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    DOWNHOLE SOURCES HAVING ENHANCED IR EMISSION
    52.
    发明公开
    DOWNHOLE SOURCES HAVING ENHANCED IR EMISSION 审中-公开
    晚期IR发射WELL来源

    公开(公告)号：EP2583297A4

    公开(公告)日：2013-10-02

    申请号：EP10853352

    申请日：2010-06-16

    申请人： HALLIBURTON ENERGY SERV INC

    发明人： PELLETIER MICHAEL T ,  JONES CHRISTOPHER M ,  MORYS MARIAN L

    IPC分类号： H01K1/32 ,  G01N21/35 ,  H01K11/00

    CPC分类号： G21K5/00 ,  G01N21/314 ,  G01N21/35 ,  G01N21/3577 ,  G01N21/359 ,  H01J63/00 ,  H01J63/02 ,  H01K1/32 ,  H01K7/00 ,  H01K11/00

    摘要： Light sources are provided with enhanced low-frequency (e.g., near infrared) emission. Some disclosed embodiments include a filament and at least one re-radiator element. The filament heats the re-radiator element to a steady-state temperature that is at least one quarter of the filament's absolute temperature. As disclosed herein, the increased surface area provided by the re-radiator element provides enhanced IR radiation from the light source. Patterning or texturing of the surface can further increase the re-radiator element's surface area. Various shapes such as disks, collars, tubes are illustrated and can be combined to customize the spectral emission profile of the light source. Some specific embodiments employ a coating on the bulb as the re-radiator element. The coating can be positioned to occlude light from the filament or to augment light from the filament, depending on the particular application. The various re-radiator elements can be positioned inside or outside the bulb.

    ELECTROMAGNETIC THZ WAVE GENERATING DEVICE, ELECTROMAGNETIC THZ WAVE DETECTING DEVICE, AND TIME -DOMAIN SPECTROSCOPY APPARATUS
    53.
    发明公开
    ELECTROMAGNETIC THZ WAVE GENERATING DEVICE, ELECTROMAGNETIC THZ WAVE DETECTING DEVICE, AND TIME -DOMAIN SPECTROSCOPY APPARATUS 有权
    装置于产生电磁THz波装置电磁检测中的太赫兹波和时域光谱仪器

    公开(公告)号：EP2609466A1

    公开(公告)日：2013-07-03

    申请号：EP11760875.2

    申请日：2011-08-08

    申请人： Canon Kabushiki Kaisha

    发明人： SEKIGUCHI, Ryota ,  KAJIKI, Kousuke

    IPC分类号： G02F1/377 ,  G01N21/35 ,  G01N21/47

    CPC分类号： G02F1/377 ,  G01N21/35 ,  G01N21/3586 ,  G01N21/4795 ,  G02F2001/374 ,  G02F2203/13

    摘要： An electromagnetic wave generating device is provided which includes an optical waveguide including a plurality of waveguide segments such that the main lobe of a combined electromagnetic wave has a substantially single large directivity. The electromagnetic wave generating device includes the optical waveguide including a plurality of waveguide segments each of which is sandwiched between dielectrics and includes a nonlinear optical crystal. The waveguide segments are arranged such that an angle formed by the directions of propagation of light in the two adjacent waveguide segments substantially corresponds to 2thetac. When ng denotes the refractive index of the nonlinear optical crystal for light and Eeff denotes the effective relative permittivity of an assembly of the dielectrics and the waveguide segments for an electromagnetic wave, thetac is defined as thetac=cos-1 (ng/theta√Eeff).

    THREE-DIMENSIONAL HOT SPOT LOCALIZATION
    54.
    发明公开
    THREE-DIMENSIONAL HOT SPOT LOCALIZATION 审中-公开
    DREIDIMENSIONALE HOT-SPOT-LOKALISIERUNG

    公开(公告)号：EP2580583A1

    公开(公告)日：2013-04-17

    申请号：EP11741492.0

    申请日：2011-06-08

    申请人： DCG Systems, Inc. ,  Fraunhofer Gesellschaft zur Förderung der angewandten Wissenschaft E.V.

    发明人： ALTMANN, Frank ,  SCHMIDT, Christian ,  SCHLANGEN, Rudolf ,  DESLANDES, Herve

    IPC分类号： G01N25/72

    CPC分类号： G01J5/0066 ,  G01J2005/0077 ,  G01J2005/0085 ,  G01N1/00 ,  G01N21/35 ,  G01N21/88 ,  G01N25/00 ,  G01N2021/8461 ,  G01R31/311

    摘要： A non-destructive approach for the 3D localization of buried hot spots in electronic device architectures by use of Lock-in Thermography (LIT). The 3D analysis is based on the principles of thermal wave propagation through different material layers and the resulting phase shift/thermal time delay. With more complex multi level stacked die architectures it is necessary to acquire multiple LIT results at different excitation frequencies for precise hot spot depth localization. Additionally, the use of multiple time-resolved thermal waveforms, measured in a minimized field of view on top of the hot spot location, can be used to speed up the data acquisition. The shape of the resulting waveforms can be analyzed to further increase the detection accuracy and confidence level.

    摘要翻译： 通过使用锁定热成像（LIT）在电子设备架构中对埋藏热点进行三维定位的非破坏性方法。 3D分析基于通过不同材料层的热波传播的原理以及由此产生的相移/热时间延迟。 使用更复杂的多级堆叠管芯架构，需要在不同的激发频率下获取多个LIT结果，以实现精确的热点深度定位。 此外，可以使用在热点位置顶部的最小化视场中测量的多个时间分辨热波形，以加速数据采集。 可以分析所得波形的形状，以进一步提高检测精度和置信度。

    OPTICAL ABSORPTION SPECTROSCOPY WITH MULTI-PASS CELL WITH ADJUSTABLE OPTICAL PATH LENGTH
    57.
    发明公开
    OPTICAL ABSORPTION SPECTROSCOPY WITH MULTI-PASS CELL WITH ADJUSTABLE OPTICAL PATH LENGTH 审中-公开
    与调节的光学距离MULTI-PASS-CELL光学吸收光谱

    公开(公告)号：EP2534456A1

    公开(公告)日：2012-12-19

    申请号：EP11707201.7

    申请日：2011-02-08

    申请人： Duvas Technologies Limited

    发明人： WILKINS, Steven

    IPC分类号： G01J3/42

    CPC分类号： G01J3/42 ,  G01J3/433 ,  G01N21/031 ,  G01N21/33 ,  G01N21/35 ,  G01N21/3504 ,  G01N21/3577

    摘要： An optical absorption spectroscopy apparatus comprises a light source, a detector for detecting an optical absorption spectrum of light transmitted from the source through a sample volume and one or more reflectors for reflecting the transmitted light multiple times through the sample volume. An adjuster device is provided for adjusting at least one optical element so as to vary the path length of the transmitted light by controlling the number of times the light is reflected through the sample volume. Drive means is provided for driving the adjuster device, so enabling the detector to detect the transmitted light at a range of different path lengths.

    METHOD AND DEVICE FOR INSPECTING POOR SEALING OF CONTAINER
    58.
    发明公开
    METHOD AND DEVICE FOR INSPECTING POOR SEALING OF CONTAINER 审中-公开
    VERFAHREN VORRICHTUNG ZUR INSPEKTION SCHLECHTER VERSIEGELUNG EINESBEHÄLTERS

    公开(公告)号：EP2508862A1

    公开(公告)日：2012-10-10

    申请号：EP10834540.6

    申请日：2010-11-30

    申请人： DAIWA CAN COMPANY

    发明人： IJUIN, Taichi ,  YAMAUCHI, Tomio ,  KAWAZOE, Akira ,  TAKATOMI, Tetsuya

    IPC分类号： G01M3/38 ,  B65B57/00 ,  B65B57/02 ,  G01N21/90

    CPC分类号： G01N21/35 ,  G01M3/38 ,  G01N21/3563 ,  G01N21/9054 ,  G01N21/9081

    摘要： A method for inspecting sealing defects of a container using infrared light, which can be carried out to inspect all of containers in a non-contact and non-destructive manner using a comparatively inexpensive apparatus, even if it is not just after a heat sealing operation.
    For this purpose, the infrared light in a wavelength range of 1450nm±20nm is irradiated from a phototransmitter onto the sealed portion of a sample container. The infrared light reflected from or transmitted through the sealed portion of the sample container is received by a photoreceiver 8, and transmitted to a photodetector 10 through an optical fiber 9. The photodetector 10 outputs a voltage according to an amount of the infrared light transmitted thereto, and the voltage thus outputted is then converted into an analog voltage value and further transmitted to a controller 12. The controller 12 sets a threshold based on the analog voltage value transmitted thereto. Then, the infrared light in a same wavelength range as the case of inspecting the sample container is irradiated onto the sealed portion of a container to be inspected. The infrared light reflected from or transmitted through the sealed portion of the inspected container is also converted into the analog voltage value and transmitted to the controller 12. If the infrared light is reduced to be smaller than the threshold set on the basis of the sample container, the sealed portion of the inspected container is judged as a sealing defect.

    摘要翻译： 一种使用红外光检查容器的密封缺陷的方法，即使不是在热封操作之后，也可以使用比较便宜的装置以非接触且非破坏性的方式检查所有的容器 。 为此，将1450nm±20nm的波长范围的红外光从光传递器照射到样品容器的密封部分上。 从样本容器的密封部分反射或透过的红外线由光接收器8接收，并通过光纤9传输到光电检测器10.光电检测器10根据传输到其的红外光的量输出电压 ，然后将这样输出的电压转换成模拟电压值，并进一步传输给控制器12.控制器12基于传输到其上的模拟电压值设定阈值。 然后，与检查容器的情况相同的波长范围的红外线照射到要检查的容器的密封部分。 从被检查容器的密封部分反射或透过的红外光也被转换为模拟电压值并传输到控制器12.如果红外光减小到小于基于样品容器设定的阈值 被检查容器的密封部分被判定为密封缺陷。

    OPTICAL INSPECTION SYSTEM EMPLOYING SHORT WAVE INFRARED SENSING
    59.
    发明公开
    OPTICAL INSPECTION SYSTEM EMPLOYING SHORT WAVE INFRARED SENSING 审中-公开
    WITH短波红外线PERCEPTION光学检查系统

    公开(公告)号：EP2399118A1

    公开(公告)日：2011-12-28

    申请号：EP10711994.3

    申请日：2010-02-19

    申请人： Philip Morris Products S.A.

    发明人： SHYY, Yeu-Hwa

    IPC分类号： G01N21/35 ,  G01N21/86 ,  G01N21/89

    CPC分类号： G01N21/8901 ,  G01N21/35 ,  G01N21/3563 ,  G01N21/8806

    摘要： A system for inspecting cigarette paper containing banded regions and non-banded regions. The system includes a short wave infrared camera (224), the short wave infrared camera forming electrical signals representing properties of the cigarette paper and a processor for analyzing the electrical signals to provide analysis results, the processor including logic for successively examining pixels to determine whether each successive pixel corresponds to a non-banded region or a banded region; logic for computing spacing between adjacent banded regions on the cigarette paper based on results provided by the logic for successively examining; and logic for computing width of banded regions on the cigarette paper based on results provided by the logic for successively examining. An online method for inspecting paper containing banded regions and non-banded regions is also provided.