摘要:
The problem confronting manufacturers of printed circuit boards (2) of differing thickness is that, as the current density increases and the diameter of the holes decreases, the treatment effect on various locations on the outer side of the boards and inside the holes becomes more irregular. To resolve this problem, a conveyorized horizontal processing line and a method of wet-processing printed circuit boards (2) is described. To manufacture the printed circuit boards (2), data about the thickness of the workpiece (2) are acquired before it enters the conveyorized processing line and are stored in a data memory, the workpiece (2) is conveyed through the conveyorized processing line and a structural component, which is provided with at least one transport member (3) for the workpiece (2) and with at least one processing facility (6) and which is disposed above the conveying path (100) in the conveyorized processing line, is adjusted in such a manner that the structural component is raised or lowered and/or pivoted relative to the conveying path as a function of the thickness of the respective one of the workpieces passing said structural component.
摘要:
A plating apparatus comprises a plating unit having a plating bath for holding a plating liquid therein, and a plating liquid monitoring unit having a liquid chromatography device and an arithmetical unit. The liquid chromatography device serves to separate and quantify an additive in a sample of the plating liquid. The arithmetical unit serves to compare a quantified value of the additive with a given concentration predetermined for the additive and to produce an output signal representing the compared result. The plating apparatus further comprises an additive replenishing unit for adding a solution including the additive from an additive tank to the plating liquid in the plating bath based on the output signal from the arithmetical unit in the plating liquid monitoring unit.
摘要:
In order to avoid an edge-effect (increased electrical field line density at the edges of electrolytically to be processed work pieces) during the electrolytic processing of work pieces 3.x in a conveyorized system, the electric currents originating from various counter electrodes 5.x in the plant are set to values in function of the electrolytically to be processed surface areas of the work pieces 3.x as far as they are located directly opposite the respective ones of the various counter electrodes 5.x. Moreover, the distance between the work pieces 3.x and the counter electrodes 5.x is chosen to be 50mm maximum. Means 19 for individually controlling and adjusting every single current supply unit 15.x of the counter electrodes 5.x are provided for this purpose. Said means 19 are configured in such a manner that the respective electric currents originating from the various counter electrodes 5.x are settable to values in function of the electrolytically to be processed surface areas of the work pieces 3.x, as far as they are located directly opposite the respective various counter electrodes 5.x.
摘要:
A plating apparatus (10) for plating a substrate (W). The apparatus (10) is provided with a plating unit (20a to 20d), a substrate cleaning unit (22a, 22b), a substrate transport mechanism (TR) , a post-treatment agent supplying section (4), a minor constituent managing section (3) for managing minor constituents (an accelerator, a retarder and chlorine) of a plating liquid being used in the plating unit (20a to 20d), an enclosure (30) which houses therein a substrate treating section (1) including the plating unit (20a to 20d), the cleaning unit (22a, 22b) and the substrate transport mechanism (TR) , and a system controller (155) for controlling the entire apparatus.
摘要:
Verfahren zum Steuern einer Behandlungslinie, wobei man a) eine Korrelation zwischen einem oder mehreren variablen Parametern der chemischen und/oder physikalischen Prozesse der Behandlungslinie und einer oder mehreren Kenngrößen, die für den Erfolg der Behandlung charakteristisch sind, erstellt, hieraus Regeln ableitet, die die Abhängigkeit der Kenngröße oder der Kenngrößen von den variablen Parametern beschreiben, und die Korrelation und/oder die hieraus abgeleiteten Regeln in einem Steuersystem für die Behandlungslinie abspeichert, b) kontinuierlich oder diskontinuierlich die eine oder mehrere Kenngrößen mißt c) bei einer Abweichung dieser Kenngrößen von einem vorgegebenen Sollwertbereich denjenigen oder diejenigen variablen Parameter, der oder die am stärksten mit dieser Kenngröße korreliert sind, in diejenige Richtung verändert, die der Abweichung der Kenngröße oder der Kenngrößen vom Sollbereich entgegenwirkt.
摘要:
A process for producing an electrodeposited copper foil, comprising electrodepositing a copper foil from an electrolyte containing copper sulfate dissolved therein, in which said electrolyte contains a small amount of lead (Pb) ions, which comprises adding a salt of a metal of Group IIA of the periodic table to the electrolyte in an amount of 10 to 150 mol per mol of lead (Pb) ions contained in the electrolyte so that the lead (Pb) ions contained in the electrolyte react with the metal of Group IIA of the periodic table to thereby form an insoluble composite substance to precipitate, said insoluble composite substance followed by removing it from the electrolyte and forming an electrodeposited copper foil in the electrolyte having the lead (Pb) ions removed therefrom. The invention further provides an electrodeposited copper foil produced by the above process, a copper-clad laminate comprising an insulating substrate having at least one side thereof laminated with this electrodeposited copper foil, and a printed wiring board having desirable wiring pattern formed from the electrodeposited copper foil of the copper-clad laminate.
摘要:
A method and system are disclosed for plating objects. At least one aspect associated with the object plating is monitored to determine the amount of at least one by-product created during the plating and/or the reduction in the amount of at least one plating component. Based on this monitored aspect, an adjustment is made to the flow rate of substances added to a plating cell and/or the flow rate of used plating substances drained from the plating cell. The used plating substances are purified to remove at least some of the by-product and then the purified plating substances are combined with at least one component before passing back into the plating cell to reuse at least some of the plating substances. The method and system could be used during the plating of semiconductor wafers with copper.
摘要:
A plating analysis method is disclosed for electroplating in a system in which resistance of an anode and/or a cathode cannot be neglected. This method comprises giving a three-dimensional Laplace's equation, as a dominant equation, to a region containing a plating solution; discretizing the Laplace's equation by the boundary element method; giving a two-dimensional or three-dimensional Poisson's equation dealing with a flat surface or a curved surface, as a dominant equation, to a region within the anode and/or the cathode; discretizing the Poisson's equation by the boundary element method or the finite element method; and formulating a simultaneous equation of the discretized equations to calculate a current density distribution i and a potential distribution ∅ in the system. The method can obtain the current density and potential distributions efficiently for a plating problem requiring consideration for the resistance of an electrode. The method also optimizes the structure of a plating bath for uniformizing current, which tends to be concentrated in the outer peripheral portion of the cathode, thereby making the plating rate uniform.
摘要:
This invention provides for a palladium replenisher comprising a complex of palladium tetraammine sulfate made according to a process whereby the processing temperature is maintained at or below about 115°C in the presence of excess nitrate solution. The replenisher of the invention is used to replenish depleted palladium during palladium electroplating to maintain the palladium concentration in the bath within from about 5 to about 10 weight percent of recommended plating bath levels.
摘要:
An apparatus (10) for use in processing a workpiece (W) to fabricate a microelectronic component is set forth. The apparatus comprises a process container (14) having a process fluid (38) therein for processing the workpiece and a workpiece holder (16) configured to hold the workpiece. A position sensor is employed to provide position information indicative of the spacing between a surface (S1) of the workpiece and a surface (39) of the process fluid. A drive system provides relative movement between the surface of the workpiece and the surface of the process fluid in response to the position information. Preferably, the relative movement provided by the drive system comprises a first motion that causes the surface of the workpiece to contact the surface of the process fluid, and a second motion opposite the direction all of and following the first to generate and maintain a column of process fluid between the surface of the process fluid and the surface of the workpiece. In one embodiment, the apparatus is configured to electroplate a material onto the surface of the workpiece.