公开(公告)号：EP2243011A1

公开(公告)日：2010-10-27

申请号：EP08729745.3

申请日：2008-02-13

Applicant: Hewlett-Packard Company

Inventor： CLARK, Stephan ,  VANBROCKLIN, Andrew ,  DAHLGREN, Brett

IPC: G01J3/50 ,  G01J3/51 ,  G01N21/27

CPC classification number: G01J3/26 ,  G01J3/2803 ,  G01J3/51 ,  G01J3/513

Abstract: A color detector includes a light source, a first filter, and a first photodetector. The light source generates light within a spectrum of wavelengths. The first filter is in optical communication with the light source and is configured to pass light within a first predetermined spectrum of wavelengths. The first photodetector is in optical communication with the first filter and is configured to output a first color signal if light passes through the first filter. The photodetector has an area configured to equalize the first color signal and maximize a signal-to-noise ratio of the first color signal.

公开(公告)号：EP2235484A2

公开(公告)日：2010-10-06

申请号：EP09720812.8

申请日：2009-01-20

Applicant: Silios Technologies

Inventor： TISSERAND, Stéphane ,  HUBERT, Marc ,  ROUX, Laurent

IPC: G01J3/26 ,  H01L27/14 ,  H01L31/0232 ,  G02B5/28

CPC classification number: G01J3/26

Abstract: The invention relates to a wavelength spectroscopy device that comprises, on a substrate SUB, a filtering module comprising two mirrors MIR1, MIR2 separated by a spacing membrane SP. The filtering module includes a plurality of interference filters FP1, FP2, FP3, the thickness of the spacing membrane SP being constant for a given filter and varying from one filter to the other.

公开(公告)号：EP2120082A1

公开(公告)日：2009-11-18

申请号：EP08711136.5

申请日：2008-02-12

Applicant: Olympus Corporation

Inventor： MATSUMOTO, Shinya

IPC: G02B26/00 ,  G01J3/26 ,  G02B5/28

CPC classification number: G02B5/284 ,  G01J3/26 ,  G02B26/001

Abstract: Desired spectral characteristics are obtained by bringing reflection films sufficiently close together while avoiding optical contact between the reflection films. Provided is a variable spectral element (1) that includes a pair of optical substrates (2,3) that oppose each other with a gap therebetween; two mutually opposing reflection films (5) respectively disposed on the opposing surfaces of the optical substrates (2, 3); two mutually opposing sensor electrodes (6) that are disposed respectively on the sides where the reflection films (5) are disposed, and that form a distance sensor that detects the distance between the optical substrates (2,3); and an actuator (4) that changes the distance between the optical substrates (2, 3) by relatively moving the optical substrates (2, 3); wherein the distance between the opposing surfaces of the two reflection films (5) is larger than the distance between the opposing surfaces of the two sensor electrodes (6).

Abstract translation: 通过使反射膜充分靠近在一起同时避免反射膜之间的光学接触来获得期望的光谱特性。 提供了一种可变光谱元件（1），其包括彼此相对的一对光学基板（2,3），其间具有间隙; 分别设置在光学基板（2,3）的相对表面上的两个相互相对的反射膜（5）。 分别设置在反射膜（5）的侧面上的两个相互相对的传感器电极（6），并且形成检测光学基板（2,3）之间的距离的距离传感器。 以及通过相对移动所述光学基板（2,3）来改变所述光学基板（2,3）之间的距离的致动器（4）。 其中两个反射膜（5）的相对表面之间的距离大于两个传感器电极（6）的相对表面之间的距离。

公开(公告)号：EP2118628A1

公开(公告)日：2009-11-18

申请号：EP08719468.4

申请日：2008-02-26

Applicant: Philips Intellectual Property & Standards GmbH ,  Koninklijke Philips Electronics N.V.

Inventor： SCHULZ, Volkmar ,  MEIJER, Eduard Johannes

IPC: G01J3/26 ,  G01J3/28 ,  G01J3/12

CPC classification number: G01J3/26 ,  G01J3/2803 ,  G01J2003/1234

Abstract: The invention relates to an optical detector device (1) for generating at least one electrical output signal in response to a received beam of light, comprising an optical band-pass filter (3a), adapted to receive the beam of light and to provide a filtered beam of light, which filter (3a) has a transmission wavelength which increases in direction of at least one axis (4) and an array of detector elements (2) arranged in direction of the axis (4) to receive the filtered beam of light for generating the electrical output signal.

公开(公告)号：EP2113804A1

公开(公告)日：2009-11-04

申请号：EP08711007.8

申请日：2008-02-08

Applicant: Olympus Corporation

Inventor： YASUDA, Tomoaki

IPC: G02B26/00 ,  A61B1/00 ,  A61B1/04 ,  G01B7/14 ,  G01J3/26 ,  G01J3/36 ,  G02B23/24 ,  G02B23/26

CPC classification number: G02B23/2476 ,  A61B1/04 ,  A61B5/0075 ,  A61B5/0084 ,  G01B7/14 ,  G01J3/02 ,  G01J3/0291 ,  G01J3/26 ,  G02B26/001

Abstract: Sensor electrodes and wiring patterns can be formed with fewer processes, and easy assembly without interference between the wires and optical substrates is realized. Provided is a variable spectroscopy element (1) that includes two optical substrates (3a, 3b) that oppose each other at a distance therebetween and that include reflection films (2) on the opposing surfaces; actuators (3c) that change the distance between the optical substrates; sensors (6) having electrode portions (6a, 6b) that detect the distance between the optical substrates on the opposing surfaces; inclined surfaces (5) that are provided on at least one of the optical substrates (3a (3b)), in the outer peripheral parts of the opposing surfaces, and gradually increase the distance from the other optical substrate (3b (3a)) radially outward and in the plate-thickness direction; and connecting patterns (6e, 6f) that are provided on the inclined surfaces (5) and connect wiring patterns (6c (6d)) that connect to the electrode portions (6a (6b)) of the sensor (6) and connecting patterns (6e, (6f)) that are disposed radially outward with respect to the wiring patterns (6c, (6d)) and connect to wires (7) that output signals from the electrode portions (6a, (6b)) to external parts.

Abstract translation: 可以以更少的工艺形成传感器电极和布线图案，并且实现容易组装而不会在电线和光学基板之间的干扰。 提供了一种可变光谱元件（1），其包括彼此相对的两个光学基板（3a，3b），并且在相对表面上包括反射膜（2） 致动器（3c），其改变光学基板之间的距离; 传感器（6）具有检测相对表面上的光学基板之间的距离的电极部分（6a，6b） 在相对表面的外周部分中设置在至少一个光学基板（3a（3b））上的倾斜表面（5），并且逐渐增加与另一个光学基板（3b（3a））的距离 向外和在板厚方向; 和连接在传感器（6）的电极部分（6a（6b））上的布线图案（6c（6d））和连接图案（6a）之间的连接图案（6e，6f） 6e，（6d））相对于布线图案（6c，（6d））径向向外配置，并且连接到从电极部（6a，（6b））输出信号的导线（7）到外部。

公开(公告)号：EP1991844A4

公开(公告)日：2009-11-04

申请号：EP07757944

申请日：2007-03-05

Applicant: CHEMIMAGE CORP

Inventor： GARDNER CHARLES W ,  MAIER JOHN S ,  NELSON MATTHEW P ,  SCHWEITZER ROBERT C ,  TREADO PARTRICK J ,  VANNI G STEVEN ,  WOLFE JULIANNE ,  DEMUTH JOSEPH E ,  NEISS JASON H ,  WANG CHENHUI

IPC: G01J3/44 ,  G01J3/28 ,  G01J3/45

CPC classification number: G01J3/44 ,  G01J3/02 ,  G01J3/0205 ,  G01J3/0218 ,  G01J3/0256 ,  G01J3/0264 ,  G01J3/0272 ,  G01J3/0283 ,  G01J3/0291 ,  G01J3/10 ,  G01J3/26 ,  G01J3/28 ,  G01J3/2823 ,  G01N21/6456 ,  G01N21/65 ,  G01N2021/6423 ,  G01N2201/0221

公开(公告)号：EP2106537A1

公开(公告)日：2009-10-07

申请号：EP08701723.2

申请日：2008-01-23

Applicant: Valtion Teknillinen Tutkimuskeskus

Inventor： SAARI, Heikki

IPC: G01J3/26 ,  G01N21/17 ,  G01N21/64

CPC classification number: G01J3/10 ,  G01J3/26 ,  G01J3/433 ,  G02B26/001

Abstract: The invention relates to a spectrometer for material analysis and to a control method for a spectrometer. The spectrometer includes a radiant source (140) formed by multiple single radiation sources (141) having different central wavelengths, for generating a measuring signal, a measurement object (100) containing a material to be analyzed, at least one electrically tunable Fabry-Perot filter (120, 220) for the band pass filtering the measuring signal by at least two pass bands, and a detector (300, 400) for detecting said filtered measuring signals received from the measurement object (100). In accordance with the invention the spectrometer has means (312) for modulating each of the single radiation sources (141) and correspondingly means (307, 309) for demodulating the detected signals such that the signal from each single radiation source can be distinguished from each other in the detector (300, 400), and the spectrometer has means for detecting (300, 400) and demodulating (306, 307) multiple pass bands simultaneously.

公开(公告)号：EP1995576A1

公开(公告)日：2008-11-26

申请号：EP07090099.8

申请日：2007-05-23

Applicant: InfraTec GmbH

Inventor： Neumann, Norbert, Dr. Ing. ,  Eberman, Nartin, Dipl.-Ing. ,  Heinze, Matthias, Dr.-Ing.

IPC: G01J3/26 ,  G01J3/36 ,  G01J3/427

CPC classification number: G01J3/02 ,  G01J3/021 ,  G01J3/26 ,  G01J3/36

Abstract: Die Erfindung betrifft eine Anordnung zur Bestimmung von Stoffen und/oder Stoffkonzentrationen, die in unterschiedlichsten Fluiden und insbesondere Gasen, die ein Gemisch einer Vielzahl von Stoffen enthalten können, die mit einem durchstimmbaren Fabry-Perot-Interferometer (4) ausgebildet ist. Unterschiedliche Stoffe können dabei zeitgleich in unterschiedlichen Spektralbereichen analysiert werden. Der Erfindung liegt die Aufgabe zugrunde, Möglichkeiten zur Detektion von Stoffen und/oder Stoffkonzentrationen mit durchstimmbarem Fabry-Perot-Interferometer zu schaffen, ohne dass sich Mehrdeutigkeiten durch Interferenzen höherer Ordnung auf das Messergebnis auswirken. Dabei wird durch das Fabry-Perot-Interferometer (4) transmittierte elektromagnetische Strahlung (8) mittels eines Strahlteilers (15) in mindestens zwei Teilstrahlbündel (16a,16b) zerlegt und dabei mindestens eines der Teilstrahlbündel auf einen außerhalb der optischen Hauptachse angeordneten infrarotoptischen Detektor (9a) durch Reflexion vom Strahlteiler (15) gerichtet.

Abstract translation: 该装置具有可变法布里 - 珀罗干涉仪，用于引导电磁辐射到该法布里 - 珀罗干涉仪的壳体（10）通过对红外窗口（14）。 那就是通过法布里 - 珀罗干涉仪反mitted电磁辐射是使用分束器（15）定向做片段辐射转换成两个分辐射束（16A，16B）。 一个所述部分的辐射束的被照到红外光检测器（9A，9B）由分束器，其中光学红外探测器是一种光学主轴的外部布置的反射。

公开(公告)号：EP1867969B1

公开(公告)日：2008-08-20

申请号：EP07109913.9

申请日：2007-06-08

Applicant: SAGEM Défense Sécurité

Inventor： Pealat, Michel c/o Sagem Defense Securite

IPC: G01J3/28 ,  G01J3/26

CPC classification number: G01J3/2823 ,  G01J3/26

公开(公告)号：EP1076934A4

公开(公告)日：2008-07-30

申请号：EP00939269

申请日：2000-02-07

Applicant: AVANEX CORP

Inventor： CAO SIMON X F

IPC: G01J3/26 ,  G02B6/34 ,  G01B9/02

CPC classification number: G02B6/29302 ,  G01J3/26 ,  G02B6/2706 ,  G02B6/272 ,  G02B6/2773 ,  G02B6/29358 ,  G02B6/29383 ,  G02B6/29386

Abstract: A nonlinear interferometer wavelength separation mechanism (400) for use in a dense wavelength division multiplexer is provided. The mechanism includes a first glass plate (480A) optically coupled to a second glass plate (480B), forming a space therebetween; a mechanism (430) for introducing a phase shift in at least one channel of an optical signal; and a mechanism (400) (420) for broadening a pass band of the optical signal. The nonlinear interferometer (400) of the present invention allows a dense wavelength division multiplexer to have an ease in alignment and a higher tolerance to drifts due to the increase in the width of the pass band. It also has the added ability of being passively stable to temperature.