公开(公告)号：EP3400428A1

公开(公告)日：2018-11-14

申请号：EP17702963.4

申请日：2017-01-06

Applicant: Nederlandse Organisatie voor toegepast- natuurwetenschappelijk onderzoek TNO

Inventor： KRUIZINGA, Borgert ,  VAN BRUG, Hedser ,  VAN BEIJNUM, Frerik

IPC: G01J3/02 ,  G01J3/18

CPC classification number: G01J3/0208 ,  G01J3/021 ,  G01J3/0259 ,  G01J3/18 ,  G01J2003/1282

Abstract: A monolithic spectrometer (10) for spectrally resolving light (L), comprises a body (2) of solid material having optical surfaces (3,4,5,6a-6c,8) configured to guide the light (L) along an optical path (E1,E2,E3,E4) inside the body (2). The optical surfaces of the body (2) comprise a segmented focusing surface (6a,6b) comprising first and second continuously functional optical shapes (Ca,Cb) to focus received parts of respective beams (La,Lb) onto respective focal position (fa,fb) in an imaging plane (P) outside the body (2). The second continuously functional optical shape (Cb) is separated from the first continuously functional optical shape (Ca) by an optical discontinuity (Dab) there between.

公开(公告)号：EP2975651B1

公开(公告)日：2018-11-14

申请号：EP15176349.7

申请日：2015-07-10

Applicant: THALES

Inventor： LEE-BOUHOURS, Mane-Si Laure ,  LOISEAUX, Brigitte ,  DIAZ, Frédéric ,  LEHOUCQ, Gaëlle

IPC: H01L31/054

CPC classification number: H01L31/054 ,  G01J1/0209 ,  G01J1/0407 ,  G01J1/0411 ,  G01J3/0208 ,  G01J3/0259 ,  G01J3/1804 ,  G01J2001/4266 ,  H01L31/047 ,  H01L31/0543 ,  H01L31/0549 ,  H01L31/0725 ,  Y02E10/52

公开(公告)号：EP2063238B1

公开(公告)日：2018-08-22

申请号：EP08765190.7

申请日：2008-06-05

Applicant: Hamamatsu Photonics K.K.

Inventor： SHIBAYAMA, Katsumi ,  SUZUKI, Tomofumi ,  ITO, Masashi

IPC: G01J3/02

CPC classification number: G01J3/02 ,  G01J3/0208 ,  G01J3/0218 ,  G01J3/0259 ,  G01J3/0291

Abstract: The spectrometer 1 is provided with a package 2 in which a light guiding portion 7 is provided, a spectorscopic module 3 accommodated inside the package 2, and a support member 29 arranged on an inner wall plane of the package 2 to support the spectorscopic module 3. The spectorscopic module 3 is provided with a body portion 11 for transmitting light made incident from the light guiding portion 7 and a spectroscopic portion 13 for dispersing light passed through the body portion 11 on a predetermined plane of the body portion 11, and the spectroscopic portion 13 is supported by the support member 29 on the predetermined plane in a state of being spaced away from the inner wall plane.

公开(公告)号：EP3215805A4

公开(公告)日：2018-07-04

申请号：EP15856966

申请日：2015-10-23

Applicant: TRUTAG TECH INC

Inventor： LEARMONTH TIMOTHY ,  FINKELSTEIN HOD

IPC: G01B9/02 ,  B82Y20/00 ,  G01J3/02 ,  G01J3/26 ,  G06K19/06

CPC classification number: G01J3/26 ,  B82Y20/00 ,  G01J3/0208 ,  G01J3/0237 ,  G01J3/0259 ,  G01J3/0272 ,  G01J3/10 ,  G01J2003/102 ,  G01N21/255 ,  G01N21/27 ,  G01N2201/061 ,  G01N2201/0636

Abstract: A system for wide-range spectral measurement includes one or more broadband sources, an adjustable Fabry-Perot etalon, and a detector. The one or more broadband sources is to illuminate a sample, wherein the one or more broadband sources have a short broadband source coherence length. The adjustable Fabry-Perot etalon is to optically process the reflected light to extract spectral information with fine spectral resolution. The detector is to detect reflected light from the sample, wherein the reflected light is comprised of multiple narrow-band subsets of the illumination light having long coherence lengths and is optically processed using a plurality of settings for the adjustable Fabry-Perot etalon, and wherein the plurality of settings includes a separation of the Fabry-Perot etalon plates that is greater than the broadband source coherence length but that is less than the long coherence lengths.

公开(公告)号：EP3161435A4

公开(公告)日：2018-03-28

申请号：EP15812427

申请日：2015-05-26

Applicant: INTEL CORP

Inventor： HUTCHISON DAVID N ,  KIM KYU HYUN ,  RONG HAISHENG ,  HECK JOHN ,  XU SHENGBO

IPC: G01J3/18 ,  G01J3/02 ,  G01J3/20 ,  G01N21/27 ,  G02B6/12 ,  G02B6/122

CPC classification number: G02B6/4295 ,  G01J3/0218 ,  G01J3/0237 ,  G01J3/0259 ,  G01J3/0297 ,  G01J3/1809 ,  G01J3/1895 ,  G01J3/20 ,  G01J3/32 ,  G02B6/12033

Abstract: Techniques and mechanisms for a monolithic photonic integrated circuit (PIC) to provide spectrometry functionality. In an embodiment, the PIC comprises a photonic device, a first waveguide and a second waveguide, wherein one of the first waveguide and the second waveguide includes a released portion which is free to move relative to a substrate of the PIC. During a metering cycle to evaluate a material under test, control logic operates an actuator to successively configure a plurality of positions of the released portion relative to the photonic device. In another embodiment, light from the first waveguide is variously diffracted by a grating of the photonic device during the metering cycle, where portions of the light are directed into the second waveguide. Different wavelengths of light diffracted into the second waveguide may be successively detected, for different positions of the released portion, to determine spectrometric measurements over a range of wavelength.

公开(公告)号：EP3268707A1

公开(公告)日：2018-01-17

申请号：EP16710612.9

申请日：2016-03-08

Applicant: Corning Incorporated

Inventor： ERTEL, John Phillip ,  KING, Jeffrey Stapleton

IPC: G01J3/02 ,  G01J3/18

CPC classification number: G01J3/427 ,  G01J3/0205 ,  G01J3/0237 ,  G01J3/0256 ,  G01J3/0259 ,  G01J3/0264 ,  G01J3/0272 ,  G01J3/0291 ,  G01J3/18 ,  G01J3/1895 ,  G01J3/26 ,  G01N21/31 ,  G01N21/43 ,  G01N21/552 ,  G01N21/648 ,  G01N2201/0221 ,  G01N2201/024

Abstract: A spectrophotometer optics system is provided. The spectrophotometer optics system includes an optical sensing array and an optical waveguide including an input side and an output side. The input side of the optical waveguide receives input light and the optical sensing array is located at the output side of optical waveguide. The optical waveguide is configured to carry light to be analyzed by total internal reflection to the output side of the optical waveguide and to direct the light to be analyzed toward the optical sensing array. The spectrophotometer optics system includes an optical dispersive element configured to separate the light to be analyzed into separate wavelength components, and the optical dispersive element is supported by the optical waveguide.

公开(公告)号：EP2847557B1

公开(公告)日：2017-08-23

申请号：EP12778758.8

申请日：2012-10-31

Applicant: Elmos Semiconductor Aktiengesellschaft

Inventor： BURCHARD, Bernd ,  KLEINSCHMIDT, Frank ,  MÖLLER, Jesco

IPC: G01J3/02 ,  G02B5/20 ,  G02B5/00 ,  H01L31/0216 ,  H01L27/146

CPC classification number: G01J3/0205 ,  G01J3/0229 ,  G01J3/0259 ,  G01J3/0262 ,  G01J3/04 ,  G02B5/008 ,  G02B5/201 ,  G02B5/204 ,  G02B5/208

公开(公告)号：EP3152788A1

公开(公告)日：2017-04-12

申请号：EP15807428.6

申请日：2015-06-09

Applicant: Stc.Unm

Inventor： BRUECK, Steven, R., J. ,  NEUMANN, Alexander ,  ZARKESH-HA, Payman

IPC: H01L33/58 ,  H01L33/48 ,  F21S2/00

CPC classification number: G01J1/06 ,  G01J1/44 ,  G01J3/0218 ,  G01J3/0259 ,  G01J3/18 ,  G01J3/1895 ,  G01J3/2803 ,  G01J2001/448 ,  G02B6/00 ,  G02B6/10 ,  G02B6/12004 ,  G02B6/122 ,  G02B6/124 ,  H01L27/1446 ,  H01L31/02019 ,  H01L31/02164 ,  H01L31/02327 ,  H01L31/103

Abstract: A 2-D sensor array includes a semiconductor substrate and a plurality of pixels disposed on the semiconductor substrate. Each pixel includes a coupling region and a junction region, and a slab waveguide structure disposed on the semiconductor substrate and extending from the coupling region to the region. The slab waveguide includes a confinement layer disposed between a first cladding layer and a second cladding layer. The first cladding and the second cladding each have a refractive index that is lower than a refractive index of the confinement layer. Each pixel also includes a coupling structure disposed in the coupling region and within the slab waveguide. The coupling structure includes two materials having different indices of refraction arranged as a grating defined by a grating period. The junction region comprises a p-n junction in communication with electrical contacts for biasing and collection of carriers resulting from absorption of incident radiation.

Abstract translation: 2维传感器阵列包括半导体衬底和设置在半导体衬底上的多个像素。 每个像素包括耦合区域和结区域，以及设置在半导体衬底上并从耦合区域延伸到该区域的平板波导结构。 平板波导包括设置在第一包层和第二包层之间的限制层。 第一包层和第二包层各自具有低于限制层的折射率的折射率。 每个像素还包括设置在耦合区域中并且在平板波导内的耦合结构。 耦合结构包括具有不同的折射率布置为由光栅周期限定的光栅的两种材料。 结区域包括与电触点连通的p-n结，用于偏移和收集由吸收入射辐射引起的载流子。

公开(公告)号：EP2469252B1

公开(公告)日：2017-03-22

申请号：EP10809902.9

申请日：2010-08-11

Applicant: Hamamatsu Photonics K.K.

Inventor： SHIBAYAMA Katsumi ,  YOKINO Takafumi

IPC: G01J3/18 ,  G01J3/36 ,  G02B5/10 ,  G02B5/18 ,  G01J3/02

CPC classification number: G01J3/18 ,  G01J3/02 ,  G01J3/0202 ,  G01J3/0208 ,  G01J3/021 ,  G01J3/0256 ,  G01J3/0259 ,  G01J3/2803 ,  G02B5/1814 ,  G02B5/1852 ,  G02B5/1861

Abstract: In a spectroscopic module 1, a flange 7 is formed integrally with a diffraction layer 6 along a periphery thereof so as to become thicker than the diffraction layer 6. As a consequence, at the time of releasing a master mold used for forming the diffraction layer 6 and flange 7, the diffraction layer 6 formed along a convex curved surface 3a of a main unit 3 can be prevented from peeling off from the curved surface 3 a together with the master mold. A diffraction grating pattern 9 is formed so as to be eccentric with respect to the center of the diffraction layer 6 toward a predetermined side. Therefore, releasing the mold earlier from the opposite side of the diffraction layer 6 than the predetermined side thereof can prevent the diffraction layer 6 from peeling off and the diffraction grating pattern 9 from being damaged.

Abstract translation: 在分光模块1中，凸缘7沿着其周边与衍射层6一体地形成为比衍射层6厚。因此，在释放用于形成衍射层的母模时， 6和凸缘7，可以防止沿着主单元3的凸曲面3a形成的衍射层6与母模一起从弯曲表面3a剥离。 衍射光栅图案9形成为相对于衍射层6的中心偏向预定侧。 因此，从衍射层6的与其规定侧相反的相反侧较早地剥离模具可以防止衍射层6剥离，衍射光栅图案9受损。

公开(公告)号：EP2287578B1

公开(公告)日：2016-09-21

申请号：EP09746533.0

申请日：2009-05-08

Applicant: Hamamatsu Photonics K.K.

Inventor： SHIBAYAMA Katsumi

IPC: G01J3/18 ,  G02B7/00 ,  G01J3/02

CPC classification number: G02B5/1861 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/024 ,  G01J3/0243 ,  G01J3/0259 ,  G01J3/0291 ,  G01J3/18