公开(公告)号：EP0091692A2

公开(公告)日：1983-10-19

申请号：EP83103538.1

申请日：1983-04-12

Applicant: KÖZPONTI ELELMISZERIPARI KUTATO INTEZET

Inventor： Czabaffy, András ,  Horváth, Loránd, Dr. ,  Kaffka, Károly, Dr.

IPC: G01J3/42 ,  G01N21/27 ,  G01J1/18

CPC classification number: G01J3/02 ,  G01J3/0232 ,  G01J3/0289 ,  G01J3/42 ,  G01N21/274

Abstract: The invention provides on the one hand a method for measuring the spectrum of a material, wherein a sample (10) of the material to be tested is irradiated with a radiation of required wavelengths and the spectrum signals produced by an intensity measuring unit (34) as a result of the radiation reflected or transmitted by the sample (10) are measured. According to the present invention, a zero level signal produced by the intensity measuring unit (34) in an unradiated condition is measured and the measured zero level value is stored, then one or more spectrum signal measurements are performed at at least one wavelength and the measured one or more spectrum values are stored, then the zero level signal produced by the intensity measuring unit (34) is measured again in an unradiated condition and its value is stored, then preferably said one or more spectrum signal measurements at at least one wavelength prescribed and said storage of the measured values as well as said zero level signal measurement and said storage of the measured value are repeated as many times as required, and finally the stored spectrum values are modified by correction values generated on the basis of the stored zero level values. On the other hand the invention is an apparatus for measuring the spectrum of a material comprising a controllable monochromator (1) emitting a radiation of a required wavelength onto a sample (10) of the material to be tested, an intensity measuring unit (34) provided with a sensor (11) sensitive to the radiation reflected or transmitted by the sample (10), a data processing unit (14) connected to the intensity measuring unit (34) via an analog-to-digital converter (13), and a control unit controlling the analog-to-digital converter (13) synchronously with the monochromator (1) while irradiating the sample (10) with the radiation of the required wavelength. According to the invention the control unit comprises means (17, 7, 27, 29, 21,19) to provide at least one start signal onto a control input (31) of the analog-to-digital converter (13) prior to and/or after the period of irradiating the sample (10) with the radiation of the required wavelength (Figure 1).

Abstract translation: 本发明一方面提供一种用于测量材料的光谱的方法，其中待测试材料的样品（10）用所需波长的辐射照射，并且由强度测量单元（34）产生的光谱信号， 作为由样品（10）反射或透射的辐射的结果。 根据本发明，测量在未辐射状态下由强度测量单元（34）产生的零电平信号，并且存储测量的零电平值，然后在至少一个波长上执行一个或多个频谱信号测量，并且 存储测量的一个或多个频谱值，则在未辐射状态下再次测量由强度测量单元（34）产生的零电平信号，并且存储其值，然后优选地，以至少一个波长的所述一个或多个频谱信号测量 规定的并且所述测量值的存储以及所述零电平信号测量和所述测量值的所述存储被重复根据需要多次，并且最后通过基于所存储的零生成的校正值修改存储的频谱值 水平值。 另一方面，本发明是一种用于测量材料的光谱的装置，其包括将待测材料的样品（10）上发射所需波长的辐射的可控单色仪（1），强度测量单元（34） 设置有对由样品（10）反射或透射的辐射敏感的传感器（11），经由模拟 - 数字转换器（13）连接到强度测量单元（34）的数据处理单元（14），以及 控制单元，在用所需波长的辐射照射样品（10）的同时与单色仪（1）同步地控制模拟 - 数字转换器（13）。 根据本发明，控制单元包括在模 - 数转换器（13）的控制输入（31）之前提供至少一个起始信号的装置（17,7,27,29,21,19） /或在用所需波长的辐射照射样品（10）的周期之后。

公开(公告)号：EP4361584A1

公开(公告)日：2024-05-01

申请号：EP23205765.3

申请日：2023-10-25

Applicant: Shimadzu Corporation

Inventor： SHIBUTANI, Ryuta

IPC: G01J3/02 ,  G01J3/08 ,  G01J3/10 ,  G01J3/44

CPC classification number: G01J3/0232 ,  G01J3/08 ,  G01J3/44 ,  G01J3/0213 ,  G01J3/0235 ,  G01J3/10 ,  G01J2003/10420130101 ,  G01J2003/10620130101

Abstract: A micro-Raman device includes a first laser light source, a second laser light source, a first holder, a second holder, a first ND filter, and a second ND filter. The first laser light source and the second laser light source generate first laser light of a first wavelength and second laser light of a second wavelength, respectively. The second wavelength is different from the first wavelength. The first laser light and the second laser light proceed in a second direction orthogonal to a first direction while being separated from each other in the first direction. The first holder and the second holder are arranged overlapping each other in the second direction.

公开(公告)号：EP3325928A1

公开(公告)日：2018-05-30

申请号：EP16750098.2

申请日：2016-07-21

Applicant: Airyx GmbH

Inventor： FINKENZELLER, Henning ,  PÖHLER, Denis ,  PLATT, Ulrich ,  HORBANSKI, Martin

IPC: G01J3/02 ,  G01J3/28 ,  G01J3/42 ,  G01N21/27

CPC classification number: G01J3/42 ,  G01J3/0232 ,  G01J3/0297 ,  G01J3/28 ,  G01N21/39

Abstract: The invention relates to a method and to a device for calibrating an optical resonator. The method comprises the following steps: generating light pulses of a known pulse frequency by means of a light-pulse generation unit; coupling the light pulses into the resonator (20); detecting light exiting the resonator (20) by means of a detection apparatus in order to generate a detection signal, wherein the detection apparatus is designed to generate the detection signal by means of a modulator as a signal modulated with a modulation frequency, wherein the modulation frequency is substantially equal to the pulse frequency of the generated light pulses or wherein the modulation frequency is substantially an integer multiple of the pulse frequency of the generated light pulses or wherein the pulse frequency of the generated light pulses is substantially an integer multiple of the modulation frequency; and calibrating the optical resonator (20) on the basis of the detection signal. The invention further relates to a use of the device according to the invention, to a use of a switchable detector or of an optical modulator, and to a computer program product.

公开(公告)号：EP3062073A2

公开(公告)日：2016-08-31

申请号：EP15194214.1

申请日：2015-11-12

Applicant: National Institute of Meteorological Sciences

Inventor： OH, Young Suk ,  GOO, Tae Young ,  SHIN, Jin Ho ,  LEE, Jong Ho ,  CHUNG, Kyu Sun ,  HEO, Bok Haeng

IPC: G01J1/04 ,  G01J1/26 ,  H01L39/00

CPC classification number: G01J3/0232 ,  G01J1/0437 ,  G01J1/044 ,  G01J1/26 ,  G01J3/0275 ,  G01W1/00

Abstract: The present invention relates to an apparatus for detecting photons according to an atmospheric condition, using a function of adjusting light quantity that can significantly improve reliability of an atmospheric condition analysis result by minimizing noise in a spectrum by maintaining the quantity of incident light uniform within a predetermined range regardless of atmospheric conditions and changes, and to a method of adjusting light quantity. The apparatus for detecting photons in accordance with atmospheric conditions using a function of adjusting light quantity includes: an apparatus case having a light inlet; a light quantity adjuster disposed under the light inlet and adjusting quantity of incident light such that a predetermined quantity of light travels inside; and a controller controlling operation of the light quantity adjuster in accordance with intensity of light detected by the light quantity adjuster.

Abstract translation: 本发明涉及到用于在大气条件下检测雅丁光子，使用调节光量也可显着通过在频谱最小化噪声提高的大气条件的分析结果的可靠性的功能由内的保持入射光均匀的量 预定范围不管大气条件和变化，以及调整光量的方法。 对于与使用调节光量的函数的大气条件雅舞蹈探测光子的装置，包括：具有光入口的装置的情况下; 光入口和调整入射光搜索的量下设置在光量调节器做光的预定量内行进; 以及控制器，控制操作在雅舞蹈的光量调节器与由光量调节器检测到的光的强度的。

公开(公告)号：EP2891003A1

公开(公告)日：2015-07-08

申请号：EP13734260.6

申请日：2013-06-21

Applicant: Raytheon Company

Inventor： KING, Page, E. ,  SCHAUB, Michael, P. ,  FEST, Eric, C.

IPC: G02B5/20 ,  G01J4/00 ,  G02B5/30 ,  G02B27/28 ,  G02B26/00 ,  G02B26/02

CPC classification number: G01J4/04 ,  G01J3/0232 ,  G01J3/0235 ,  G01J3/36 ,  G01J3/513 ,  G01S3/78 ,  G01S3/7803 ,  G01S3/781 ,  G01S5/16 ,  G02B5/201 ,  G02B5/3025 ,  G02B26/007 ,  G02B26/023 ,  G02B27/285 ,  G02B27/286 ,  H04N5/2254 ,  H04N5/332 ,  H04N17/002

Abstract: An optical imaging system and method including a movable pixelated filter array, a shutter mechanism to which the pixelated filter array is attached, and a controller configured to implement a data reduction algorithm. The shutter mechanism is configured to move the pixelated filter array into and out of the optical path, and the data reduction algorithm allows the controller to account for axial and/or lateral misalignment of the filter array relative to the imaging detector array or its conjugate. In certain examples, the controller is further configured to use the data reduction algorithms also to perform wavefront sensing, for example to estimate wavefront error.

公开(公告)号：EP2804032A1

公开(公告)日：2014-11-19

申请号：EP14167311.1

申请日：2014-05-07

Applicant: Compagnie Industrielle des Lasers Cilas

Inventor： Grasser, Régis ,  Moreau, Aurélien

IPC: G02B5/28 ,  G02B26/00 ,  G02B26/02 ,  G01B9/02

CPC classification number: H04N5/2353 ,  G01J3/0232 ,  G01J3/26 ,  G02B5/284 ,  G02B26/001 ,  G02B26/02 ,  H04N5/2254 ,  H04N5/2256 ,  H04N5/2354 ,  H04N5/238

Abstract: - Le dispositif (1) comporte au moins une cavité de Fabry-Pérot (3) présentant un écartement (E) réglable, dont une valeur d'écartement dite nominale permet un passage à travers ladite cavité de Fabry-Pérot (3) pour un rayonnement laser (4) de fréquence correspondante, des moyens d'actionnement (5A) commandables, de type piézo-électrique, aptes à faire varier ledit écartement (E), dans un domaine de valeurs d'écartement comprenant ladite valeur nominale, et une unité de commande (6) pour commander lesdits moyens d'actionnement (5A) de sorte qu'ils fassent varier l'écartement (E) selon une fonction périodique au cours du temps.

公开(公告)号：EP2010954A4

公开(公告)日：2011-01-05

申请号：EP07718682

申请日：2007-04-10

Applicant: MYCROLAB PTY LTD

Inventor： ATKIN MICAH JAMES

IPC: G02B26/04 ,  G02B21/06 ,  G02B26/08

CPC classification number: G02B26/04 ,  G01J3/02 ,  G01J3/0229 ,  G01J3/0232 ,  G01J3/2803 ,  G01J3/2823 ,  G01J3/51 ,  G01J3/513 ,  G03B9/08 ,  G03B21/14

公开(公告)号：EP2247929A1

公开(公告)日：2010-11-10

申请号：EP08709427.2

申请日：2008-02-15

Applicant: The Science and Technology Facilities Council

Inventor： WEIDMANN, Damien

IPC: G01J3/42 ,  G01J3/08 ,  G01N21/39 ,  G01N21/27 ,  G01N21/35

CPC classification number: G01J3/02 ,  G01J3/0208 ,  G01J3/0232 ,  G01J3/0286 ,  G01J3/08 ,  G01J3/427 ,  G01N21/276 ,  G01N21/3518 ,  G01N21/39 ,  G01N2021/399

Abstract: Method and apparatus for detecting, by absorption spectroscopy, an isotopic ratio of a sample, by passing first and second laser beams of different frequencies through the sample. Two IR absorption cells are used, a first containing a reference gas of known isotopic ratio and the second containing a sample of unknown isotopic ratio. An interlacer or reflective chopper may be used so that as the laser frequencies are scanned the absorption of the sample cell and the reference cell are detected alternately. This ensures that the apparatus is continuously calibrated and rejects the baseline noise when phase sensitive detection is used.

公开(公告)号：EP1662986A4

公开(公告)日：2010-06-02

申请号：EP04781974

申请日：2004-08-23

Applicant: C8 MEDISENSORS INC

Inventor： LIPSON JAN

IPC: A61B5/00 ,  G01J3/18 ,  G01J3/30 ,  G01J3/42 ,  G01J3/427 ,  G01J3/44 ,  G01N20060101 ,  G01N21/27 ,  G01N21/31 ,  G01N33/487 ,  G03H1/00

CPC classification number: G01J3/44 ,  G01J3/02 ,  G01J3/0229 ,  G01J3/0232 ,  G01J3/1838 ,  G01N21/274 ,  G01N21/31 ,  G03H1/0005

公开(公告)号：EP2072998A3

公开(公告)日：2009-08-19

申请号：EP08021417.4

申请日：2008-12-10

Applicant: Berthold Technologies GmbH & Co. KG

Inventor： Klaiber, Norbert ,  Berthold, Fritz

IPC: G01N21/64 ,  G01J1/04 ,  G01N27/447

CPC classification number: G01N21/6452 ,  G01J3/02 ,  G01J3/0216 ,  G01J3/0232 ,  G01N21/6408 ,  G01N21/6445 ,  G01N21/76

Abstract: Es wird eine Vorrichtung zur wahlweisen Messung von insbesondere Lumineszenz- und/oder Fluoreszenzstrahlung aus mindestens einem Probenbehälter (11) mittels mindestens einer Lichtquelle (50) im Anregungslichtpfad (AF) für Fluoreszenzmessungen und mindestens einem Detektor (40) mit einem Wellenlängenselektor im Emissionslichtpfad (EF) beschrieben. Um mit einem gemeinsamen Emissionslichtpfad sowohl für Fluoreszenz als auch für Lumineszenz die gleiche Empfindlichkeit erreichen zu können, ist der Emissionslichtpfad (EF) zwischen dem zumindest einen Probenbehälter (11) und dem Wellenlängenselektor durch mindestens ein erstes, eine Reflexionskammer (R) umschließendes Reflektorelement (20) geführt, das zumindest einen Teil des vom Probenbehälter (11) emittierten Lichts gerichtet auf den Wellenlängenselektor wirft, wobei der Anregungslichtpfad (AF) in der Reflexionskammer (R) bis oberhalb des Probenbehälters (11) geführt ist.