摘要:
The invention relates to a structure suitable for manufacturing by the fabrication techniques of microelectronics so as to include an optically black surface adapted to function as an absorber or emitter, respectively, over a predetermined wavelength range, said structure comprising a electrically nonconducting support layer (1), a metallic mirror layer (2) made on said support layer (1), and a lossy layer (4) made on the support layer (1) and the metallic mirror layer (2) superimposed thereon. According to the invention, the mirror layer (2) is made on the upper surface of said support layer (1) and the lossy layer (4) is made from a doped semiconductor material. The thickness of the multilayer structure (3, 4, 7) and the doping of the lossy layer (4) are proportioned to each other so that the mirror layer (2) will be optically matched over the predetermined wavelength range of absorption or emission, respectively, to the medium surrounding the structure. The invention also concerns a method for manufacturing said surfaces.
摘要:
The invention concerns a method and a sensor for measuring gas concentrations. The sensor according to the invention comprises an element (A1, 5) which is sensitive to a chemical reaction of the gas being measured and means for measuring (13) the temperature of the element (A1, 5) sensitive to a chemical reaction of the gas being measured. According to the invention, the temperature-measuring means (TP1, TP2) are constituted by several series-connected thermopairs (13).
摘要:
The invention concerns a method and a sensor for measuring gas concentrations. The sensor according to the invention comprises an element (A1, 5) which is sensitive to a chemical reaction of the gas being measured and means for measuring (13) the temperature of the element (A1, 5) sensitive to a chemical reaction of the gas being measured. According to the invention, the temperature-measuring means (TP1, TP2) are constituted by several series-connected thermopairs (13).
摘要:
The invention relates to a miniaturized spectrometer for gas concentration measurement. The spectrometer comprises a radiation source (3) for admitting electromagnetic radiation onto the gas to be measured, a detector (5) for detecting the radiation transmitted through or emitted from the gas, an electrically tunable Fabry-Perot interferometer (4) placed in the path of the radiation prior to the detector (5), control electronics circuitry (2) for controlling the radiation source (3), the interferometer (4) and the detector (5). According to the invention, the radiation source (3), the detector (5), the interferometer (4) and the control electronics (2) are integrated in a miniaturized fashion onto a common, planar substrate (1) and the radiation source (3) is an electrically modulatable micromechanically manufactured thermal radiation emitter.
摘要:
The invention relates to a miniaturized spectrometer for gas concentration measurement. The spectrometer comprises a radiation source (3) for admitting electromagnetic radiation onto the gas to be measured, a detector (5) for detecting the radiation transmitted through or emitted from the gas, an electrically tunable Fabry-Perot interferometer (4) placed in the path of the radiation prior to the detector (5), control electronics circuitry (2) for controlling the radiation source (3), the interferometer (4) and the detector (5). According to the invention, the radiation source (3), the detector (5), the interferometer (4) and the control electronics (2) are integrated in a miniaturized fashion onto a common, planar substrate (1) and the radiation source (3) is an electrically modulatable micromechanically manufactured thermal radiation emitter.