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    ANORDNUNG ZUR ERFASSUNG VON REFLEXIONS-ANISOTROPIE
    64.
    发明公开
    ANORDNUNG ZUR ERFASSUNG VON REFLEXIONS-ANISOTROPIE 有权
    安排收购反射各向异性的

    公开(公告)号：EP3035034A1

    公开(公告)日：2016-06-22

    申请号：EP15199471.2

    申请日：2015-12-11

    Applicant: Leibniz - Institut für Analytische Wissenschaften - ISAS - e.V.

    Inventor： Speiser, Eugen ,  Esser, Norbert ,  Falkenburg, Johannes

    IPC: G01N21/21 ,  G01J4/00 ,  G01J3/447 ,  G02B5/30 ,  G02B27/28 ,  G02F1/01

    CPC classification number: G01N21/21 ,  G02B27/288

    Abstract: Anordnung zur Erfassung der Reflexions-Anisotropie einer Probe (30), enthaltend eine Strahlungsquelle (10) zur Beleuchtung einer Probe (30) derart, dass die von der Strahlungsquelle (30) erzeugte Strahlung im rechten Winkel auf die Probe (30) fällt; einen im Strahlengang zwischen Strahlungsquelle und Probe angeordneten Polarisationsstrahlteiler (18); Mittel zur Polarisationsmodulation (24), welche im Strahlengang zwischen Polarisationsstrahlteiler (18) und Probe (30) angeordnet sind; und (d) einen Detektor zur Erfassung der von der Probe (30) reflektierten Strahlung; ist dadurch gekennzeichnet, dass der Polarisationsstrahlteiler (18) bei Umkehrung der Durchgangsrichtung die Polarisationszustände erhält; und die Mittel zur Polarisationsmodulation einen rotierenden Polarisator (24) enthalten.

    Abstract translation: 装置，用于检测包含用于照射样本（30）的辐射源（10）的样品的反射率各向异性（30），使得来自所述辐射源（30）下降以直角到样品（30）产生的辐射; 一个布置在所述辐射源和所述样品偏振分束器（18）之间的光路; 用于偏振调制（24），其被布置在所述偏振分束器（18）和样本（30）之间的光路; 和（d），用于从（30）所反射的辐射的样品中检测的检测器; 的特征在于，所述偏振分束器（18）在流路的方向反转接收的偏振状态; 和偏振调制的装置包括一个旋转偏振器（24）。

    SPECTROMÈTRE POUR L'ANALYSE DU SPECTRE D'UN FAISCEAU LUMINEUX
    65.
    发明公开
    SPECTROMÈTRE POUR L'ANALYSE DU SPECTRE D'UN FAISCEAU LUMINEUX 审中-公开
    SPECTROMÈTREPOUR L'ANALYZE DU SPTER D'UN FAISCEAU LUMINEUX

    公开(公告)号：EP2929307A1

    公开(公告)日：2015-10-14

    申请号：EP13808131.0

    申请日：2013-11-29

    Applicant: Horiba Jobin Yvon S.A.S.

    Inventor： ACHER, Olivier ,  RICHARD, Simon ,  BRACH, Christian ,  MILLET, Viviane ,  CORDE, Sébastien ,  HERAN, Daphné

    IPC: G01J3/02 ,  G01J3/18 ,  G01J3/447 ,  G02B5/18 ,  G02B27/28

    CPC classification number: G01N21/645 ,  G01J3/021 ,  G01J3/0224 ,  G01J3/18 ,  G01J3/447 ,  G01N2201/063 ,  G01N2201/0633 ,  G02B5/1866 ,  G02B27/283

    Abstract: The present invention relates to a spectrometer (100) for analysing the spectrum of an upstream light beam (1), comprising an entrance slit (101) and collimating means (110) suitable for generating, from the upstream light beam, a collimated light beam (10), characterised in that it also comprises: a polarisation-dependent diffraction grating (120) suitable for diffracting, at each wavelength (11, 12) of the spectrum of the upstream light beam, the collimated light beam into a first diffracted light beam (11, 12) and a second diffracted light beam (21, 22); optical recombining means (130) comprising a planar optical reflecting surface (130) perpendicular to the grating and suitable for deviating at least the second diffracted light beam; and focusing means (140) suitable for focusing, at each wavelength, the first diffracted light beam and the second diffracted light beam onto one and the same focusing area (141).

    Abstract translation: 本发明涉及用于分析上游光束（1）的光谱的光谱仪（100），其包括入口狭缝（101）和准直装置（110），该准直装置适合于从上游光束产生准直光束 （10），其特征在于，其还包括：偏振相关衍射光栅（120），其适于在所述上游光束的光谱的每个波长（11,12）处衍射所述准直光束成为第一衍射光 光束（11,12）和第二衍射光束（21,22）; 光学复合装置（130），包括平面光学反射表面（130），所述平面光学反射表面（130）垂直于所述光栅并且适于至少偏转所述第二衍射光束; 以及聚焦装置（140），适用于在每个波长将第一衍射光束和第二衍射光束聚焦到同一个聚焦区域（141）上。

    VERFAHREN ZUR KORREKTUR VON BILDMESSWERTEN
    69.
    发明公开
    VERFAHREN ZUR KORREKTUR VON BILDMESSWERTEN 审中-公开

    公开(公告)号：EP1805979A1

    公开(公告)日：2007-07-11

    申请号：EP05808238.9

    申请日：2005-10-28

    Applicant: GretagMacbeth AG

    Inventor： EHBETS, Peter ,  KOHLBRENNER, Adrian ,  AMMETER, Harald

    IPC: H04N1/028 ,  G01J3/447 ,  G01J3/46

    CPC classification number: H04N1/02815 ,  G01J3/02 ,  G01J3/0224 ,  G01J3/50 ,  G01J3/51 ,  G01J3/513 ,  G01J2003/468 ,  G01N21/27 ,  G01N21/274

    Abstract: The invention relates to a method for correcting the measured image values of a test object, especially a printed sheet, in terms of at least one influencing variable influencing the result of measurement, using a pixel-operated photoelectric image measuring device, with the object of at least partially eliminating the effect of this influencing variable in terms of the measuring technique used. The measured image values determined by this image measuring device are converted to corrected measured image values using a correction model which is parameterized by correction parameters, and the corrected measured image values are no longer affected by the effect of this influencing variable in terms of the measuring technique used. The correction parameters used for the parameterized correction model are automatically calculated using measured reference values measured by a reference measuring device and the image measuring device and also using selected reference measurement sites, preferably of the same test object. Measured image values measured according to this method without a polarization filter are converted to measured image values measured with a polarization filter. Any influences depending on the pressure medium, fluorescence effects and influences of non-standard measuring geometries are also corrected.

    Abstract translation: 本发明涉及一种使用像素操作的光电图像测量装置就影响测量结果的至少一个影响变量来校正测试对象特别是印刷片的测量图像值的方法，其目的是 至少在所使用的测量技术方面至少部分地消除了这个影响变量的影响。 由该图像测量装置确定的测量图像值使用由校正参数参数化的校正模型转换为校正的测量图像值，并且校正后的测量图像值不再受测量方面的影响变量的影响 使用的技术。 用于参数化校正模型的校正参数使用由参考测量装置和图像测量装置测量的测量参考值自动计算，并且还使用选定的参考测量位置，优选为相同的测试对象。 将没有偏振滤波器的根据该方法测量的测量图像值转换成用偏振滤波器测量的测量图像值。 还会根据压力介质，荧光效应和非标准测量几何形状的影响对其进行校正。

    OPTICAL SPECTRUM ANALYZER
    70.
    发明授权
    OPTICAL SPECTRUM ANALYZER 有权
    光谱分析仪

    公开(公告)号：EP1252489B1

    公开(公告)日：2003-12-17

    申请号：EP01900347.4

    申请日：2001-01-04

    Applicant: EXFO ELECTRO-OPTICAL ENGINEERING INC.

    Inventor： HE, Gang ,  GARIEPY, Daniel ,  SCHINN, Gregory, Walter

    IPC: G01J3/12 ,  G01J4/02 ,  G01J3/447

    CPC classification number: G01J3/12 ,  G01J3/447 ,  G01J4/02

    Abstract: An optical spectrum analyzer comprises a diffraction grating (DG), a polarization decomposing unit (PDM) for decomposing the input light beam into first and second light beams having mutually-perpendicular linear states of polarization, and two output ports (FP2/1, FP2/2) each for receiving from the grating, substantially exclusively, a respective one of the polarized light beams (LT, LR) after diffraction by the diffraction grating (DG). Each of the linearly-polarized light beams is directed onto the diffraction grating with its linear state of polarization at any prescribed angle to a corresponding plane of diffraction of the diffraction grating. The arrangement is such that the state of polarization of the light beams, at any particular wavelength within an operating band of the analyzer remains substantially unchanged with respect to time. The analyzer also may have a reflector (RAM) for reflecting the light beams leaving the diffraction grating after diffraction a first time so as to return them to the diffraction grating for diffraction a second time.

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