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    Spectrum measurement device, image evaluation device and image formation device
    2.
    发明专利
    Spectrum measurement device, image evaluation device and image formation device 有权
    光谱测量装置，图像评估装置和图像形成装置

    公开(公告)号：JP2013186023A

    公开(公告)日：2013-09-19

    申请号：JP2012052478

    申请日：2012-03-09

    Applicant: Ricoh Co Ltd ,  株式会社リコー

    Inventor： KAMIJO TADAHIRO ,  SHINPO KOHEI ,  KUBOTA YOICHI ,  SEO MANABU

    IPC: G01J3/50 ,  G03G15/00 ,  G03G15/01

    CPC classification number: G01J3/42 ,  G01J3/0208 ,  G01J3/0229 ,  G01J3/024 ,  G01J3/0262 ,  G01J3/0297 ,  G01J3/18 ,  G01J3/24 ,  G01J3/2823 ,  G01J3/50 ,  G01J2003/503 ,  G03G15/00 ,  G03G15/5062

    Abstract: PROBLEM TO BE SOLVED: To provide a spectrum measurement device that allows a wavelength spectrum of reflection light from an object to be stably measured with high accuracy.SOLUTION: A spectrum measurement device 10 comprises: a light source unit 11 that irradiates a recording paper P with light; an aperture element 13 that is arranged on an optical path of reflection light from the recording paper P and provided with a plurality of apertures; a diffraction element 15 that is arranged on optical paths of a plurality of pieces of light which, out of the reflection light, have passed through a plurality of apertures; a mask element 17 that includes a plurality of passage parts allowing a plurality of +1-order diffraction images, out of a plurality of diffraction images of the plurality of pieces of light formed by the diffraction element 15, to individually pass through, and a light shield part shielding diffraction images in orders other than +1-order; and a linear sensor 16 that includes a plurality of spectrum sensors individually receiving the plurality of +1-order diffraction images passing through the plurality of passage parts.

    Abstract translation: 要解决的问题：提供一种允许以高精度稳定地测量来自物体的反射光的波长谱的光谱测量装置。解决方案：光谱测量装置10包括：光源单元11，其照射记录纸P 与光; 光圈元件13，其设置在来自记录纸P的反射光的光路上并且设置有多个孔; 配置在多个光的光路上的衍射元件15，其在反射光中已经通过多个孔; 掩模元件17，其包括多个通过衍射元件15形成的多个光的多个衍射图像中的多个+1阶衍射图像的通过部分，以分别通过， 屏蔽部分屏蔽除+ 1级以外的顺序的衍射图像; 以及线性传感器16，其包括分别接收通过多个通道部分的多个+ 1级衍射图像的多个频谱传感器。

    Spectrophotometer and method for determining slit condition for the same
    5.
    发明专利
    Spectrophotometer and method for determining slit condition for the same 审中-公开
    分光光度计及其测定方法

    公开(公告)号：JP2012230074A

    公开(公告)日：2012-11-22

    申请号：JP2011099894

    申请日：2011-04-27

    Applicant: Hitachi High-Technologies Corp ,  株式会社日立ハイテクノロジーズ

    Inventor： KURIMOTO DAISUKE ,  WAKUI TAKAYUKI

    IPC: G01J3/04

    CPC classification number: G01J3/04 ,  G01J3/024 ,  G01J3/027 ,  G01J3/06 ,  G01J3/18

    Abstract: PROBLEM TO BE SOLVED: To select wavelength resolution capable of detecting a real spectral peak of a sample based on measurer's experience and knowledge when a sample whose spectral shape is unknown is to be measured.SOLUTION: Wavelength resolution setting operation can be automatically set in accordance with a measurement spectrum. Therefore, a plurality of slits with respectively different aperture widths are prepared and a wavelength of monochromatic light passing an individual slit is scanned within a predetermined wavelength range to measure a spectrum in each aperture width of the slit. Based on compared results of a plurality of spectra measured about the slits with respectively different aperture widths, a slit condition for regulating relation between the aperture width of at least one slit to be used for measurement of the sample and at least one wavelength range applying the aperture width of the slit is determined.

    Abstract translation: 要解决的问题：当要测量其光谱形状未知的样品时，基于测量者的经验和知识选择能够检测样品的实际光谱峰值的波长分辨率。

    解决方案：可以根据测量光谱自动设置波长分辨率设置操作。 因此，准备具有不同孔径宽度的多个狭缝，并且在预定波长范围内扫描通过单个狭缝的单色光的波长，以测量狭缝的每个孔径宽度中的光谱。 基于对具有分别不同的孔径宽度的狭缝测量的多个光谱的比较结果，用于调节用于测量样品的至少一个狭缝的孔径宽度与施加样品的至少一个波长范围之间的关系的狭缝条件 确定狭缝的孔径宽度。 版权所有（C）2013，JPO＆INPIT

    Raman scattering signal acquisition device and plastic discriminating device, and raman scattering signal acquisition method and plastic discriminating method
    6.
    发明专利
    Raman scattering signal acquisition device and plastic discriminating device, and raman scattering signal acquisition method and plastic discriminating method 有权
    拉曼散射信号获取装置和塑料鉴别装置，以及拉曼散射信号获取方法和塑料辨别方法

    公开(公告)号：JP2012042248A

    公开(公告)日：2012-03-01

    申请号：JP2010181806

    申请日：2010-08-16

    Applicant: Saimu:Kk ,  株式会社サイム

    Inventor： TSUCHIDA YASUO ,  KASAI HIROBUMI ,  ARIKATA KAZUYOSHI ,  TSUCHIDA AKIHIRO ,  OINUMA TOSHIAKI

    IPC: G01N21/65

    CPC classification number: G01N21/65 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/0216 ,  G01J3/0221 ,  G01J3/024 ,  G01J3/44

    Abstract: PROBLEM TO BE SOLVED: To provide a Raman scattering signal acquisition device and a Raman scattering signal acquisition method which are capable of discriminating a target to be discriminated, even with weak Raman scattering light.SOLUTION: The Raman scattering signal acquisition device includes: a light collecting optical system 30 including a condenser lens 32 which collects Raman scattering light generated from a plastic P to be discriminated by irradiation of exciting laser light L widely from an irradiation range of the exciting laser light L; a spectroscopic optical system 50 including a spectroscope 52 for dispersing the Raman scattering light; and an optical fiber bundle 40 as an optical path conversion body, which comprises a plurality of optical fibers and converts light collected by the light collecting optical system 30 to a slit shape corresponding to a direction of a diffraction grating of the spectroscope 52.

    Abstract translation: 要解决的问题：即使使用弱拉曼散射光，也能够提供能够区分待鉴别目标的拉曼散射信号获取装置和拉曼散射信号获取方法。 解决方案：拉曼散射信号获取装置包括：聚光光学系统30，其包括聚光透镜32，聚光透镜32收集从塑料P产生的拉曼散射光，以通过从激光激光L的照射广泛地区分激光激光L的照射范围 激光激光L; 包括用于分散拉曼散射光的分光镜52的分光光学系统50; 以及作为光路转换体的光纤束40，其包括多个光纤，并且将由聚光光学系统30收集的光转换成与分光器52的衍射光栅的方向对应的狭缝形状。

    版权所有（C）2012，JPO＆INPIT

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