SPECTROMETER WITH ABSOLUTE TRANSMISSION ACCESSORY

    公开(公告)号:EP4390341A1

    公开(公告)日:2024-06-26

    申请号:EP23215456.7

    申请日:2023-12-11

    Abstract: An absolute transmission accessory for a spectrometer. One example spectrometer system includes a base plate, a light source configured to transmit light, and an interferometer mounted to the base plate. The interferometer receives the light from the light source and output modulated light. The spectrometer system includes a first optical element configured to receive the modulated light and direct the modulated light, and a second optical element configured to receive the modulated light and focus the modulated light to a sample compartment. The spectrometer system includes a detector compartment including one or more detectors, the detector compartment configured to receive light from the sample compartment. The spectrometer system includes a sample holder coupled to the base plate. The modulated light is directed to the sample holder, and light exiting the sample holder is directed through the sample compartment and to the detector compartment via the second optical element.

    VERFAHREN UND VORRICHTUNG ZUR ERMITTLUNG ZUMINDEST EINER PRÜFEIGENSCHAFT EINES PRÜFGEGENSTANDS
    4.
    发明公开
    VERFAHREN UND VORRICHTUNG ZUR ERMITTLUNG ZUMINDEST EINER PRÜFEIGENSCHAFT EINES PRÜFGEGENSTANDS 审中-公开
    确定检查对象的至少一个测试属性的方法和设备

    公开(公告)号:EP3246677A3

    公开(公告)日:2018-02-07

    申请号:EP17171896.8

    申请日:2017-05-19

    Abstract: Die Erfindung betrifft ein Verfahren zur Ermittlung zumindest einer Prüfeigenschaft eines Prüfgegenstands und eine Messvorrichtung, welche geeignet ist, ein Messfeld (3) unter einer Vielzahl an Anstrahlungskombinationen aus Einstrahlungswinkel (α) und/oder Wellenlängenbereich (A) mit elektromagnetischer Strahlung (5) anzustrahlen und die Intensität der jeweils von dem Messfeld unter zumindest einem Abstrahlungswinkel (β) remittierten elektromagnetischen Strahlung (5) zu messen. Die Prüfeigenschaft weist zumindest ein definiertes messbares Einzelmerkmal auf, wobei das Einzelmerkmal oder eine definierte Merkmalskombination mehrerer solcher Einzelmerkmale die Herkunft und/oder Identität des Prüfgegenstandes (1) belegt, wobei das Einzelmerkmal oder die Merkmalskombination messbar ist, wenn sie durch die elektromagnetische Strahlung (5) auf eine durch eine Auswahl an Anstrahlungkombinationen definierte Art und Weise optisch angeregt wird. Das Einzelmerkmal oder die Merkmalskombination wird mit der Messvorrichtung (4) in dieser Art und Weise angeregt und gemessen.

    Abstract translation: 本发明涉及一种用于确定至少一个Prüfeigenschaft一个测试对象和一个测量装置,其能够测量区域(3)的用电磁辐射的多个照射角度(α)和/或波长范围(A)的Anstrahlungskombinationen中照亮的(5)和 以在至少一个发射角(β)减少的电磁辐射(5)下测量每个测量场的强度。 所述Prüfeigenschaft具有至少一个定义的可测量的单独的特征,其中,所述单独的特征或几个这样的个人特征的定义的特性组合是测试对象(1),其中,所述的单独特征或特征的组合是可测量的,如果它(通过电磁辐射5的起点和/或身份 )以选择的辐射组合所限定的方式被光学激励。 以这种方式用测量装置(4)激励和测量单个特征或特征组合。

    LIGHT PIPE FOR SPECTROSCOPY
    6.
    发明公开
    LIGHT PIPE FOR SPECTROSCOPY 审中-公开
    用于光谱学的光管

    公开(公告)号:EP3228999A2

    公开(公告)日:2017-10-11

    申请号:EP17164864.5

    申请日:2017-04-04

    Abstract: A spectroscopic assembly (165) may include a spectrometer (110). The spectrometer may include an illumination source to generate a light to illuminate a sample. The spectrometer may include a sensor to obtain a spectroscopic measurement based on light, reflected by the sample, from the light illuminating the sample. The spectroscopic assembly may include a light pipe (120) to transfer the light reflected from the sample. The light pipe may include a first opening (146) to receive the spectrometer. The light pipe may include a second opening (148) to receive the sample, such that the sample is enclosed by the light pipe and a base surface when the sample is received at the second opening. The light pipe may be associated with aligning the illumination source and the sensor with the sample.

    Abstract translation: 光谱组件(165)可以包括光谱仪(110)。 光谱仪可以包括照明源以产生照亮样品的光。 分光计可以包括传感器,以从照射样品的光中基于由样品反射的光获得分光测量。 分光镜组件可以包括光管(120)以传输从样品反射的光。 光管可以包括第一开口(146)以接收光谱仪。 光管可以包括用于接收样品的第二开口(148),使得当样品在第二开口处被接收时样品被光管和基座表面包围。 光管可以与照射源和传感器与样品对准相关联。

    SPECTROSCOPY MODULE AND MANUFACTURING METHOD THEREFOR
    8.
    发明授权
    SPECTROSCOPY MODULE AND MANUFACTURING METHOD THEREFOR 有权
    SPEKTROSKOPIEMODUL UND HERSTELLUNGSVERFAHRENDAFÜR

    公开(公告)号:EP2469252B1

    公开(公告)日:2017-03-22

    申请号:EP10809902.9

    申请日:2010-08-11

    Abstract: In a spectroscopic module 1, a flange 7 is formed integrally with a diffraction layer 6 along a periphery thereof so as to become thicker than the diffraction layer 6. As a consequence, at the time of releasing a master mold used for forming the diffraction layer 6 and flange 7, the diffraction layer 6 formed along a convex curved surface 3a of a main unit 3 can be prevented from peeling off from the curved surface 3 a together with the master mold. A diffraction grating pattern 9 is formed so as to be eccentric with respect to the center of the diffraction layer 6 toward a predetermined side. Therefore, releasing the mold earlier from the opposite side of the diffraction layer 6 than the predetermined side thereof can prevent the diffraction layer 6 from peeling off and the diffraction grating pattern 9 from being damaged.

    Abstract translation: 在分光模块1中,凸缘7沿着其周边与衍射层6一体地形成为比衍射层6厚。因此,在释放用于形成衍射层的母模时, 6和凸缘7,可以防止沿着主单元3的凸曲面3a形成的衍射层6与母模一起从弯曲表面3a剥离。 衍射光栅图案9形成为相对于衍射层6的中心偏向预定侧。 因此,从衍射层6的与其规定侧相反的相反侧较早地剥离模具可以防止衍射层6剥离,衍射光栅图案9受损。

    ALIGNMENT SYSTEM FOR LASER SPECTROSCOPY
    10.
    发明公开
    ALIGNMENT SYSTEM FOR LASER SPECTROSCOPY 审中-公开
    AUSRICHTUNGSSYSTEMFÜRDIE LASERSPEKTROSKOPIE

    公开(公告)号:EP3011309A4

    公开(公告)日:2017-03-01

    申请号:EP14813671

    申请日:2014-06-19

    Abstract: An adjustable mount for an optical device in a laser spectroscopy system is provided. The adjustable mount includes body configured to mount to a process and a reflector mount having a feature configured to mount an optical device. An interface between the body and the reflector mount allows relative motion between the reflector mount and the body. At least one alignment device is configured to engage the reflector mount and the body to fix a position of the reflector mount relative to the body. An optical device is removably mounted to the reflector mount independent of the alignment device and is sealed to the reflector mount.

    Abstract translation: 提供了一种用于激光光谱系统中的光学装置的可调安装件。 可调节安装件包括构造成安装到过程的主体和具有被配置为安装光学设备的特征的反射器安装件。 主体和反射器支架之间的界面允许反射器支架与主体之间的相对运动。 至少一个对准装置构造成接合反射器支座和主体以相对于主体固定反射器支架的位置。 光学装置可独立于对准装置可拆卸地安装到反射器安装件,并且被密封到反射器支架。

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