摘要:
Devices, mounts, stages, interfaces and systems to be developed that allow for in situ manipulation, experimentation and analysis of specimens directly within an electron microscope.
摘要:
A suitable clear image is obtained in observation of a specimen (A) exhibiting dynamic motion, for example, during in vivo observation. The invention provides an observation system (1) including an optical apparatus (4) including an objective unit (3) that is positioned close to a specimen (A); and a stabilizer (5) adhered to the specimen, at least around an observation region of the optical apparatus (1), to restrain motion of the specimen (A), wherein a heat-transfer preventing member for preventing transfer of heat between the stabilizer and the specimen (A) is provided on the stabilizer (5).
摘要:
A slide heater for use in a slide processing apparatus in which an interface surface (102) between the slide heater and the slide has a plurality of slots or channels (104, 200) terminating in an edge thereof, for gathering and venting gas bubbles.
摘要:
A temperature control unit provides means for observing samples under microscopy at greatly elevated and greatly reduced temperatures. The temperature control unit is constructed to insulate a sample from ambient temperatures while providing a highly heat conductive substrate for the sample that provides for rapid heat transfer to/from the sample. A dry gas provides a positive pressure around the sample, as compared to atmospheric pressure to help prevent atmospheric contract with the sample.
摘要:
A transparent heating plate is provided with a transparent plate assembly composed of a first transparent plate, second transparent plate superposed on the first plate, and a transparent insulating material interposed between the first and second plates and a housing which holds the periphery of the assembly. A transparent heating element (transparent conductive film) is provided to either or both of the first and second plates. A first transparent heating plate is provided with a first transparent heating element, a pair of electrodes for the first heating element which are in contact with the heating element and face the first heating element, a second transparent heating element, and a pair of electrodes for the second heating body which are in contact with the second heating element and face the second heating element. The center line of the electrodes for the second heating element is nearly perpendicular to that of the electrodes for the first heating element. A second transparent heating plate is provided with a transparent heating element and a pair of electrodes for the heating element which are in contact with the heating element and face the heating element. The periphery of the transparent plate includes a portion which extends around the periphery, and the electrodes are spaced from the periphery of the above-mentioned transparent plate assembly, inside the periphery. A third transparent heating plate is provided with a first transparent conductive film having heating electrodes and a second transparent conductive film facing the first film and connected to an earthing conductor. A fourth transparent heating plate has a circular shape, a transparent conductive film provided with heating electrodes and so formed that the resistance between the end of one electrode and that of the other electrode near the end of the first-mentioned electrode is nearly equal to the resistance between the central part of the one electrode and that of the other electrode.
摘要:
A microscope unit and a microscope device are disclosed. The microscope unit is used with an external image capture module or an image capture module of the microscope device. The microscope unit comprises a body, an optical assembly and a heating element. The body has a tunnel going through the body, and a specimen observation plane located in the tunnel. The optical assembly having a convex lens is disposed at one end of the tunnel. A minimum distance from the specimen observation plane to the convex lens ranges from 0.1 mm to 3.0 mm. The heating element is disposed corresponding to the specimen observation plane.