBERFLÄCHENTEXTURINDEXIERUNGSVORRICHTUNG，OBERFLÄCHENTEXTURSINDEXIERUNGSVERFAHRENUND PROGRAMM

    公开(公告)号：EP3112849A1

    公开(公告)日：2017-01-04

    申请号：EP15758411.1

    申请日：2015-02-19

    Applicant: Nippon Steel & Sumitomo Metal Corporation

    Inventor： UMEMURA, Jun ,  AKAGI, Toshio

    IPC: G01N21/892

    CPC classification number: G01N21/86 ,  G01B11/24 ,  G01J3/504 ,  G01N21/251 ,  G01N21/255 ,  G01N21/8914 ,  G01N21/892 ,  G01N33/20 ,  G01N2021/8455 ,  G01N2201/062 ,  G01N2201/12 ,  G06T7/0004 ,  G06T2207/10004 ,  G06T2207/10024 ,  G06T2207/30136

    Abstract: [Object] To integratively index a surface property of a measured object by utilizing a measurement result at a plurality of illumination wavelengths and measurement angles.
    [Solution] A surface property indexing apparatus according to the present invention includes a measurement device that generates a plurality of captured images by capturing images of reflected light of illumination light on a surface of the measured object while selecting its wavelength, and an arithmetic processing apparatus that indexes a surface property of the measured object on the basis of the obtained captured images. The captured images generated by the measurement device are of the same wavelength of the reflected light that forms images in an image capturing device, and is of different reflection angles of the reflected light that forms images in the image capturing device in the direction corresponding to the longitudinal direction of the measured object in the captured image. The arithmetic processing apparatus reconstructs the generated captured images to generate a plurality of processing target images having a common wavelength of the reflected light and a common reflection angle of the reflected light and composed of pixels corresponding to the different view field positions of the measured object, and indexes the surface property of the measured object on the basis of the generated processing target images.

    Abstract translation: 通过利用多个照明波长和测量角度的测量结果对被测物体的表面特性进行综合指标。 [解决方案]根据本发明的表面特性分度设备包括：测量装置，其通过在选择其波长的同时拍摄被测量物体的表面上的照明光的反射光的图像来生成多个拍摄图像;以及运算处理装置 其基于获得的捕获图像来索引所测量的对象的表面属性。 由测量装置产生的拍摄图像具有与在图像拍摄装置中形成图像的反射光的相同波长，并且在与图像拍摄装置的对应方向上在图像拍摄装置中形成图像的反射光的反射角不同 拍摄图像中测量对象的纵向方向。 算术处理装置重建生成的拍摄图像，以生成具有反射光的公共波长和反射光的共同反射角并且由对应于被测量物体的不同视野位置的像素构成的多个处理对象图像， 并根据所生成的处理对象图像对被测量物体的表面特性进行索引。

    SYSTEMS AND METHODS FOR MULTI-FLUX COLOR MATCHING
    54.
    发明公开
    SYSTEMS AND METHODS FOR MULTI-FLUX COLOR MATCHING 审中-公开
    用于多流量色彩匹配的系统和方法

    公开(公告)号：EP2972156A1

    公开(公告)日：2016-01-20

    申请号：EP14725801.6

    申请日：2014-03-13

    Applicant: PPG Industries Ohio, Inc.

    Inventor： NORRIS, Alison M.

    IPC: G01J3/50 ,  G01J3/46 ,  G01N21/84

    CPC classification number: G06F19/703 ,  B01F15/00214 ,  G01J3/463 ,  G01J3/504 ,  G01J3/524

    Abstract: A computer implemented method. The method includes generating, using a processor, a set of calibration data relating to a plurality of pigments that are present in a collection of coatings. Generating includes calculating an absorption/reflectance relationship of a plurality of samples coated with a plurality of the pigments, wherein calculating includes using a color matching calculation, and calculating a plurality of concentrations of a non-standard pigment. Generating also includes plotting a relationship between the concentrations and the absorption/reflectance relationships, and determining a correlation of the concentrations for a plurality of Fresnel coefficients relating to the samples. The method further includes determining, using the processor, a coating formulation of a target coating based on the correlation.

    Abstract translation: 计算机实现的方法。 该方法包括使用处理器产生与存在于涂料集合中的多种颜料有关的一组校准数据。 生成包括计算涂覆有多种颜料的多个样品的吸收/反射率关系，其中计算包括使用颜色匹配计算以及计算多个非标准颜料浓度。 生成还包括绘制浓度与吸收/反射关系之间的关系，并确定与样品有关的多个菲涅耳系数的浓度的相关性。 该方法还包括使用处理器基于相关性确定目标涂层的涂层配方。

    TEXTURE ANALYSIS OF A PAINTED SURFACE USING SPECULAR ANGLE DATA
    55.
    发明公开
    TEXTURE ANALYSIS OF A PAINTED SURFACE USING SPECULAR ANGLE DATA 审中-公开
    油漆表面与反射角度DATA纹理分析

    公开(公告)号：EP2912437A1

    公开(公告)日：2015-09-02

    申请号：EP13783435.4

    申请日：2013-10-09

    Applicant: PPG Industries Ohio, Inc.

    Inventor： NORRIS, Alison M.

    IPC: G01N21/55 ,  G01J3/50 ,  G01N21/57 ,  G01N21/84

    CPC classification number: G01N21/25 ,  G01J3/0264 ,  G01J3/504 ,  G01N21/55 ,  G01N21/57 ,  G01N21/8422

    Abstract: A computer implemented method. The method includes obtaining (10), using a processor, spectral reflectance data from a spectrophotometric measurement of a target coating on a surface, wherein the measurement was taken at a specular angle, and removing (12), using the processor, at least a portion of the specular reflectance data that is attributable to a glossy coating of the surface. The method also includes constructing (14), using the processor, at least one spectral reflectance curve, and identifying (20), using the processor, at least one type of pigmentation effect of the target coating based at least in part on the at least one spectral reflectance curve.

    Handfarbmessgerät
    58.
    发明公开
    Handfarbmessgerät 有权

    公开(公告)号：EP2703789A1

    公开(公告)日：2014-03-05

    申请号：EP12182902.2

    申请日：2012-09-04

    Applicant: X-Rite Europe GmbH

    Inventor： Danhamer, Bernd ,  Feri, Lido ,  Kessler, Marco

    IPC: G01J3/02 ,  G01J3/50

    CPC classification number: G01N21/255 ,  G01J3/0272 ,  G01J3/0289 ,  G01J3/504 ,  G01N21/251 ,  G01N2201/0221

    Abstract: Ein speziell für Messungen an gekrümmten Oberflächen konzipiertes Handfarbmessgerät umfasst ein eine Messanordnung beherbergendes Gehäuse (G) mit einem Gehäuseboden (5) und einer darin angeordneten Messöffnung (6), durch welche hindurch die Beleuchtung eines Messflecks auf der Oberfläche eines Messobjekts und das Aufpicken des vom Messfleck zurückgestrahlten Messlichts erfolgt. Die Messanordnung umfasst eine Beleuchtungsanordnung zur Beaufschlagung des Messflecks mit Beleuchtungslicht in mindestens einer Beleuchtungsrichtung und eine Aufpickanordnung zur Erfassung des Messlichts in mindestens einer Beobachtungsrichtung. Am Gehäuseboden (5) ist eine Mehrpunktauflage mit mindestens drei stiftförmigen Stützorganen (51, 52, 53) angeordnet. Zwei Stützorgane (51, 52) liegen symmetrisch zu beiden Seiten der Messöffnung (6), wobei ihre Verbindungslinie parallel zu und in unmittelbarer Nähe einer Beleuchtungs-Beobachtungs-Ebene verläuft, welche durch die Beuchtungs- und Beobachtungsrichtungen definiert ist. Das dritte Stützorgan (53) liegt querab im Abstand zu den beiden anderen Stützorganen (51, 52).

    Abstract translation: 该设备（HFMG）具有容纳测量阵列的壳体和电子控制器，并且具有壳体基座（5）和测量开口（6），测量对象表面上的测量点通过该测量开口照亮，测量光 由测量点反映出来。 壳体基座具有带有三个具有承载区域的销状支撑件（51-53）的轴承单元（7）。 支撑件的支承区域位于垂直于照明观察平面的基础平面中。

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