SPECTROSCOPIC IMAGING DEVICE ADJUSTING METHOD AND SPECTROSCOPIC IMAGING SYSTEM
    66.
    发明公开
    SPECTROSCOPIC IMAGING DEVICE ADJUSTING METHOD AND SPECTROSCOPIC IMAGING SYSTEM 审中-公开
    VORRICHTUNG ZUR ERZEUGUNG SPEKTROSKOPISCHER BILDER UND SPEKTROSKOPISCHES BILDGEBUNGSSYSTEM

    公开(公告)号:EP2871451A1

    公开(公告)日:2015-05-13

    申请号:EP13813547.0

    申请日:2013-07-03

    Abstract: A spectroscopic imaging device adjusting method adjusts a relative arrangement relationship among a collimating lens, a diffraction grating, a condensing lens and an array type light receiving part so as to maximize the value of the following expression (1) for an output values f n from respective light receiving sensors P n when monochromatic light is inputted to a spectroscopic imaging device, wherein α > 1 and n is each integer equal to or larger than 1 and equal to or smaller than N.
    [Expression 1]

    Abstract translation: 光谱成像装置调整方法调整准直透镜,衍射光栅,聚光透镜和阵列型光接收部之间的相对配置关系,以使来自各自的输出值fn的以下表达式(1)的值最大化 当单色光被输入到分光成像装置时,光接收传感器P n,其中±1和n分别为等于或大于1且等于或小于N的整数。[表达式1]

    LASER CHARACTERIZATION SYSTEM AND PROCESS
    68.
    发明公开
    LASER CHARACTERIZATION SYSTEM AND PROCESS 审中-公开
    激光表征系统和方法

    公开(公告)号:EP2647091A2

    公开(公告)日:2013-10-09

    申请号:EP11845511.2

    申请日:2011-12-01

    Abstract: A system and process for automatically characterizing a plurality of external cavity semiconductor laser chips on a semiconductor laser bar separated from a semiconductor wafer. The system includes a diffraction grating and a steering mirror mounted on a rotary stage for rotating the diffraction grating through a range of diffraction angles. A laser bar positioning stage for automatically aligning each laser chip in a laser bar with the diffraction grating. Reflecting a laser beam emitted from a laser chip in a laser bar with diffraction grating and steering mirror to the laser analyzer. Automatically rotating the diffraction grating through a range of diffraction angles relative to the laser beam and automatically characterizing the laser optical properties such as spectra, power, or spatial modes with the laser analyzer at each diffraction angle.

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