導光体、物体検出装置
    41.
    发明专利
    導光体、物体検出装置 审中-公开
    光导和目标探测器

    公开(公告)号:JP2015052495A

    公开(公告)日:2015-03-19

    申请号:JP2013184682

    申请日:2013-09-06

    Abstract: 【課題】物体検出装置の検出性能を確保することができる導光体を提供する。【解決手段】光源と、光源から出射された出射光が車両を構成する透光性部材で反射された反射光を受光し、反射光の受光量の変化に基づいて透光性部材の表面に付着した物体を検出する検出部と、を備えた物体検出装置に用いられる導光体220であって、出射光が入射する入射面と、出射光が透光性部材の裏面に向けて出射するとともに反射光が入射する検出面222と、反射光を検出部に向けて出射する出射面と、出射光と反射光とが伝播する導光部と、を有してなり、透光性部材105は、曲率を有する面であり、検出面222は、透光性部材105の曲率に対応する曲率を有する面である、ことを特徴とする。【選択図】図10

    Abstract translation: 要解决的问题:提供能够确保物体检测器的检测性能的光导。解决方案:光导220用于物体检测器,包括:光源; 以及检测部,其接收在从所述光源射出的发光的半透明部件上反射的反射光形成车辆,并且基于所述透光部件的接收光量的变化来检测附着在所述透光部件的表面的物体 反射光。 光导包括:发射光入射的入射面; 检测面222,其中发射光朝向透光部件的后表面并且反射光入射; 反射光朝向检测部射出的发射面; 以及发射光和反射光传播的导光部。 半透明构件105是具有曲率的表面,并且检测表面222是具有对应于半透明构件105的曲率的曲率的表面。

    Background light reducing method and member in evanescent wave exciting fluorescent observation
    46.
    发明专利
    Background light reducing method and member in evanescent wave exciting fluorescent observation 有权
    背景技术光衰减方法和会员在浪涌波浪荧光观测中的应用

    公开(公告)号:JP2008064574A

    公开(公告)日:2008-03-21

    申请号:JP2006242020

    申请日:2006-09-06

    Abstract: PROBLEM TO BE SOLVED: To provide a means for simply, inexpensively and effectively suppressing the penetration of optically non-ideal stray light, which becomes a main cause for producing background fluorescence becoming the maximum obstacle factor of observation when evanescent wave exciting fluorescent observation is performed, into the upper part of the fixing region of a molecule to be examined on a waveguide substrate.
    SOLUTION: In the evanescent wave exciting fluorescent observation, a stray light absorbing region is effectively arranged on the waveguide substrate to efficiently abosorb the stray light arriving at the probe solution layer of the upper layer of the fixing region of the molecule to be examined in a reaction tank. As a result, the penetration of the stray light into the reaction tank is sharply suppressed. Further, the incident edge face of incident light on the waveguide substrate is subjected to laser cutting processing to suppress the occurrence of scattered stray light at the edge face of the waveguide substrate. Accordingly, the background light becoming a problem at the time of evanescent wave exciting fluorescent observation is reduced.
    COPYRIGHT: (C)2008,JPO&INPIT

    Abstract translation: 要解决的问题:提供一种简单,低成本且有效地抑制光学非理想杂散光的穿透的手段,其成为当ev逝波激发荧光时产生背景荧光成为观察的最大障碍因子的主要原因 在波导基板上进行待检测分子的固定区域的上部的观察。 解决方案:在瞬逝波激发荧光观察中,杂散光吸收区有效地布置在波导基片上,以有效地吸收到达分子固定区上层探针溶液层的杂散光 在反应罐中检查。 结果,杂散光穿透到反应罐中被急剧地抑制。 此外,对波导基板上的入射光的入射边缘面进行激光切割处理,以抑制在波导基板的边缘面发生杂散光。 因此,在ev逝波激发荧光观察时成为问题的背景光减少。 版权所有(C)2008,JPO&INPIT

    Measuring cell
    47.
    发明专利

    公开(公告)号:JP3528732B2

    公开(公告)日:2004-05-24

    申请号:JP2000002663

    申请日:2000-01-11

    Inventor: 陽一 藤山

    CPC classification number: G01N21/05 G01N2021/0346 G01N2201/064

    Abstract: A measuring cell is formed of base plates joined together. A passage groove is formed on a joining surface of one base plate. Through-holes for introducing and discharging a fluid sample are formed on the other base plate, and the joining surface is provided with an optically opaque Si film as slits. Further, the joining surfaces of the base plates and the inner surface of the passage groove are covered with SiO2 films. Thus, a measuring cell having a sufficiently small passage sectional area, a high air-tightness, a chemically stable measuring chamber, and a high measuring sensitivity can be obtained.

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