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公开(公告)号:JP4605608B2
公开(公告)日:2011-01-05
申请号:JP2007058251
申请日:2007-03-08
Applicant: 南亞電路板股▲ふん▼有限公司
IPC: H05K1/02
CPC classification number: H05K1/0266 , H05K1/0268 , H05K2201/09481 , H05K2201/09927
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公开(公告)号:JP4895295B2
公开(公告)日:2012-03-14
申请号:JP2007058217
申请日:2007-03-08
Applicant: 南亞電路板股▲ふん▼有限公司
IPC: H01L23/12
CPC classification number: H01L23/5389 , H01L23/36 , H01L24/19 , H01L24/24 , H01L2224/0401 , H01L2224/04105 , H01L2224/12105 , H01L2224/20 , H01L2224/24227 , H01L2224/32245 , H01L2224/73267 , H01L2924/01006 , H01L2924/01013 , H01L2924/01027 , H01L2924/01029 , H01L2924/01033 , H01L2924/01078 , H01L2924/01079 , H01L2924/10253 , H01L2924/14 , H01L2924/15153 , H01L2924/1517 , H01L2924/15311 , H01L2924/18162 , H01L2924/3011 , H01L2924/00
Abstract: A Chip-in Substrate Package (CiSP) includes a double-sided metal clad laminate including a dielectric interposer, a first metal foil laminated on a first side of the dielectric interposer, and a second metal foil laminated on a second side of the dielectric interposer. A recessed cavity is etched into the second metal foil and the dielectric interposer with a portion of the first metal foil as its bottom. A die is mounted within the recessed cavity and makes thermal contact with the first metal foil. A build-up material layer covers the second metal foil and an active surface of the die. The build-up material layer also fills the gap between the die and the dielectric interposer. At least one interconnection layer is provided on the build-up material layer and is electrically connected with a bonding pad disposed on the active surface of the die via a plated through hole.
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