Abstract:
PROBLEM TO BE SOLVED: To provide: a curable resin composition with which an image sensor chip in which color shading is inhibited can be produced; and an image sensor chip production method and an image sensor chip in which the curable resin composition is used.SOLUTION: Provided is a curable resin composition which can be applied so as to have a film thickness of at least 20 μm, and which includes a pigment having a maximum absorption wavelength in the wavelength range 600-850 nm.
Abstract:
PROBLEM TO BE SOLVED: To provide a method of manufacturing an electronic element substrate, with which a variety of electronic elements are fabricated through simple processes by reducing specific resistance of a partial region or the whole region of an oxide. SOLUTION: There is provided the method of manufacturing the electronic element substrate, including a resistance reduction processing step of reducing the specific resistance of the partial region or the whole region of the oxide in a substrate at least a part of the outermost surface layer of which is made of the oxide having specific resistance of ≤1×10 9 Ωcm by applying a potential higher than the potential of the substrate to the partial region or the whole region. COPYRIGHT: (C)2011,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a thin film transistor wherein a thin film comprising an oxide semiconductor containing at least one element in a group comprising In, Ga, and Zn can have a high TFT characteristic, and also to provide a method for manufacturing a polycrystalline oxide semiconductor thin film, and a method for manufacturing a thin film transistor. SOLUTION: In a first step, a vapor deposition method with a polycrystalline sintered body having an IGZO-based composition as a target is used to form, on a substrate 12, a thin film 10A comprising an amorphous oxide semiconductor containing at least one element in a group comprising In, Ga, and Zn. In a second step, the thin film 10A comprising the amorphous oxide semiconductor is put into an electric furnace and is sintered at such a temperature range of 660 to 840°C that the thin film is polycrystallized while maintaining a surface roughness Ra of ≤1.5 nm. COPYRIGHT: (C)2010,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a method for manufacturing a laminate comprising a crystalline homologous compound layer having target resistivity. SOLUTION: The method of manufacturing the laminate comprising the crystalline homologous compound layer has a step of forming the crystalline homologous compound layer represented by M 1 M 2 O 3 (M 3 O) m (M 1 is at least one type of an element selected from a group formed of Sc, In, Lu, Yb, Tm, Er, Ho and Y, M 2 is at least one type of element selected from a group formed of Fe, Ga, In and Al, M 3 is at least one type of element selected from a group formed of Cd, Mg, Mn, Co, Cu and Zn and m is a natural number of 1 or above) and a step of controlling resistivity of the crystalline homologous compound layer by forming a protection layer covering the crystalline homologous compound layer under an atmosphere where a condition that oxygen partial pressure is ≤2×10 -2 Pa or a temperature is ≥150°C is satisfied. COPYRIGHT: (C)2011,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a manufacturing method of a flexible electronic device to suppress degassing from an adhesion layer in a vacuum process, a multilayer substrate with a resin layer for manufacturing a flexible electronic device with little degassing, and a flexible electronic device manufacturing member.SOLUTION: The manufacturing method of a flexible electronic device comprises processes of: releasing at least a part of a volatile component of an adhesion layer 20 by performing a heat treatment after bonding a flexible substrate 22 via the adhesion layer 20 to a support substrate 30 excellent in dimensional stability; and suppressing degassing from the adhesion layer 20 by providing a cover resin layer 24 to cover an exposed part of the adhesion layer 20.