SOLDER BONDING STRUCTURE AND SOLDERING FLUX
    1.
    发明公开
    SOLDER BONDING STRUCTURE AND SOLDERING FLUX 审中-公开
    LÖTBINDUNGSSTRUKTURUNDLÖTFLUSSMITTEL

    公开(公告)号:EP2243592A4

    公开(公告)日:2017-06-21

    申请号:EP09712255

    申请日:2009-02-19

    Inventor: AIHARA MASAMI

    Abstract: Disclosed is a solder bonding structure which is capable of retaining sufficient solder bonding strength and ensuring high bonding reliability even in severe environments having an extremely large temperature difference. In the solder bonding structure, an electronic component 4 is mounted on a main surface 1a of a substrate having an electrode section 2 and an insulating film 3, and the electrode section 2 and the electronic component 4 are electrically bonded to each other through a solder section 5, and a flux residue 6 exuded from the solder section 5 is present between the electronic component 4 and the insulating film 3. The flux contains an acrylic resin, an activating agent, and a thixotropic agent having a hydroxyl group. The glass transition point of the acrylic resin is not higher than -40°C, or not lower than the softening temperature of the flux residue. The flux residue has a maximum value of 300×10 -6 /K or less of linear thermal expansion coefficient within a temperature range from -40°C to the softening temperature of the flux residue.

    Abstract translation: 本发明公开了一种焊料结合结构,即使在温差非常大的恶劣环境下也能够保持足够的焊料结合强度并确保高结合可靠性。 在焊料接合结构中,电子部件4安装在具有电极部2和绝缘膜3的基板的主表面1a上,并且电极部2和电子部件4通过焊料彼此电接合 在电子部件4与绝缘膜3之间存在从焊料部5渗出的助焊剂残留物6.焊剂含有丙烯酸树脂,活化剂和具有羟基的触变剂。 丙烯酸树脂的玻璃化转变点不高于-40℃或不低于助熔剂残余物的软化温度。 在助焊剂残渣的-40℃至软化温度的温度范围内,助熔剂残留物具有300×10 -6 / K以下的线性热膨胀系数的最大值。

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