摘要:
An insulated gate bipolar transistor (IGBT) permits a large current to uniformly flow. A plurality of single crystal island regions (61) are formed in a supporting substrate (2) using dielectric films (1). Formed in each of the island regions are an n⁻ first region (61), a p second region (41) within the first region, an n⁺ third region (32) within the second region (41) and a p⁺⁺ fourth region (11) between the first region (61) and the dielectric film. All of these regions are exposed to the surface of the island region. Formed on the surface of the island region are a first main electrode (E) kept in ohmic contact with the second (41) and third (32) regions, a second main electrode (C) kept in ohmic contact with the fourth region (11) and a control electrode (G) located on the second (41) and third region (32) through an insulator (6).
摘要:
A gate turn-off thyristor and a transistor are disclosed, each of which comprises: a semiconductor substrate (1,101) including at least three semiconductor layers between a pair of principal surfaces, adjacent ones of the semiconductor layers being different in conductivity type from each other, a first one of the semiconductor layers being formed of at least one strip-shaped region (20, 120) with a constant width, a second one (30, 130) of the semiconductor layers being exposed to a first principal surface of the semiconductor substrate together with the strip-shaped region; a first main electrode (2.102) kept in ohmic contact with the strip-shaped region at the first principal surface; a first control electrode (3a, 103a) kept in ohmic contact with the second semiconductor layer (30, 130) on one side of the strip-shaped region in the direction of the width thereof and connected directly to a control terminal (6, 106); a second control electrode (3b, 103b) kept in ohmic contact with the second semiconductor layer on the other side of the strip-shaped region in the direction of the width thereof and connected to the control terminal through the first control electrode and the resistance (R) of the second semiconductor layer between the first control electrode and the second control electrode; a second main electrode (4. 104) kept in ohmic contact with a second principal surface of the semiconductor substrate; and means provided in the semiconductor substrate for accelerating the spatial biasing of a conductive region to the other side of the strip-shaped region in the direction of the width thereof when a current flowing across the semiconductor substrate is cut off, thereby enlarging the area of safety operation.
摘要:
A gate turn-off thyristor is disclosed, which comprises semiconductor substrate (1) in which a cathode emitter layer (5), a first base layer (4), a second base layer (3), and an anode emitter layer (2) are formed in this order such that pn junctions are made between respective adjacent ones of the layers. The cathode emitter layer (5) are divided into portions each of which is exposed at one of the main surfaces of the semiconductor substrate (1), the anode emitter layer (2) is exposed to the other main surface thereof, each of the separated cathode emitter layer portions (5) is made in low resistance contact with an anode electrode (7) and the second base layer (3) has a thickness W nB [pm] determined by the condition: or where V BO [V] is a breakover voltage.
摘要:
A semiconductor device includes a semiconductor substrate (100) having at least three semiconductor layers (1, 2, 3) of alternative different conductivity types between a pair of principal surfaces. A pair of main electrodes (6, 8) are kept in low-resistance contact with the outermost ones (1, 3) of the semiconductor layers. A surface-passivation insulating film (10) is provided on an exposed surface of the semiconductor substrate (100). A resistive material sheet (11) is provided on the insulating film (10) and connected electrically to semiconductor layers (1, 3) having their potentials substantially equal to the main electrodes (6, 8).
摘要:
The present invention relates to a semiconductor device having complicated bipolar transistor and MOSFET. In an equivalent circuit of this semiconductor device, MOSFET (3) is connected between the base (33) and emitter (34) of the bipolar transistor (1). The bipolar transistor (1) is a vertical type transistor, and MOSFET (3) a lateral type transistor. The MOSFET (3) is formed on a base (33) surface on the side of one main surface on which the emitter (34) of the bipolar transistor (1) is exposed, in such a manner that the MOSFET (3) is substantially opposed to the emitter (34).
摘要:
A semiconductor device such as a transistor or gate turn-off thyristor provided with a control electrode for improving the current cut-off performance, is disclosed in which an emitter layer (1d) of a semiconductor substrate is formed of a plurality of strip-shaped regions, a base layer (1c) adjacent to the strip-shaped regions is exposed to one principal surface of the semiconductor substrate together with the strip-shaped regions, one main electrode (2) is provided on each strip-shaped region, first and second control electrodes (3b, 3a) are provided on the base layer, on one and the other sides of each strip-shaped region viewed in the direction of the width thereof, respectively, the other main electrode is provided on the second principal surface of the semiconductor substrate, and a gate terminal (6) is not connected to the first control electrode (3b) but connected to the second control electrode (3a), in order to draw out carriers unequally by the first and second control electrodes at a turn-off period. At the initial stage of turn-off action, carriers are drawn out mainly by the second control terminal (3a), and a conductive region contracts so as to be limited to the first control electrode side. At the final stage of turn-off action, carriers are drawn out considerably by the first control electrode (3b), to complete the turn-off action.
摘要:
A gate turn-off thyristor in which a cathode-emitter layer (2) is divided into a plurality of striplike regions which are radially arrayed on a major surface of a semiconductor substrate in a coaxial multi-ring pattern including a plurality of coaxially arrayed rings (R 1 , ..., R s ). The cathode-emitter strips (2) belonging to a given one of the rings have a same radial length. The cathode-emitter strips belonging to the inner ring of a coaxial multi-ring pattern have a smaller radial length than that of the cathode-emitter strips (2) constituting the outer ring. A cathode electrode (8) is contacted to the cathode-emitter strip (2) in low resistance ohmic contact. A gate electrode (9) is ohmic contacted with a low resistance to a cathode-base layer (3) located adjacent to the cathode-emitter strip (2) so as to enclose it. An anode electrode (7) is ohmic contacted with a low resistance to the anode-emitter layer (5). With the structure of GTO, turn-off operation of unit GTO's each including a cathode-emitter strip is equalized.
摘要:
A gate turn-off thyristor is disclosed, which comprises semiconductor substrate (1) in which a cathode emitter layer (5), a first base layer (4), a second base layer (3), and an anode emitter layer (2) are formed in this order such that pn junctions are made between respective adjacent ones of the layers. The cathode emitter layer (5) are divided into portions each of which is exposed at one of the main surfaces of the semiconductor substrate (1), the anode emitter layer (2) is exposed to the other main surface thereof, each of the separated cathode emitter layer portions (5) is made in low resistance contact with an anode electrode (7) and the second base layer (3) has a thickness W nB [pm] determined by the condition: or where V BO [V] is a breakover voltage.
摘要:
In a semiconductor device such as a pn-junction diode, a Schottky diode, a JFET, a MOSFET or a MESFET, a drift layer is made of two layers, a first layer (12) and a second layer (13) having the same conductivity type as that of the first layer (12) and being disposed on said first layer (12), a termination region being formed on the surface of said second layer (13). The impurity concentration of the second layer (13) is less than half that of the first layer (12). The thickness of the second layer may moreover be made smaller than that of a main layer (14) of the device. In accordance with the above features, the field intensity is reduced at the termination region of the device.