MICROSCOPY SYSTEM, REFRACTIVE-INDEX CALCULATING METHOD, AND PROGRAM
    4.
    发明公开
    MICROSCOPY SYSTEM, REFRACTIVE-INDEX CALCULATING METHOD, AND PROGRAM 有权
    MIKROSKOPSYSTEM,BRECHUNGSINDEXBERECHNUNGSVERFAHREN UND PROGRAMM

    公开(公告)号:EP3118665A1

    公开(公告)日:2017-01-18

    申请号:EP16178657.9

    申请日:2016-07-08

    Abstract: A microscopy system includes a microscope apparatus (100,20;200,20:300,20) that has an objective (110) and a correction device (111) correcting for a spherical aberration, and a refractive index calculator (20d) that calculates a refractive index of a sample (S) at a target position in the sample (S) on the basis of a plurality of target set values each of which is a set value of the correction device (111) and each of which corresponds to an amount of spherical aberration that occurs in the microscope apparatus (100,20;200,20:300,20) when an observation target plane is situated at a different position in the sample (S) in an optical-axis direction of the objective (110).

    Abstract translation: 显微镜系统包括具有物镜(110)和矫正装置(111)校正球面像差的显微镜装置(100,20; 200,20:300,20)和计算出的球面像差的折射率计算器(20d) 基于多个目标设定值,其中每个目标设定值是校正装置(111)的设定值,并且每个目标设定值对应于所述样本(S)的目标位置的样本(S)的折射率, 当观察目标平面位于物体的光轴方向上的样品(S)中的不同位置时,在显微镜装置(100,20; 200,20:300,20)中发生的球面像差的量( 110)。

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