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    Light emission quantum efficiency measuring device
    84.
    发明专利
    Light emission quantum efficiency measuring device 审中-公开
    光发射量子效率测量装置

    公开(公告)号：JP2009008509A

    公开(公告)日：2009-01-15

    申请号：JP2007169556

    申请日：2007-06-27

    Applicant: Shinshu Univ ,  Systems Engineering Inc ,  国立大学法人信州大学 ,  株式会社システムズエンジニアリング

    Inventor： KANAZAWA SHUSUKE ,  ICHIKAWA YU ,  TANIGUCHI MORIO

    IPC: G01N21/64 ,  G01J3/443

    CPC classification number: G01N21/645 ,  G01J3/0254 ,  G01J3/0262 ,  G01N2201/0642 ,  G01N2201/065

    Abstract: PROBLEM TO BE SOLVED: To provide a light emission quantum efficiency measuring device which easily and certainly makes isotropic the light emission of an emitter sample showing strong light emission anisotropy, and accurately measures the light emission quantum efficiency of the emitter sample.
    SOLUTION: This light emission quantum efficiency measuring device has: an excitation light introduction window 2 in the orthogonal direction on the plane including the center of an integrating sphere 1; and a detection probe end 3 connected to a spectrometer. The emitter sample 5 is arranged inside the integrating sphere 1 and on the line perpendicular to this plane from the center, and a baffle plate 7 is placed in a position viewing the emitter sample 5 from the detection probe end 3.
    COPYRIGHT: (C)2009,JPO&INPIT

    Abstract translation: 要解决的问题：提供一种发光量子效率测量装置，其容易且确定地使各向同性的发光样品的发光具有强的发光各向异性，并且准确地测量发射体样品的发光量子效率。 解决方案：该发光量子效率测量装置具有在包括积分球1的中心的平面上的正交方向上的激发光引入窗2; 以及连接到光谱仪的检测探针端3。 发射体样品5布置在积分球1的内部，并且从中心垂直于该平面的线上，并且将挡板7放置在从检测探针端3观察发射体样品5的位置。版权所有： （C）2009，JPO＆INPIT

    Image processing system
    85.
    发明专利
    Image processing system 审中-公开
    图像处理系统

    公开(公告)号：JP2008292495A

    公开(公告)日：2008-12-04

    申请号：JP2008168647

    申请日：2008-06-27

    Applicant: Olympus Corp ,  オリンパス株式会社

    Inventor： KOMIYA YASUHIRO ,  WADA TORU ,  KONNO OSAMU ,  AJITO TAKEYUKI ,  NAKAMURA TOMOYUKI

    IPC: G01J3/46 ,  A61B5/00 ,  A61B5/02 ,  A61C13/00 ,  A61C13/08 ,  A61C19/04 ,  G01J3/02 ,  G01J3/10 ,  G01J3/50 ,  G06T1/00 ,  H04N5/225 ,  H04N9/04

    CPC classification number: G01J3/32 ,  A61B5/0013 ,  A61B5/0088 ,  A61B5/02 ,  A61C13/0004 ,  A61C13/082 ,  G01J3/02 ,  G01J3/0218 ,  G01J3/0224 ,  G01J3/0262 ,  G01J3/0264 ,  G01J3/0272 ,  G01J3/0291 ,  G01J3/10 ,  G01J3/463 ,  G01J3/50 ,  G01J3/501 ,  G01J3/508 ,  G01J3/51 ,  G01J3/513 ,  G01J3/524 ,  H04N5/2256 ,  H04N9/045 ,  H04N13/0037 ,  H04N2209/043 ,  H04N2209/044

    Abstract: PROBLEM TO BE SOLVED: To provide an image processing system realizing highly accurate color reproduction, inspection and determination, and having a compact, light-weighted and highly portable image pickup section. SOLUTION: The image processing system includes: a photographing device having a plurality of illumination light sources of different spectrum distribution characteristics, an image pickup optical system, and an image pickup element, wherein light is selectively emitted from the plurality of illumination light sources and exposure to light is performed by the image pickup section in cooperation with this light emission to obtain a plurality of spectrum images of an object; a processing device 2 having an image discrimination calculating section for calculating grade data on colors of the object from the obtained object spectrum images, and a color reproduction calculating section 33 for calculating display image data by estimating XYZ tristimulus values from the obtained object spectrum images using input profile and isochromatic function on the photographing device; and a display 22 for displaying the grade data and an image color-reproduced on the basis of the display image data. COPYRIGHT: (C)2009,JPO&INPIT

    Abstract translation: 要解决的问题：提供一种实现高精度色彩再现，检查和确定的图像处理系统，并且具有紧凑，轻重和高度便携的图像拾取部分。 解决方案：图像处理系统包括：具有不同频谱分布特性的多个照明光源的摄影装置，摄像光学系统和图像拾取元件，其中从多个照明光中选择性地发射光 通过与该发光协作的图像拾取部分执行光源和曝光以获得对象的多个光谱图像; 具有图像识别计算部分的处理装置2，用于从所获得的对象光谱图像中计算关于对象的颜色的等级数据;以及颜色再现计算部分33，用于通过从所获得的目标光谱图像中估计XYZ三刺激值来计算显示图像数据，所述颜色再现计算部分使用 摄影装置上的输入特征和等色函数; 以及用于显示等级数据的显示器22和基于显示图像数据进行颜色再现的图像。 版权所有（C）2009，JPO＆INPIT

    Spectroscope
    87.
    发明专利
    Spectroscope 有权
    分光镜

    公开(公告)号：JP2006030031A

    公开(公告)日：2006-02-02

    申请号：JP2004210687

    申请日：2004-07-16

    Applicant: Hamamatsu Photonics Kk ,  浜松ホトニクス株式会社

    Inventor： TEICHMANN HELMUT ,  HILLER DIETMAR ,  STARKER ULRICH

    IPC: G01J3/02 ,  G01J3/18 ,  G01J3/28 ,  G01J3/36

    CPC classification number: G01J3/2803 ,  G01J3/02 ,  G01J3/0205 ,  G01J3/0259 ,  G01J3/0262 ,  G01J3/18

    Abstract: PROBLEM TO BE SOLVED: To provide a spectroscope with a simple structure realizing a sufficient accuracy of optical element arrangements and reduced in cost.
    SOLUTION: The spectroscope 1A is composed of: an optical body 10 wherein a spectral light path is established, through which spectral object light is propagated; a light entrance slit 16 the object light enters; a diffraction grating 17 which spectrally processes the entrance object light; and a photodiode array 18 which detects the object light spectrally processed by the diffraction grating 17. Furthermore, an optical connection member 20 is disposed therein, which is used as an optical member optically connecting the optical body 10 to the photodiode array 18, and in which a light entrance plane 21 corresponding to the spectrally processed object light is in contact with the upper surface 11 of the optical body 10, and a light emission plane 22 is in contact with the photodiode array 18, and which is made up in such a form that the light emission plane 22 is tilted relatively to the light entrance plane 21 at a prescribed angle.
    COPYRIGHT: (C)2006,JPO&NCIPI

    Abstract translation: 要解决的问题：为了提供具有简单结构的分光器，实现了光学元件布置的足够的精度并降低了成本。 解决方案：分光器1A由以下部分组成：其中建立光谱对象光通过其传播的分光光路的光学体10; 物体光进入的光入口狭缝16; 衍射光栅17，其对入射物体光进行光谱处理; 以及光电二极管阵列18，其检测由衍射光栅17进行光谱处理的物体光。此外，光连接部件20设置在其中，该光连接部件用作将光学体10光学连接到光电二极管阵列18的光学部件， 与光谱处理对象光对应的光入射面21与光学体10的上表面11接触，发光面22与光电二极管阵列18接触，并且由此构成 形成发光平面22相对于光入射面21以规定角度倾斜的形状。 版权所有（C）2006，JPO＆NCIPI

    Photodetector and spectrometer using it
    88.
    发明专利
    Photodetector and spectrometer using it 有权

    公开(公告)号：JP2004354176A

    公开(公告)日：2004-12-16

    申请号：JP2003151415

    申请日：2003-05-28

    Applicant: Hamamatsu Photonics Kk ,  浜松ホトニクス株式会社

    Inventor： TEICHMANN HELMUT ,  HILLER DIETMAR ,  STARKER ULRICH

    IPC: G01J3/18 ,  G01J3/28

    CPC classification number: G01J3/2803 ,  G01J3/0256 ,  G01J3/0262 ,  G01J3/0291

    Abstract: PROBLEM TO BE SOLVED: To provide a photodetector capable of precisely positioning of a constitutional element when applied to a spectrometer, and to provide the spectrometer using it.
    SOLUTION: The spectrometer is constituted of a photodetector 1B which is provided with a photodiode array 11 of a plurality of photodiodes 12 disposed on the upper surface 10a of the semiconductor substrate 10, and a light incident part 13 formed as an opening keeping a prescribed positional relation to the photodiode array 11, a main part 2 composed of the tabular part 20, and supports 21 and 22 placed on the substrate 10. A lens 23 provided on the under face 20b of the tabular part 20, and a planar aberration-reduced blazed reflection diffraction grating 24 separate the light incident from the light incident part 13 and passed through the lens 23 into the spectral components. The separated light spectral components are detected by the photodiode array 11.
    COPYRIGHT: (C)2005,JPO&NCIPI

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