公开(公告)号：EP2899498A1

公开(公告)日：2015-07-29

申请号：EP14152842.2

申请日：2014-01-28

Applicant: ABB Technology AG

Inventor： Van Mechelen, Jacobus Lodevicus Martinus ,  Merbold, Hannes

IPC: G01B15/02 ,  G01B11/06

Abstract: A method of characterizing a coated body by at least one coating parameter based on fitting to a physical model is provided. The coated body comprises a substrate coated by a polymeric coating such as a paint film, the polymeric coating having at least one layer. The method is carried out by a sensor system in a non-contact manner, the sensor system comprising an emitter system for emitting THz radiation, a detector system for detecting THz radiation, and a processing unit operationally coupled to the emitter system and the detector system. The method comprises : Emitting, by the emitter system, a THz radiation signal towards the coated body such that the THz radiation interacts with the polymeric coating; Detecting, by the detector system, a response signal being the detected THz radiation signal having interacted with the polymeric coating; Determining model parameters of the physical model by optimizing the model parameters such that a predicted response signal of the physical model is fitted to the detected response signal, the model parameters being indicative of optical properties of the polymeric coating describing the interaction of the THz radiation signal with the polymeric coating; Determining, from the determined model parameters, the at least one coating parameter, wherein the at least one coating parameter includes a thickness of the polymeric coating.

Abstract translation: 提供了一种通过基于与物理模型的拟合的至少一个涂层参数来表征涂覆体的方法。 涂覆体包括由聚合物涂层（例如漆膜）涂覆的基底，聚合物涂层具有至少一层。 该方法由传感器系统以非接触方式进行，传感器系统包括用于发射THz辐射的发射器系统，用于检测THz辐射的检测器系统，以及可操作地耦合到发射器系统和检测器系统的处理单元 。 该方法包括：通过发射器系统向涂覆体发射THz辐射信号，使得THz辐射与聚合物涂层相互作用; 通过检测器系统检测作为与聚合物涂层相互作用的检测到的THz辐射信号的响应信号; 通过优化模型参数来确定物理模型的模型参数，使得物理模型的预测响应信号适应于检测到的响应信号，模型参数表示聚合物涂层的光学性质，描述了THz辐射信号的相互作用 与聚合物涂层; 从所确定的模型参数确定所述至少一个涂层参数，其中所述至少一个涂层参数包括聚合物涂层的厚度。

公开(公告)号：EP2899497A1

公开(公告)日：2015-07-29

申请号：EP14152840.6

申请日：2014-01-28

Applicant: ABB Technology AG

Inventor： Van Mechelen, Jacobus Lodevicus Martinus

IPC: G01B11/06 ,  G01B15/02

CPC classification number: G01N21/3581 ,  G01B11/0616 ,  G01B11/0625 ,  G01B11/0683 ,  G01N33/32 ,  G01N2201/061 ,  G01N2201/12

Abstract: A method of characterizing a wet paint layer 4a of a painted body 2 by paint layer parameters based on fitting to a physical model is provided. The method is carried out by a sensor system 1 in a non-contact manner, the sensor system comprising an emitter system 10 for emitting THz radiation, a detector system 20 for detecting THz radiation, and a processing unit 30 operationally coupled to the emitter system 10 and the detector system 20. The method comprises: Emitting, by the emitter system 10, a THz radiation signal 60 towards the painted body 2 such that the THz radiation interacts with the wet paint layer 4a, the wet paint layer 4a having not yet finished a drying process during which the wet paint layer becomes a dry paint layer; Detecting, by the detector system 20, a response signal 74 being the detected THz radiation signal 70 having interacted with the wet paint layer 4a; Determining model parameters of the physical model by optimizing the model parameters such that a predicted response signal of the physical model is fitted to the detected response signal, wherein the model parameters are indicative of optical properties of the wet paint layer 4a describing the interaction of the THz radiation signal with the wet paint layer 4a; and Determining, from the determined model parameters, the paint layer parameters, wherein the paint layer parameters include a predicted dry layer thickness of the wet paint layer 4a.

Abstract translation: 提供了一种通过基于与物理模型的拟合的涂层参数来表征涂漆体2的湿漆层4a的方法。 该方法由传感器系统1以非接触的方式进行，传感器系统包括用于发射THz辐射的发射器系统10，用于检测THz辐射的检测器系统20，以及可操作地耦合到发射器系统的处理单元30 该方法包括：通过发射器系统10向喷涂体2发射THz辐射信号60，使得THz辐射与湿涂层4a相互作用，湿涂层4a还没有 完成干燥过程，其中湿漆层变成干漆层; 通过检测器系统20检测作为与湿涂层4a相互作用的检测到的THz辐射信号70的响应信号74; 通过优化模型参数来确定物理模型的模型参数，使得物理模型的预测响应信号适合于检测到的响应信号，其中模型参数表示湿涂层4a的光学性质，描述了 具有湿漆层4a的THz辐射信号; 以及从确定的模型参数确定涂层参数，其中涂层参数包括湿涂层4a的预测干层厚度。

公开(公告)号：EP2988116B1

公开(公告)日：2017-04-12

申请号：EP14181427.7

申请日：2014-08-19

Applicant: ABB Technology AG

Inventor： Van Mechelen, Jacobus Lodevicus Martinus ,  Panella, Barbara ,  Garcia, Mercedes Victoria ,  Westerwaal, Ruud Johannes ,  Dam, Bernhard

IPC: G01N21/77 ,  G01N33/00 ,  G01N33/28

CPC classification number: G01N33/2841 ,  G01N21/7703 ,  G01N2021/772 ,  G01N2021/7773 ,  G01N2201/088

Abstract: An optical sensor for detecting hydrogen in a fluid in physical contact with the sensor is provided. The sensor comprises an optical fiber, wherein an end portion of the optical fiber is coated with a multilayer comprising: a sensing layer, comprising a film of an alloy, the alloy comprising Mg, Ni, and M, wherein M is at least one of Zr, Ta, and Hf, and wherein the alloy has the composition Mg x Ni y M z , and wherein x is from 40 to 60, y is from 10 to 40, and z is from 10 to 40, and a catalyst layer comprising Pd. Further, a detection system for hydrogen, comprising such an optical sensor, and an electrical device having such a detection system are provided.

Abstract translation: 提供了一种用于在与所述传感器物理接触的流体检测氢的光学传感器。 光纤，worin在光纤的端部的所述传感器包括被涂覆有多层，包括：感测层，其包括合金的膜，该合金包含Mg，Ni和男，worin M是中的至少一个 的Zr，Ta和Hf和worin该合金具有的Mg X的Ni Y M z中的组合物，和worin x是40至60，y为10至40，z是10至40，和催化剂层，其包括 钯。 另外，在审查的检测系统被设置在电子装置为氢的检测系统，包括寻求光学传感器，和。

公开(公告)号：EP2988116A1

公开(公告)日：2016-02-24

申请号：EP14181427.7

申请日：2014-08-19

Applicant: ABB Technology AG

Inventor： Van Mechelen, Jacobus Lodevicus Martinus ,  Panella, Barbara ,  Garcia, Mercedes Victoria ,  Westerwaal, Ruud Johannes ,  Dam, Bernhard

IPC: G01N21/77 ,  G01N33/00

CPC classification number: G01N33/2841 ,  G01N21/7703 ,  G01N2021/772 ,  G01N2021/7773 ,  G01N2201/088

Abstract: An optical sensor for detecting hydrogen in a fluid in physical contact with the sensor is provided. The sensor comprises an optical fiber, wherein an end portion of the optical fiber is coated with a multilayer comprising: a sensing layer, comprising a film of an alloy, the alloy comprising Mg, Ni, and M, wherein M is at least one of Zr, Ta, and Hf, and wherein the alloy has the composition Mg x Ni y M z , and wherein x is from 40 to 60, y is from 10 to 40, and z is from 10 to 40, and a catalyst layer comprising Pd. Further, a detection system for hydrogen, comprising such an optical sensor, and an electrical device having such a detection system are provided.

公开(公告)号：EP2899499A1

公开(公告)日：2015-07-29

申请号：EP14152844.8

申请日：2014-01-28

Applicant: ABB Technology AG

Inventor： Van Mechelen, Jacobus Lodevicus Martinus ,  Merbold, Hannes

IPC: G01B15/02 ,  G01B11/06

CPC classification number: G01N33/32 ,  B05B12/084 ,  G01B11/0625 ,  G01B11/0683 ,  G01B15/02 ,  G01N21/55 ,  G01N21/59 ,  G01N2201/06113 ,  G01N2201/0697

Abstract: A sensor system for characterizing a coating 4, such as a paint film, of a coated body 2 in a non-contact manner by use of THz radiation is provided. The sensor system comprises a THz system 1, a processing unit 30 and a positioning system 40. The THz system 1 comprises a light source 50 for generating a source light radiation; a flexible first radiation guide cable 51 for transmitting the source light radiation; a THz emitter 10 comprising a THz radiation generator 12 coupled to the light source 50 via the flexible first radiation guide cable 51 for receiving the source light radiation from the light source 50 and adapted for generating outgoing THz radiation 60 from the source light radiation, and a THz optical system 14 for directing the outgoing THz radiation towards the coated body 2; and a THz detector 20 for detecting incoming THz radiation 70 having interacted with the coating 4. The positioning system 40 comprises a movable unit 42 carrying the THz emitter 10 so that by moving the movable unit 42 the THz emitter 10 is positioned relative to the coated body 2. The light source 50 is arranged outside of the movable unit 42 so that when the movable unit 42 is moved, the THz emitter 10 is moved relative to the light source 50 while the THz emitter 10 keeps being coupled to light source 50 via the flexible first radiation guide cable 51. The processing unit 30 is operationally coupled to the THz detector 20 for receiving and processing a detected response signal representing the detected THz radiation.

Abstract translation: 提供了一种用于通过使用太赫兹辐射以非接触方式表征涂层体2的涂层4（例如漆膜）的传感器系统。 传感器系统包括太赫兹系统1，处理单元30和定位系统40.太赫兹系统1包括用于产生源光辐射的光源50; 用于传输源光辐射的柔性第一辐射导引电缆51; 太赫兹发射器10包括经由柔性第一辐射导引电缆51耦合到光源50的THz辐射发生器12，用于接收来自光源50的源光辐射，并适于从源光辐射产生出射THz辐射60;以及 用于将输出的THz辐射引向涂覆体2的太赫兹光学系统14; 以及用于检测与涂层4相互作用的输入THz辐射70的THz检测器20.定位系统40包括携带THz发射器10的可移动单元42，使得通过移动可移动单元42，THz发射器10相对于被涂覆的 光源50布置在可移动单元42的外部，使得当移动单元42移动时，太赫兹发射器10相对于光源50移动，而太赫兹发射器10保持经由 柔性第一辐射导向线51.处理单元30可操作地耦合到太赫兹检测器20，用于接收和处理检测到的表示检测到的太赫兹辐射的响应信号。