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    A MULTI-SLIT SPECTROMETER
    3.
    发明公开
    A MULTI-SLIT SPECTROMETER 审中-公开
    多缝光谱仪

    公开(公告)号：EP3260828A1

    公开(公告)日：2017-12-27

    申请号：EP17176236.2

    申请日：2017-06-15

    Applicant: Metal Power Analytical (I) Pvt. Ltd.

    Inventor： PANT, Priyadarshan Divyadarshan

    IPC: G01J3/443 ,  G01J3/04 ,  G01J3/18 ,  G01J3/32 ,  G01J3/02

    CPC classification number: G01J3/06 ,  G01J3/0218 ,  G01J3/0232 ,  G01J3/04 ,  G01J3/18 ,  G01J3/2803 ,  G01J3/32 ,  G01J3/443 ,  G01J2003/045 ,  G01J2003/061 ,  G01J2003/065 ,  G01J2003/282 ,  G01N21/3103 ,  G01N21/33 ,  G01N2201/0826

    Abstract: The present disclosure relates to the field of optical systems, in particular to an atomic emission spectrometer. The envisaged multi-scan optical system (100) is compact and stable. The system comprises an excitation source (104), a hydra fiber cable (106), a wavelength selector (103), a dispersive optical element (101), and a detector (102). The excitation source is configured to emit composite light. The hydra fiber cable has a head and a plurality of tentacles, and is configured to receive the composite light via a second lens. The plurality of tentacles is configured to emit the composite light towards the wavelength selector which includes a plurality of optical slits (s1 - s8) and a plurality of shutters. The wavelength selector is configured to selectively collect and filter the composite light directed by a first lens and the plurality of tentacles by means of the plurality of shutters. The detector is configured to detect the plurality of spectral line scans reflected by the dispersive optical element for spectrometric analysis.

    Abstract translation: 本发明涉及光学系统领域，具体涉及一种原子发射光谱仪。 设想的多扫描光学系统（100）紧凑且稳定。 该系统包括激励源（104），光纤光缆（106），波长选择器（103），色散光学元件（101）和检测器（102）。 激发源被配置为发射合成光。 液压光缆具有头部和多个触角，并且构造成经由第二透镜接收复合光。 多个触角被配置为朝着波长选择器发射复合光，该波长选择器包括多个光学狭缝（s1-s8）和多个快门。 波长选择器被配置为通过多个快门选择性地收集和过滤由第一镜头和多个触手引导的复合光。 检测器被配置为检测由色散光学元件反射的多个谱线扫描以进行光谱分析。

    MULTI-MODE IMAGING SPECTROMETER
    5.
    发明公开
    MULTI-MODE IMAGING SPECTROMETER 审中-公开
    多模式成像光谱仪

    公开(公告)号：EP3221672A1

    公开(公告)日：2017-09-27

    申请号：EP15757412.0

    申请日：2015-08-24

    Applicant: Raytheon Company

    Inventor： SILNY, John F.

    IPC: G01J3/04 ,  G01J3/08 ,  G01J3/18 ,  G01J3/28 ,  G01J3/02

    CPC classification number: G01J3/2823 ,  G01J3/0208 ,  G01J3/0232 ,  G01J3/027 ,  G01J3/04 ,  G01J3/08 ,  G01J3/18

    Abstract: A multi-mode imaging spectrometer that incorporates two orthogonally positioned entrance slits and is configurable between a first mode in which the system produces images of relatively wide spatial coverage with moderate spectral resolution, using a first one of the two slits, and a second mode in which the system produces images of a smaller spatial area with fine spectral resolution, using the other one of the two slits.

    Abstract translation: 一种多模式成像光谱仪，其包括两个正交定位的入口狭缝并且可配置在第一模式和第二模式之间，第一模式中系统产生具有中等光谱分辨率的相对宽的空间覆盖范围的图像，使用两个狭缝中的第一狭缝， 该系统使用两个狭缝中的另一个产生具有精细光谱分辨率的较小空间区域的图像。

    TRANSIENT GRATING TIME RESOLVED LUMINESCENCE MEASUREMENTS
    6.
    发明公开
    TRANSIENT GRATING TIME RESOLVED LUMINESCENCE MEASUREMENTS 审中-公开
    TG-ZEITAUFGELÖSTELUMINESZENZMESSUNGEN

    公开(公告)号：EP3105539A1

    公开(公告)日：2016-12-21

    申请号：EP15745852.2

    申请日：2015-02-05

    Applicant: Victoria Link Ltd

    Inventor： HODGKISS, Justin M. ,  CHEN, Kai

    IPC: G01B9/02 ,  G01B11/00 ,  G01J3/18

    CPC classification number: G01J1/4228 ,  G01J3/0232 ,  G01J3/2889 ,  G01J3/4406 ,  G01J2003/4424 ,  G01N21/636 ,  G01N21/6408 ,  G01N21/65 ,  G01N2201/061 ,  G01N2201/0696

    Abstract: A transient grating (TG) is used as an optical gating element with sub-picosecond time resolution for luminescence measurements from a photo-detector array. The transient grating is formed in a gate medium by one or more pulsed gate beams. For photoluminescence measurements such as photoluminescence spectroscopy or imaging, a source is excited by a pulsed excitation beam, and the pulsed gate beams are synchronized to the pulsed excitation beam with an adjustable delay between the excitation of the source and the formation of the TG. Moreover, a source or its spectra can be imaged at two different regions of the photo-detector array at two different times spaced in time by a selected duration of time with sub-picosecond resolution over a range of a nanosecond or more. A beam from the source is deflected to the different regions by changing the frequency or geometry of the pulsed gate beams.

    Abstract translation: 使用瞬态光栅（TG）作为光电门控元件，具有亚皮秒时间分辨率，用于从光电检测器阵列进行发光测量。 瞬态光栅通过一个或多个脉冲栅极波束在栅极介质中形成。 对于诸如光致发光光谱或成像的光致发光测量，源通过脉冲激发光束激发，并且脉冲栅极光束与脉冲激发光束同步，在源的激发和TG的形成之间具有可调节的延迟。 此外，源或其光谱可以在光电检测器阵列的两个不同区域以两分之一的时间在一个纳秒或更多的范围内的时间间隔被选择的持续时间成像，具有亚皮秒分辨率。 来自源极的光束通过改变脉冲栅极光束的频率或几何形状而偏转到不同的区域。

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