公开(公告)号：EP3343205A1

公开(公告)日：2018-07-04

申请号：EP16382678.7

申请日：2016-12-30

Applicant: Lenz Instruments S.L.

Inventor： Philippet, Laurent ,  Romero López, David ,  Williams, Mark ,  Rodríguez Ventura, Juan Manuel ,  Álvarez García, Jacobo

IPC: G01N21/71 ,  B07C5/342 ,  G01J3/443 ,  G01J3/02 ,  G01J3/20 ,  G01N21/84

CPC classification number: G01N21/718 ,  B07C5/342 ,  G01J3/021 ,  G01J3/443 ,  G01N2021/8455 ,  G01N2201/1042 ,  G01N2201/1047

Abstract: 1.- A system (1) for analysing the chemical composition of a target material (100) comprising: [a] a laser system (2) [b] at least one scanner assembly for directing said laser beam (4) onto said target material (100) to produce luminous plasma on said target material (100) and to collect the light emitted thereafter, and [c] a spectral analyser (10). The scanner assembly further comprises at least [d] first light redirecting means (12) being configured such as to let the light pass therethrough when the light falls on one first side (14) of said first light redirecting means (12) and to redirect at least part of the light when the light falls on a second opposite side (16) opposite. Said first light redirecting means (12) are arranged in the system (1) to gather said light emitted by said plasma, collinearly with the laser beam directed onto said target material (100) and to redirect said light emitted by said plasma onto said first focusing means (6).

公开(公告)号：EP3336496A1

公开(公告)日：2018-06-20

申请号：EP17205204.5

申请日：2017-12-04

Applicant: OPTOLANE Technologies Inc.

Inventor： Won, Jun Ho ,  Lee, Do Young ,  Choi, Kyung Hak ,  Choi, An Shik

IPC: G01J3/44 ,  G01N21/64 ,  G01J3/02 ,  G01J3/443 ,  G01J3/51 ,  G01J1/02 ,  G01J1/04 ,  C09B67/20 ,  G01J3/46 ,  G02B5/22

CPC classification number: G01N21/6428 ,  B01L3/50851 ,  C12Q1/686 ,  G01J1/0252 ,  G01J1/0488 ,  G01J3/0286 ,  G01J3/4406 ,  G01J3/443 ,  G01J3/51 ,  G01J2003/468 ,  G01N21/21 ,  G01N2021/6471 ,  G02B5/22

Abstract: The wide-angle emission filter includes a base matrix, a photoresist, and a colorant. The base matrix has a flat shape and including a transparent material. The base matrix does not generate fluorescent light or phosphorescent light by an excitation light. The photoresist is disposed in the base matrix. The photoresist is fixed in a solid state through at least one method selected from the group consisting of thermal hardening, photo hardening, and drying. The colorant is disposed in the base matrix and includes light having a predetermined wavelength range. The wide-angle emission filter filters the excitation light regardless of an incident angle of the excitation light.

公开(公告)号：EP3092478B1

公开(公告)日：2018-02-28

申请号：EP14700162.2

申请日：2014-01-08

Applicant: Universidad Pública De Navarra

Inventor： AGUILERA ANDOAGA, José Antonio ,  ARAGÓN GARBIZU, Carlos

IPC: G01N21/71

CPC classification number: G01N21/718 ,  G01J3/443

Abstract: The quantitative analysis method for analyzing the composition of materials of the invention is based on a functional relationship (curve Cσ) between line intensity and the concentration of the element in the material. The method comprises: obtaining characteristic parameters, selecting the spectral lines of neutral atoms and ions of the elements of interest, obtaining their atomic data; calculating, for the selected lines, a line crosssection; measuring line intensities; determining the concentrations of the elements of interest by means of fitting two graphs Cσ, one for neutral atoms and another for ions with a unit charge, the fitting being performed by means of an iterative algorithm which compares the experimental graphs with the curves Cσ calculated with a plasma model; calculating, for the data of the graphs Cσ, the product of line optical depth by Lorentzian width; evaluating, for the data of the graphs Cσ, a condition on the validity limit of the model, the datum for which the mentioned product is greater being eliminated if the condition is not complied with; repeating the three preceding steps until all data comply with the mentioned condition. The invention has the advantage of not requiring prior calibrations.

公开(公告)号：EP2875328B1

公开(公告)日：2018-02-14

申请号：EP13752846.9

申请日：2013-07-23

Applicant: Pfeiffer Vacuum

Inventor： BOUNOUAR, Julien ,  PALISSON, Julien ,  BUNOD, Philippe ,  RIOUFRAYS, Sylvain ,  HADJ-RABAH, Smail

IPC: G01M3/22 ,  G01M3/38

CPC classification number: G01M3/223 ,  G01J3/443 ,  G01M3/202 ,  G01M3/229 ,  G01M3/38

公开(公告)号：EP3265786A1

公开(公告)日：2018-01-10

申请号：EP16760960.1

申请日：2016-03-02

Applicant: Mécanique Analytique Inc.

Inventor： GAMACHE, Yves

IPC: G01N21/71 ,  G01N21/67

CPC classification number: G01N21/67 ,  G01J3/443 ,  G01N21/01 ,  G01N2201/023

Abstract: A plasma-based detector using optical spectroscopic techniques for analysing the constituents of gas samples are provided. The detector includes a plasma-generating mechanism and a plasma-localizing mechanism. Electron-injecting electrodes may be provided in the plasma chamber of the detector. A Pressure control mechanism as well as a doping module may optionally be included. In accordance with some implementations, the collection, detection and analysis of light extracted from the plasma may enable one or more of various operation modes, such as an emission mode, an absorption mode, and indirect detection mode or a constant emission mode.

公开(公告)号：EP3241015A2

公开(公告)日：2017-11-08

申请号：EP15816321.2

申请日：2015-12-04

Applicant: Thermo Scientific Portable Analytical Instruments Inc.

Inventor： WANG, Peidong ,  LI, Haowen ,  SUN, Rong ,  BUSH, Michael

IPC: G01N21/15 ,  G01N21/71

CPC classification number: G01J3/443 ,  G01J3/0208 ,  G01J3/0262 ,  G01N21/15 ,  G01N21/718

Abstract: Methods and apparatus for laser induced breakdown spectroscopy (LIBS) sample chamber. An apparatus includes a sample chamber, a laser source connected to an excitation optics assembly, the excitation optics assembly connected to a first port on the sample chamber, a collimator assembly connected to a spectrometer, the collimator assembly connected to a second port on the sample chamber, and a first lens tube positioned on the first port and a second lens tube positioned on the second port, the first lens tube protecting the first port connected to the excitation optics assembly and the second lens tube protecting the second port connected to the collimator assembly from particles emitted when a laser pulse from the laser source ablates a surface of a target sample and generates a plasma.

公开(公告)号：EP3215819A1

公开(公告)日：2017-09-13

申请号：EP15790582.9

申请日：2015-11-06

Applicant: Thermo Fisher Scientific (Ecublens) Sarl

Inventor： FARKAS, Romain ,  MAULAZ, Tony

IPC: G01J3/443 ,  H01T13/58 ,  G01N21/67

CPC classification number: G01N21/67 ,  G01J3/443 ,  G01N27/04

Abstract: A controller (316) and method for establishing safe operation of an atomic emission spectrometer (AES) to analyze a sample (100) arranged on a sample holder (102) of the AES. The controller (316) is configured to receive a measurement of at least one test parameter indicative of the arrangement of the sample (100) on the sample holder (102). The at least one test parameter is then compared to a range of target values for that test parameter to determine if the sample (100) is arranged correctly on the sample holder (102). The test parameters may include an electrical parameter dependant on a current between a first and a second terminal at the sample holder (102), gas pressure in a gas chamber housing an electrode of the AES, or displacement of a portion of the sample holder.

Abstract translation: 控制器316和用于建立原子发射光谱仪AES（火花，光发射光谱仪）的安全操作的方法。 测量至少一个测试参数，指示样品在支架102上的布置，并与目标值进行比较。 测试参数可以以时间间隔测量，可以取决于保持器处的第一和第二端子之间的电流，可以是阻抗，保持器102的位移或容纳电极112的腔室中的气体压力。电极 如果所测量的参数不在目标范围内，并且因此样本未被正确布置或安全，则可以经由开关322禁用112。 第一端子可以位于保持器的样品接收器104处，并且第二端子位于钳位元件106处。在测量之前，可以在第一端子和第二端子之间施加电流。

公开(公告)号：EP1937937B1

公开(公告)日：2017-09-06

申请号：EP06815312.1

申请日：2006-09-26

Applicant: BAKER HUGHES INCORPORATED

Inventor： DIFOGGIO, Rocco

IPC: E21B49/08 ,  E21B49/10 ,  E21B47/10 ,  G01J3/443 ,  G01N21/85 ,  G01N33/28 ,  G01N21/69 ,  G01N21/71 ,  G01N21/64 ,  G01N21/67

CPC classification number: E21B47/102 ,  G01J3/443 ,  G01N21/6402 ,  G01N21/67 ,  G01N21/69 ,  G01N21/718 ,  G01N21/8507 ,  G01N33/2823 ,  G01N33/2835 ,  G01N2021/8528 ,  G01N2021/855

公开(公告)号：EP2913664B1

公开(公告)日：2017-05-03

申请号：EP15157054

申请日：2015-02-27

Applicant: ARKRAY INC

Inventor： TANAKA TAKASHIGE ,  SHIRAKI YASUNORI

IPC: G01N21/67 ,  G01N21/71 ,  H05H1/46

CPC classification number: G01J3/443 ,  B23K10/006 ,  G01J3/12 ,  G01N21/67 ,  H05H1/46 ,  H05H1/48

Abstract: The present invention provides a chip for plasma generation, a plasma generator, and a plasma spectrometry method, having high reproducibility of plasma light emission without a requirement of a discharge unit for removing air bubbles. The chip for plasma generation of the present invention includes a channel, the channel has a first region, a narrow portion, and a second region, the narrow portion is in communication with the first region and the second region and has a cross-sectional area smaller than the first region and the second region, and the chip satisfies at least one of the following conditions (1) and (2): (1) at least one of the inner walls of the first region and the second region has a groove portion; and (2) the chip includes a cathode fixed on the inner wall of the first region.

Abstract translation: 本发明提供一种等离子体发生用芯片，等离子体发生器以及等离子体分光测定法，不需要用于除去气泡的排出部，等离子体发光的再现性高。 本发明的等离子体产生用芯片包括沟道，所述沟道具有第一区域，窄部分和第二区域，所述窄部分与所述第一区域和所述第二区域连通，并且所述沟道的横截面积 （1）和（2）中的至少一个：（1）第一区域和第二区域的内壁中的至少一个具有凹槽，该第一区域和第二区域中的至少一个具有凹槽 一部分; （2）芯片包括固定在第一区域的内壁上的阴极。

公开(公告)号：EP2359110B1

公开(公告)日：2017-04-26

申请号：EP09759753.8

申请日：2009-11-03

Applicant: Bertin Technologies

Inventor： SENAC Stéphane

IPC: G01J3/02 ,  G01J3/443 ,  G01N21/27 ,  G01N21/71

CPC classification number: G01J3/443 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/0256 ,  G01J3/0272 ,  G01J3/0291 ,  G01N21/718 ,  G01N2201/0221