摘要:
A memory includes a memory cell, one bitline coupled to the memory cell, a sense amplifier coupled to the one bitline, a timing circuit configured to enable the sense amplifier during a read operation, a control circuit configured to enable the sense amplifier independent of the timing circuit, and a pull-up circuit configured to pull up the one bitline while the sense amplifier is enabled by the control circuit. The method includes enabling a sense amplifier in a read operation by a timing circuit. The sense amplifier is coupled to at least one bitline, and the at least one bitline is coupled to a memory cell. The method further includes enabling the sense amplifier independent of the timing circuit in a second operation and pulling up the at least one bitline by a pull-up circuit while the sense amplifier is enabled in the second operation.
摘要:
A memory device utilizes selective precharge and charge sharing to reduce a bit line voltage before accessing a bit cell. A reduction in bit line voltage is achieved by precharging different sections of the bit line to different voltages (e.g., a supply voltage and ground) and using charge sharing between these sections. Read stability improves as a result of the reduction of bit line voltage. The relative capacitance difference between bit line sections determines the bit line voltage after charge sharing. Thus, the memory device is tolerant to process or temperature variations. The bit line voltage may be controlled in design by selecting the sections that are precharged to supply voltage or ground.
摘要:
A memory and a method for operating the memory provided. In one aspect, the memory may be a PDP memory. The memory includes a control circuit configured to generate a first clock and a second clock in response an edge of a clock for an access cycle. A first input circuit is configured to receive an input for a first memory access based on the first clock. The first input circuit includes a latch. The second input circuit configured to receive an input for a second memory access based on the second clock. The second input circuit includes a flip-flop.
摘要:
A Spin Transfer Torque Magnetoresistive Random Access Memory (STT-MRAM) array including a plurality of bit cells (420-432), a power-up controller (405), and a first plurality of precharge transistors (410-413) is disclosed. The plurality of bit cells are each coupled to one of a plurality of bit lines (BL) and word lines (WL). The power-up controller is configured to provide a power-up control signal to control the voltage level of at least one of the bit lines or the word lines during power-up. The first plurality of precharge transistors are respectively coupled to at least one of the plurality of bit lines or the plurality of word lines, each precharge transistor being configured to discharge a corresponding bit line or word line to a desired voltage level based on the power-up control signal.
摘要:
A memory device utilizes selective precharge and charge sharing to reduce a bit line voltage before accessing a bit cell. A reduction in bit line voltage is achieved by precharging different sections of the bit line to different voltages (e.g., a supply voltage and ground) and using charge sharing between these sections. Read stability improves as a result of the reduction of bit line voltage. The relative capacitance difference between bit line sections determines the bit line voltage after charge sharing. Thus, the memory device is tolerant to process or temperature variations. The bit line voltage may be controlled in design by selecting the sections that are precharged to supply voltage or ground.
摘要:
A memory device with configurable delay tracking is described. The memory device includes M normal word line drivers, a dummy word line driver, a memory array, N sense amplifiers, and a timing control circuit. The memory array includes M rows and N columns of memory cells and a column of dummy cells. The word line drivers drive word lines for the rows of memory cells. The dummy word line driver drives a dummy word line for at least one dummy cell in the column of dummy cells. The timing control circuit generates enable signals having configurable delay, which may be obtained with an acceleration circuit that provides variable drive for a dummy bit line coupled to the column of memory cells. The sense amplifiers detect bit lines for the columns of memory cells based on the enable signals.
摘要:
A mixed serial-parallel content addressable memory (CAM) includes serial CAM cells and parallel CAM cells that are arranged in multiple (N) columns and multiple (M) rows. Each row includes at least one serial CAM cell and at least two parallel CAM cells. The M rows are searched in parallel. For each row, the serial CAM cells are searched sequentially, and the parallel CAM cells are selectively searched in parallel. The CAM further includes a driver that generates search lines for the N columns of CAM cells, one search line per column. The driver sets the search lines to an N-bit value to search for in the CAM. Prior to each search operation, the driver presets at least one search line for at least one column of serial CAM cells to precharge a match line for each row.