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    Wavelength detecting apparatus and focus detecting apparatus having the same
    3.
    发明公开
    Wavelength detecting apparatus and focus detecting apparatus having the same 有权
    威灵顿万岁魔兽世界

    公开(公告)号：EP2208974A1

    公开(公告)日：2010-07-21

    申请号：EP09174154.6

    申请日：2009-10-27

    Applicant: Samsung Electronics Co., Ltd.

    Inventor： Park, Kyongtae ,  Deng, Shitao

    IPC: G01J3/18 ,  G01J3/28 ,  G03B7/099 ,  G03B13/36 ,  H04N5/232

    CPC classification number: H04N5/23212 ,  G01J3/02 ,  G01J3/0237 ,  G01J3/0278 ,  G01J3/0291 ,  G01J3/1804 ,  G02B7/38 ,  G02B27/0068

    Abstract: A wavelength detecting apparatus capable of detecting the main wavelength of the light coming into an image capture apparatus and a focus detecting apparatus using the same are disclosed. The wavelength detecting apparatus may include a spectral unit which separates the incoming light according to the respective wavelengths, and may focus the separated light onto a sensor. The main wavelength can be determined based on the wavelength distribution sensed by the sensor. The determined wavelength can be used to further determine amount of adjustment to be made to the defocus amount to compensate for the chromatic aberration associated with the wavelength of the light illuminating the source.

    Abstract translation: 公开了能够检测进入图像拍摄装置的光的主波长的波长检测装置和使用该波长检测装置的聚焦检测装置。 波长检测装置可以包括根据各个波长分离入射光的光谱单元，并且可以将分离的光聚焦到传感器上。 主波长可以根据传感器感测到的波长分布来确定。 可以使用确定的波长来进一步确定对散焦量进行的调整量，以补偿与照射源的光的波长相关联的色像差。

    Dispositif d'imagerie multispectral a base de multi-puits quantiques
    4.
    发明公开
    Dispositif d'imagerie multispectral a base de multi-puits quantiques 审中-公开
    基于多量子阱的多光谱成像的设备

    公开(公告)号：EP2180511A2

    公开(公告)日：2010-04-28

    申请号：EP09173958.1

    申请日：2009-10-23

    Applicant: Thales

    Inventor： Nedelcu, M. Alexandru ,  Bois, Philippe ,  Costard, Eric

    IPC: H01L27/146 ,  H01L31/0232 ,  H01L31/0352 ,  H01L31/101

    CPC classification number: H01L27/14625 ,  B82Y20/00 ,  G01J3/0259 ,  G01J3/1804 ,  G01J3/36 ,  G01J2003/1861 ,  H01L27/14621 ,  H01L27/14649 ,  H01L31/02327 ,  H01L31/035236 ,  H01L31/101

    Abstract: L'invention concerne un dispositif d'imagerie multispectrale comprenant une structure à multi-puits quantiques fonctionnant sur des transitions intersousbandes par absorption d'un rayonnement à une longueur d'onde lambda comprise dans un ensemble de longueurs d'ondes auxquelles est sensible ladite structure, ladite structure comportant une matrice de pixels élémentaires de détection caractérisé en ce que la matrice est organisée en sous-ensembles de quatre pixels élémentaires de détection (Eij), un premier pixel élémentaire de détection (P λ1 ) comportant un premier réseau diffractif (R λ1 ) sensible à un premier sous-ensemble de longueurs d'onde, un second pixel élémentaire de détection (P λ2 ) comportant un second réseau diffractif (R λ2 ) sensible à un second sous-ensemble de longueurs d'onde, un troisième pixel élémentaire de détection (P λ3 ) comportant un troisième réseau diffractif (R λ3 ) sensible à un troisième sous-ensemble de longueur d'ondes, un quatrième pixel élémentaire de détection (P Δλ ) ne comportant pas de réseau diffractif sélectif en longueur d'onde, les premier, second et troisième sous-ensemble de longueurs d'onde appartenant à l'ensemble de longueurs d'onde auquel est sensible ladite structure.

    COMPACT CATADIOPTRIC SPECTROMETER
    5.
    发明公开
    COMPACT CATADIOPTRIC SPECTROMETER 审中-公开
    紧凑型超临界光谱仪

    公开(公告)号：EP2047220A2

    公开(公告)日：2009-04-15

    申请号：EP07784900.8

    申请日：2007-07-20

    Applicant: Trinean NV

    Inventor： BOCKSTAELE, Ronny ,  LUYSSAERT, Bert ,  NAESSENS, Kris

    IPC: G01J3/18 ,  G01J3/02

    CPC classification number: G01J3/1804 ,  G01J3/02 ,  G01J3/0205 ,  G01J3/0208 ,  G01J3/0256 ,  G01J3/0264 ,  G01J3/0294 ,  G01J3/18

    Abstract: An optical characterisation system is described for characterising optical material. The system typically comprises a diffractive element (104), a detector (106) and an optical element (102). The optical element (102) thereby typically is adapted for receiving an illumination beam, which may be an illumination response of the material. The optical element (102) typically has a refractive surface for refractively collimating the illumination beam on the diffractive element (104) and a reflective surface for reflecting the diffracted illumination beam on the detector (106). The optical element (102) furthermore is adapted for cooperating with the diffractive element (104) and the detector (106) being positioned at a same side of the optical element (102) opposite to the receiving side for receiving the illumination beam.

    Abstract translation: 描述了用于表征光学材料的光学表征系统。 该系统通常包括衍射元件（104），检测器（106）和光学元件（102）。 光学元件（102）通常适于接收照明光束，该照明光束可以是该材料的照明响应。 光学元件（102）通常具有用于使衍射元件（104）上的照射束折射地准直的折射表面和用于将衍射的照射束反射到检测器（106）上的反射表面。 此外，光学元件（102）适于与衍射元件（104）协作并且检测器（106）位于光学元件（102）的与用于接收照明光束的接收侧相反的一侧。

    Optical spectrum analyzer
    7.
    发明公开
    Optical spectrum analyzer 有权
    Optischer Spektrumanalysator

    公开(公告)号：EP1693657A1

    公开(公告)日：2006-08-23

    申请号：EP06001570.8

    申请日：2006-01-26

    Applicant: Anritsu Corporation

    Inventor： Takahashi, Yoshifumi ,  Saitoh, Takanori ,  Nakamura, Kenichi

    IPC: G01J3/28 ,  G01J3/18

    CPC classification number: G01J3/28 ,  G01J3/02 ,  G01J3/0202 ,  G01J3/021 ,  G01J3/0243 ,  G01J3/1804 ,  G01J2003/2866

    Abstract: An optical spectrum analyzer (20) measures to-be-measured light while carrying out calibration processing for correcting wavelength information of spectrum data of the to-be-measured light by a wavelength information correction device (56) through a storage device (58) based on the spectrum data of reference light that is obtained by causing the reference light whose wavelength is known to be incident on a tunable wavelength filter (25) from light incident devices (21, 22) at all times together with the to-be-measured light. Since the optical spectrum analyzer (20) can continuously measure the to-be-measured light in a wide wavelength range at high speed while maintaining high wavelength accuracy, it can continuously obtain the spectrum data of the to-be-measured light with high wavelength accuracy even if it is installed in a place in which an environment intensely changes.

    Abstract translation: 光谱分析仪（20）在通过存储装置（58）进行用波长信息校正装置（56）进行用于校正被测光的光谱数据的波长信息的校准处理时，测量被测光， 基于通过使已知波长已知的参考光与来自光入射装置（21,22）一起入射到可调谐波长滤波器（25）上的参考光的光谱数据， 测光。 由于光谱分析仪（20）能够在保持高波长精度的同时高速连续地测量宽波长范围内的待测光，因此可以连续地获得高波长被测光的光谱数据 即使将其安装在环境剧烈变化的地方也是如此。

    Monochromator and optical spectrum analyzer using the same
    8.
    发明公开
    Monochromator and optical spectrum analyzer using the same 有权
    单色器和光源单极化器

    公开(公告)号：EP1308704A3

    公开(公告)日：2004-02-04

    申请号：EP02024295.4

    申请日：2002-10-31

    Applicant: Ando Electric Co., Ltd.

    Inventor： Kaneko, Tsutomu ,  Yamamoto, Toshikazu ,  Mori, Tohru

    IPC: G01J3/18

    CPC classification number: G01J3/1804 ,  G01J3/12

    Abstract: A monochromator including: a concave mirror which converts incident light into parallel light and emits the parallel light, a plane diffraction grating for diffracting the parallel light emitted from the concave mirror, first reflection means which reflects first light diffracted by the plane diffraction grating and causes the diffracted light to enter the plane diffraction grating as second incident light, second reflection means which reflects second diffracted light and causes the reflected light to enter the plane diffraction grating as third incident light, and an exit slit disposed in the vicinity of a focal point such that third diffracted light is reflected by the first reflection means, to thereby enter the plane diffraction grating as fourth incident light and such that fourth diffracted light is converged at the focal point by the concave mirror, to thereby enable extraction of light having a specific wavelength.

    Abstract translation: 一种单色仪，包括：将入射光转换成平行光并发射平行光的凹面镜，用于衍射从凹面镜发射的平行光的平面衍射光栅;反射由平面衍射光栅衍射的第一光的第一反射装置， 作为第二入射光进入平面衍射光栅的衍射光，反射第二衍射光并使反射光进入平面衍射光栅作为第三入射光的第二反射装置，以及设置在焦点附近的出射狭缝 使得第三衍射光被第一反射装置反射，从而作为第四入射光进入平面衍射光栅，并且使得第四衍射光被凹面镜聚焦在焦点，从而能够提取具有特定 波长。

    OPTICAL DEMULTIPLEXER AND METHOD OF ASSEMBLING THE SAME
    10.
    发明公开
    OPTICAL DEMULTIPLEXER AND METHOD OF ASSEMBLING THE SAME 审中-公开
    光解复用器和相关方法

    公开(公告)号：EP0982615A4

    公开(公告)日：2003-03-19

    申请号：EP99939221

    申请日：1999-03-11

    Applicant: NIPPON SHEET GLASS CO LTD

    Inventor： NAKAMA KENICHI

    IPC: G01J3/02 ,  G01J3/18 ,  G01J3/28 ,  G02B6/34 ,  H01L27/144 ,  G02B6/293 ,  G02B6/28 ,  G02B27/10

    CPC classification number: H01L27/1446 ,  G01J3/02 ,  G01J3/0256 ,  G01J3/1804 ,  G01J3/2803 ,  G02B6/2931 ,  G02B6/2938

    Abstract: An optical demultiplexer comprises light input means, a collimator lens, a substrate having a diffraction grating, photodetecting means for receiving light dispersed by the diffraction grating. The diffraction grating is of a reflection type and has a light-transmitting region at least at part of the reflecting surface. The light input means and the photodetecting means are opposed to the reflection diffraction grating through the collimator lens. A method of assembling an optical demultiplexer including an input optical fiber, a collimator lens, a diffraction grating having a reflecting surface which has partly a light-transmitting region, and photodetecting means for receiving light dispersed by the diffraction grating, comprises monitoring the light transmitted through the light-transmitting region and thereby adjusting the position of the optical axis of the diffraction grating.

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