Abstract:
PROBLEM TO BE SOLVED: To restrain electric discharge, if any, generated between acceleration electrodes, since scores of kilovolts of voltage is applied between the acceleration electrodes in a charged particle accelerator. SOLUTION: In the charged particle accelerator, a part or the whole of the accelerator electrodes are covered by a discharge restraining layer made of ceramic with a high melting point in comparison with the metal or an alloy. Fine particles of impurities are accelerated with an electric field by a ceramic discharge restraining layer or an alloy discharge restraining layer, and metal vapor is hardly generated from the electrode in collision with the electrode. The electric discharge between the electrodes is restrained since they hardly become ionized plasma. COPYRIGHT: (C)2009,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a mass spectrograph and a mass spectrometry capable of performing analysis in real time by reducing the number of parent ion species that should be dissociated for mass spectrometry. SOLUTION: The mass spectrograph 1 has: a mass spectrometry section 13 for performing mass spectrometry of dissociated ions obtained by separating a substance included in a sample 10 and dissociating parent ions selected from ionized ion species; and a database 7 for storing the mass-to-charge ratio of ion species acquired by the mass spectrometry section 13 and characteristic data capable of identifying a plurality of ion species acquired by a preprocessing system. In the mass spectrometry section 13, the selection of parent ions and the mass spectrometry of dissociated ions are repeated by replacing the dissociated ions with ion species and parent ions that are not ion species that can be identified from the database 7 are selected. In the database 7, the mass-to-charge ratio of ion species where a substance labeled by a reagent has been ionized and characteristic data is reproduced, and the reproduced mass-to-charge ratio is rewritten from the increase/decrease in the number of masses when the substance is labeled by the reagent. COPYRIGHT: (C)2009,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To avoid a peptide ion as a tandem mass spectrometry analysis target derived from the large quantity of a manifested protein previously measured, when structures of a protein and a peptide are analyzed by tandem mass spectrometry, and automatically determine and process the peptide as the tandem mass spectrometry analysis target derived from the small quantity of the protein conventionally difficult to be analyzed in real-time during measurement. SOLUTION: A process for selecting a peptide peak not measured as the next tandem analysis target is implemented in real time during the measurement, by automatically storing data of the protein previously measured and the peptide derived from it in an internal database, accurately comparing them with measured data and determining an isotope peak. The duplicated measurement of the peptide derived from the same protein is avoided. COPYRIGHT: (C)2005,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a pattern measuring device and a computer program capable of performing highly accurate measurement of a pattern height, without depending on existence of electrification, etc.SOLUTION: A pattern measuring device and a computer program are configured: to detect a portion separated away from an edge of the pattern and having a predetermined signal strength, according to a detection signal obtained by scanning a specimen with an electron beam; and to derive a height of the pattern on the basis of positional information of the portion. With this configuration, highly accurate measurement of a pattern height can be performed without depending on existence of electrification, etc.
Abstract:
PROBLEM TO BE SOLVED: To improve selectivity and image quality of sample information obtained from a secondary electronic signal in a method for observing structure and characteristics of a sample by an electron microscope.SOLUTION: Superposition of unnecessary information is prevented and high quality image observation is realized by intermittently irradiating with the electron beam and selecting a secondary electron signal which reflects necessary sample information based on detection time in a transient response of the secondary electron obtained by an intermittent electron beam irradiation, when evaluating structure observation or material characteristics of the sample using the electron beam.
Abstract:
PROBLEM TO BE SOLVED: To avoid a peptide ion derived from a protein that has already been measured and that is expressed in great quantities as a tandem mass spectroscopy target, and to determine a peptide or the like derived from a minute amount of protein, which has heretofore been difficult to analyze as a tandem mass spectroscopy target, automatically within the real time of measurement, during the structural analysis of a protein or peptide by tandem mass spectroscopy. SOLUTION: Data concerning a protein that has already been measured and a peptide derived from the protein are automatically stored in an internal database. The stored data are collated with measured data with high accuracy to determine an isotope peak. In this way, the process of selecting a peptide peak that has not been measured as the target for the next tandem analysis can be performed within the real time of measurement and a redundant measurement of peptides derived from the same protein can be avoided. COPYRIGHT: (C)2010,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a tandem type mass analyzing system capable of performing fluctuation analysis with high efficiency by a tandem type mass analyzer. SOLUTION: A predetermined number of m/z regions are set, all of ions contained in the m/z regions are collectively separated at every m/z region and mass analysis is performed to acquire measured MS 2 data. The measured MS 2 data is compared with the reference MS 2 data stored in a reference database to detect the difference between both of them. Mass analysis not separating all of ions contained in the m/z region where a fluctuation component is detected is performed with respect to the m/z region to acquire measured MS 1 data and the measured MS 1 data is compared with reference MS 1 data to detect the difference between these data. Parent ions considered to be the cause of the fluctuation component are estimated from the difference and separated to perform mass analysis. COPYRIGHT: (C)2007,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To determine whether a measured object is a material required by a user within a real time of measurement when a material (especially protein, sugar chain, or the like) is analyzed. SOLUTION: In a mass spectrometry system using a tandem mass spectrometry device, a specific material obtained by sample separation is ionized, the spectrum acquired by mass spectrometry of it is compared with a previously recorded specific spectrum, whether both match with each other is determined, and, when they match with each other, the specific ion is further ionized and detail analysis is performed. The present invention discloses the mass spectrometry method, the diagnosis system and inspection system using the mass spectrometry system, and the program for making a computer for controlling these systems attain a desired function. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To solve the problems in the present mass spectrometry system wherein it cannot be determined during measurement whether information necessary for analysis is sufficient or not when analyzing a material (especially a protein, a sugar chain or the like), and it is difficult to determine an isomer having a completely equal mass or a compound having a very similar mass only from MS data. SOLUTION: In this system, it is determined during the actual time of measurement whether a retention time of LC (or GC) of a peptide generated when a protein is subjected to enzymatic hydrolysis agrees with a predicted retention time estimated from an amino acid sequence predicted from MS 2 mass spectrum data, thereby determines the quality (information quantity) of the MS 2 mass spectrum data. COPYRIGHT: (C)2005,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide an image forming apparatus that forms an image which is reflected of the influence due to electrostatic charging, or the like, without having to irradiate a charged particle beam on a sample. SOLUTION: The image forming apparatus acquires information of an area including the irradiation range of a charged particle beam from the design data of a semiconductor device and calculates the quantity of electrons that are detected at a pixel section, when the charge particle beam is applied to the sample, in pixel units for the irradiation range of the charged particle beam on the basis of the information; and arranges the luminance information that is obtained, based on the quantity of electron so as to form an image. COPYRIGHT: (C)2010,JPO&INPIT