Thin film transistor, method of manufacturing the same and flat panel display device having the same
    3.
    发明公开
    Thin film transistor, method of manufacturing the same and flat panel display device having the same 审中-公开
    薄膜晶体管中,在平板显示装置的制造,并与该晶体管的方法,

    公开(公告)号:EP2141743A1

    公开(公告)日:2010-01-06

    申请号:EP09250845.6

    申请日:2009-03-25

    IPC分类号: H01L29/49 H01L29/786

    摘要: A thin film transistor (TFT) using an oxide semiconductor as an active layer, a method of manufacturing the TFT, and a flat panel display device having the TFT include a gate electrode formed on a substrate; an active layer made of an oxide semiconductor and insulated from the gate electrode by a gate insulating layer; source and drain electrodes coupled to the active layer; and an interfacial stability layer formed on one or both surfaces of the active layer. In the TFT, the interfacial stability layer is formed of an oxide having a band gap of 3.0 to 8.0eV. Since the interfacial stability layer has the same characteristic as a gate insulating layer and a passivation layer, chemically high interface stability is maintained. Since the interfacial stability layer has a band gap equal to or greater than that of the active layer, charge trapping is physically prevented.

    摘要翻译: 在使用氧化物半导体作为有源层的薄膜晶体管(TFT),制造该TFT的方法以及具有该TFT的平板显示装置包括一个上形成的衬底的栅电极; 上由氧化物半导体的并通过栅极绝缘层与栅电极绝缘有源层; 耦合到所述有源层的源电极和漏电极; 和为在一个界面稳定层或形成在有源层的两面。 在TFT中,界面稳定层被形成为具有3.0的带隙8.0eV的氧化物。 因为界面稳定层具有相同的特性的栅极绝缘层和钝化层,经化学上高的界面稳定性得以保持。 因为界面稳定层的带隙比有源层的等于或大于,电荷俘获在物理上防止。