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公开(公告)号：EP3364176A1
公开(公告)日：2018-08-22
申请号：EP18156264.6
申请日：2018-02-12
发明人： YU, Hao , LI, Jianmin , ZONG, Chunguang , Li, Yulan , LIU, Lei , Li, Yuanjing , CHI, Haojie , CHEN, Zhiqiang , ZHANG, Li
IPC分类号： G01N23/203 , G01V5/00 , G01N23/04
CPC分类号： G01N23/04 , G01N23/203 , G01V5/0025
摘要： The present application discloses a multi-view backscatter inspection system and an inspection method. The inspection system comprises an inspection passage, at least two inspection units, a control device and a data processing device. The inspection unit comprises a radiation source and a detector array. The detector array comprises at least two detector modules arranged at different positions and independent of each other. At least two inspection units are arranged so that a radiation beam from any inspection unit is directed to the outside of the detector array of each of the remaining inspection units. The control device adjusts a phase difference between radiation beams of various radiation sources, so that an effective detection area of each of the detector arrays is far away from an interference area. When an inspection image corresponding to certain detector array at certain moment is formed, the data processing device calculates an effective detection area of the detector array at the moment, processes a detection signal from a detector module within the effective detection area and forms an inspection image in which the inspection target is located at one side of the detector array at the moment. The present application may improve the quality of an inspection image.
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公开(公告)号：EP1983335A3
公开(公告)日：2010-09-15
申请号：EP08005062.8
申请日：2008-03-18
申请人： Tsinghua University
发明人： Kang, Kejun , Chen, Zhiqiang , Li, Yuanjing , Li, Yulan
CPC分类号： G01V5/005
摘要： The present invention provides a CT scan security check device, comprising a radiation source and a detector which form a radiation detection area, a conveyer mechanism which conveys a checked article and a movement mechanism which makes the checked article and the radiation detection area generate a relative displacement in a vertical direction and makes the checked article rotate about a vertical axis. The present invention also provides a CT scan security check method, comprising the following steps: 1) making the checked article and the radiation detection area generate a relative displacement in a vertical direction and making the checked article to perform a rotation movement; 2) during the checked article passing through the radiation detection area, obtaining information data on the radiation ray through the checked article; and 3) transmitting out the information data for CT reconstruction.
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公开(公告)号：EP2796897A1
公开(公告)日：2014-10-29
申请号：EP14150977.8
申请日：2014-01-13
发明人： Li, Yuanjing , Zhang, Lan , Li, Yulan , Liu, Yinong , Fu, Jianqiang , Jiang, Hao , Deng, Zhi , Xue, Tao , Zhang, Wei , Li, Jun
IPC分类号： G01T1/24
摘要： The invention provides a semiconductor detector (100), and the semiconductor detector (100) comprises a semiconductor crystal (101), a cathode (102), an anode (103) and at least one ladder electrode (104); the semiconductor crystal (101) comprises a top surface (101-2), a bottom surface (101-1) and at least one side (101-3); the cathode (102), the anode (103) and the ladder electrode (104) are conductive thin films deposited on a surface of the semiconductor crystal (101); the cathode (102) is disposed on the bottom surface (101-1) of the semiconductor crystal (101), the anode (103) is disposed on the top surface (101-2) of the semiconductor crystal (101), the ladder electrode (104) is disposed on the at least one side (101-3) of the semiconductor crystal (101); and the ladder electrode (104) comprises a plurality of sub-electrodes. As compared to the prior art, the semiconductor detector can improve the energy resolution.
摘要翻译： 本发明提供一种半导体检测器（100），半导体检测器（100）包括半导体晶体（101），阴极（102），阳极（103）和至少一个梯形电极（104） 半导体晶体（101）包括顶表面（101-2），底表面（101-1）和至少一个侧面（101-3）; 阴极（102），阳极（103）和梯形电极（104）是沉积在半导体晶体（101）的表面上的导电薄膜; 阴极（102）设置在半导体晶体（101）的底表面（101-1）上，阳极（103）设置在半导体晶体（101）的顶表面（101-2）上，梯子 电极（104）设置在半导体晶体（101）的至少一个侧面（101-3）上; 并且梯形电极（104）包括多个子电极。 与现有技术相比，半导体检测器可以提高能量分辨率。
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公开(公告)号：EP2075600A3
公开(公告)日：2011-12-28
申请号：EP08020542.0
申请日：2008-11-26
发明人： Chen, Zhiqiang , Li, Yuanjing , Li, Yulan , Zhang, Li , Wu, Wanlong , Peng, Hua , Liu, Yinong , Zhao, Zirao , Wang, Xuewu , Sun, Shangmin , Sang, Bin , Wang, Hailin , Song, Quanwei , Zhang, Jinyu
CPC分类号： G01V5/005 , G01V5/0041 , Y10S378/901
摘要： The present invention discloses a detecting method of the article detection apparatus (2) composed of an individual DR subsystem (2) and an individual CT subsystem (3), the method comprising: obtaining a first projection data on ray attenuation coefficient by using the DR subsystem to project the A-layer of an article (Fig.3) at a first projection angle, and obtaining a second projection data on ray attenuation coefficient by using the CT subsystem to project the A-layer of the article at a second projection angle different from the first projection angle; and judging whether the A-layer of the detected article exists a dangerous article based on the first projection data and the second projection data so as to obtain a first judgment on the A-layer of the detected article. In the present invention, by combining the projection data of the DR subsystem and the projection data of the CT subsystem, the data information to be used to judge the detected article is greatly increased, therefore, both the detection accuracy and speed are improved.
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5.发明公开An article detection apparatus and a detecting method 有权Artikeldetektionsvorrichtung und Detektionsverfahren
公开(公告)号：EP2075600A2
公开(公告)日：2009-07-01
申请号：EP08020542.0
申请日：2008-11-26
发明人： Chen, Zhiqiang , Li, Yuanjing , Li, Yulan , Zhang, Li , Wu, Wanlong , Peng, Hua , Liu, Yinong , Zhao, Zirao , Wang, Xuewu , Sun, Shangmin , Sang, Bin , Wang, Hailin , Song, Quanwei , Zhang, Jinyu
CPC分类号： G01V5/005 , G01V5/0041 , Y10S378/901
摘要： The present invention discloses a detecting method of the article detection apparatus composed of an individual DR subsystem and an individual CT subsystem, the method comprising: obtaining a first projection data on ray attenuation coefficient by using the DR subsystem to project the A-layer of an article at a first projection angle, and obtaining a second projection data on ray attenuation coefficient by using the CT subsystem to project the A-layer of the article at a second projection angle different from the first projection angle; and judging whether the A-layer of the detected article exists a dangerous article based on the first projection data and the second projection data so as to obtain a first judgment on the A-layer of the detected article. In the present invention, by combining the projection data of the DR subsystem and the projection data of the CT subsystem, the data information to be used to judge the detected article is greatly increased, therefore, both the detection accuracy and speed are improved.
摘要翻译： 本发明公开了一种由个体DR子系统（2）和个体CT子系统（3）组成的物品检测装置（2）的检测方法，该方法包括：通过使用DR获得关于射线衰减系数的第一投影数据 子系统以第一投影角投影物品的A层（图3），并且通过使用CT子系统以第二投影角投影物品的A层来获得关于射线衰减系数的第二投影数据 不同于第一投影角度; 以及基于所述第一投影数据和所述第二投影数据判断检测到的物品的A层是否存在危险物品，以便获得所检测物品的A层的第一判断。 在本发明中，通过组合DR子系统的投影数据和CT子系统的投影数据，用于判断检测到的物品的数据信息大大增加，因此提高了检测精度和速度。
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公开(公告)号：EP2796897B1
公开(公告)日：2019-04-17
申请号：EP14150977.8
申请日：2014-01-13
发明人： Li, Yuanjing , Zhang, Lan , Li, Yulan , Liu, Yinong , Fu, Jianqiang , Jiang, Hao , Deng, Zhi , Xue, Tao , Zhang, Wei , Li, Jun
IPC分类号： G01T1/24
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公开(公告)号：EP2762924A3
公开(公告)日：2017-10-04
申请号：EP14152584.0
申请日：2014-01-27
发明人： Zhang, Lan , Li, Yulan , Li, Yuanjing , Liu, Yinong , Fu, Jianqiang , Jiang, Hao , Zhang, Wei , Liu, Yanqing , Li, Jun
IPC分类号： G01T1/24
摘要： The present disclosure provides a radiation detector, comprising: a semiconductor crystal (101) for detecting radiation, the semiconductor crystal comprising a top surface, a bottom surface, and at least one side surface; at least one anode (103) arranged on at least one of the top surface, the bottom surface, and the at least one side surface; and at least one cathode (102) arranged on at least another one of the top surface, the bottom surface, and the at least one side surface, wherein the at least one anode each has a stripe shape, the at least one cathode each has a planar or curved shape, and the at least one cathode and the at least one anode extend in parallel with respect to each other to a length substantially equal to that of the anode. Such an electrode structure can improve energy resolution and detection efficiency of the radiation detector effectively.
摘要翻译： 本公开提供了一种辐射探测器，包括：用于探测辐射的半导体晶体（101），所述半导体晶体包括顶面，底面和至少一个侧面; 至少一个阳极（103），其布置在所述顶表面，所述底表面和所述至少一个侧表面中的至少一个上; 和布置在所述顶表面，所述底表面和所述至少一个侧表面中的至少另一个上的至少一个阴极（102），其中所述至少一个阳极各自具有条形形状，所述至少一个阴极各自具有 平面或弯曲形状，并且所述至少一个阴极和所述至少一个阳极相对于彼此平行地延伸到基本上等于所述阳极的长度的长度。 这种电极结构可以有效地提高放射线检测器的能量分辨率和检测效率。
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公开(公告)号：EP2988150A3
公开(公告)日：2016-05-25
申请号：EP14200189.0
申请日：2014-12-23
发明人： Li, Jianmin , Li, Ying , Li, Yuanjing , Li, Yulan , Song, Tao , Hu, Yu , Wu, Yucheng
CPC分类号： G01V5/0016 , G01N23/083
摘要： The present invention discloses a vehicle inspection system comprising:- a radiation source, an inspection passage (101) enabling a vehicle to pass, a dragging system (100) comprising a first (111) and a second dragging means (112) arranged along a vehicle dragging direction (E); in this direction, the first dragging means is arranged at the upstream of the second dragging means, and a separating section (113) is arranged between these dragging means, so these dragging means are separated by a preset distance. The first and second dragging means (111;112) include a supporting plate , an elongated traction element and a pushing element connected therewith. These elongated traction elements are continuous and integrated, thus the elongated traction elements and pushing elements extends on the separating section; the supporting plates of the dragging means are separated and two pieces type. No supporting plate is provided on the separating section.
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公开(公告)号：EP2762924B1
公开(公告)日：2020-05-06
申请号：EP14152584.0
申请日：2014-01-27
发明人： Zhang, Lan , Li, Yulan , Li, Yuanjing , Liu, Yinong , Fu, Jianqiang , Jiang, Hao , Zhang, Wei , Liu, Yanqing , Li, Jun
IPC分类号： G01T1/24
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10.发明公开
公开(公告)号：EP2975431A3
公开(公告)日：2016-04-20
申请号：EP15176890.0
申请日：2015-07-15
发明人： Li, Yulan , Li, Yuanjing , Fu, Jianqiang , Zhang, Lan , Du, Yingshuai , Zhang, Wei , Ma, Xuming , Li, Jun
IPC分类号： G01T1/24
摘要： The present invention provides a method and apparatus for processing signals of a semiconductor detector, including: acquiring a relationship of a time difference between anode and cathode signals of the semiconductor detector with an anode signal amplitude; obtaining an optimal data screening interval according to the relationship of the time difference between anode and cathode signals of the semiconductor detector with the anode signal amplitude, wherein the optimal data screening interval is an interval where the time difference between the anode and cathode signals is greater than 50 ns; and screening and processing the collected data according to the optimal data screening interval when the semiconductor detector collects data. The present invention better overcomes the inherent crystal defects of the detector, reduces the effect of background noise, increases the energy resolution of the cadmium zinc telluride detector under room temperature, and improves the peak-to-compton ratio.
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