摘要:
Circuits, apparatuses, and methods of interposing a selectable delay in reading a magnetic random access memory (MRAM) device are disclosed. A circuit includes a sense amplifier (160), having a first input (162), a second input (164), and an enable input (166); a first amplifier (132) coupled to an output of a magnetic resistance-based memory cell (112); a second amplifier (134) coupled to a reference output of the cell; and a digitally-controllable amplifier (136) coupled to a tracking circuit cell (116) that is similar to the cell of the MRAM. The first input of the sense amplifier is coupled to the first amplifier, the second input of the sense amplifier is coupled to the second amplifier, and the enable input is coupled to the third digitally-controllable amplifier via a logic circuit (150). The sense amplifier may generate an output value based on the amplified values received from the output of the magnetic resistance-based memory cell and the reference cell once the sense amplifier receives an enable signal (152) from the digitally-controllable amplifier via the logic circuit.
摘要:
In a particular embodiment, a memory device (100) is disclosed that includes a memory cell (226) including a resistance based memory element (228) coupled to an access transistor (230). The access transistor has a first oxide thickness to enable operation of the memory cell at an operating voltage. The memory device also includes a first amplifier (202) configured to couple the memory cell to a supply voltage (Vamp) that is greater than a voltage limit to generate a data signal based on a current through the memory cell. The first amplifier includes a clamp transistor (216) that has a second oxide thickness that is greater than the first oxide thickness. The clamp transistor is configured to prevent the operating voltage at the memory cell from exceeding the voltage limit.
摘要:
In a particular embodiment, a memory device includes a first memory cell and a second memory cell. The memory device also includes a first bit line associated with the first memory cell and a second bit line associated with the second memory cell. The memory device also includes a source line coupled to the first memory cell and coupled to the second memory cell. The memory cell may be formed by spin transfer torque magnetoresistive memory cells having selection field effect transistors. The memory cell may also be formed as complementary cell pairs. Half-selected cells are supplied with or across them to prevent read disturb.
摘要:
Power saving for hot plug detect (HPD) is disclosed. In a particular embodiment, a method includes detecting, at a source device that is connectable to a sink device, a connection of the source device to the sink device via a connector. The source device includes a DC voltage source and the connection is detected without consuming power from the DC voltage source.
摘要:
A system and method reduce stress caused by NBTI effects by determining if a trigger event has occurred and if so inverting all input data values to the memory and all output data values from the memory during a period of time defined by the determined trigger event. In one embodiment, the trigger event is an alternate memory power-up.
摘要:
A pseudo-dual port memory address multiplexing system includes a control circuit (103) operative to identify a read request and a write request to be accomplished during a single clock cycle. A self time tracking circuit (105) monitors a read operation and generates a switching signal (WCLK) when the read operation is determined to be complete. A multiplexer (104) is responsive to the switching signal for selectively providing a read address and a write address to a memory address unit at the proper time.