Abstract:
The present invention relates to a method and optical device for Raman spectroscopy and for observing a sample (7), said device including an optical means for stacking an excitation laser beam (1) having a spectral band B 0 and an observation beam (2) having a spectral band B V so as to form a combined excitation and observation incident beam, and an optical separation means arranged in the path of a collected beam for scattering on the sample (7) and including a first filtering means (12), a second filtering means (13) capable of spatially separating said collected beam into a first secondary beam and two tertiary beams, each of which includes a spectral band selected from the spectral band B 0 of the laser, the spectral band B V of the observation beam, and the spectral band B R of the Raman scattering beam, respectively.
Abstract:
A multi-channel detector assembly (100) for downhole spectroscopy has a reference detector unit (110) optically coupled to a reference channel (50) of a source (40) and has a measurement detector unit (120) optically coupled to a measurement channel (60) of the source (40). The reference and measurement detectors (110,120) detect spectral signals across a spectral range of wavelengths from the reference and measurement channels (50,60). Conversion circuitry converts the detected spectral signals into reference signals and measurement signals, and control circuitry (130) processes the reference and measurements signals based on a form of encoding used by the source (40). Then, the control circuitry (130) can control the output of spectral signals from the source (40) based on the processed signals or scale the measurement signal to correct for source (40) fluctuations or changes in environmental conditions.
Abstract:
The analysis apparatus 10 includes a plasma generation device 11 and an optical analysis device 13. The plasma generation device 11 generates initial plasma by energizing a substance in space to be turned into a plasma state, and maintains the plasma state by irradiating the initial plasma with electromagnetic wave for a predetermined period of time. Then, the optical analysis device 13 analyzes the target substance 15 based on a time integral value of intensity of emission from the target substance 15 in an electromagnetic wave plasma region, which is maintained by the electromagnetic wave.
Abstract:
Infrarotlichtquelle (1) für die Gasdetektion, mit einem Dünnschicht-Infrarotstrahler (2), der im Innenraum (9) eines Schutzgehäuses (3) angeordnet ist, das eine Tragefläche (4) für den Infrarotstrahler (2) und der Tragefläche (4) mit Abstand gegenüberliegend ein Austrittsfenster (7) für Infrarotstrahlung aufweist. Erfindungsgemäß ist vorgesehen, dass der Dünnschicht-Infrarotstrahler (2) eine Platinschicht aufweist und dass von dem Innenraum (9) des Schutzgehäuses (3) mindestens ein Entgasungskanal (10) mit einer Eintrittsöffnung (11) und einer Austrittsöffnung (12) nach außen führt. Für unkritische Anwendungen ist der Entgasungskanal (10) unverschlossen, für kritische Anwendungen kann er mittels einer wasserundurchlässigen, wasserdampfdurchlässigen und gasdiffusionsoffenen Dichtungsmembran (15) abgedichtet sein, wobei die Dichtungsmembran (15) vorzugsweise semipermeabel ausgebildet ist.