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公开(公告)号：US11193967B2
公开(公告)日：2021-12-07
申请号：US16743878
申请日：2020-01-15
Applicant: Analog Devices Global
Inventor： Alan J. O'Donnell , David Aherne , Javier Alejandro Salcedo , David J. Clarke , John A. Cleary , Patrick Martin McGuinness , Albert C. O'Grady
IPC: G01R31/00 , G08B21/18 , H02H1/00 , H02H9/04 , H02H3/20 , H05K1/02 , H02H9/00 , H01L27/02 , H02H3/04
Abstract: Aspects of this disclosure relate to detecting and recording information associated with electrical overstress (EOS) events, such as electrostatic discharge (ESD) events. For example, in one embodiment, an apparatus includes an electrical overstress protection device, a detection circuit configured to detect an occurrence of the EOS event, and a memory configured to store information indicative of the EOS event.
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公开(公告)号：US20210376800A1
公开(公告)日：2021-12-02
申请号：US17303021
申请日：2021-05-18
Applicant: ANALOG DEVICES GLOBAL UNLIMITED COMPANY
Inventor： Ahmed I. Khalil , Patrick Pratt
Abstract: Apparatus and methods provide predistortion for a phased array. Radio frequency (RF) sample signals from phased array elements are provided along return paths and are combined by a hardware RF combiner. Phase shifters are adjusted such that the RF sample signals are phase-aligned when combined. Adaptive adjustment of predistortion for the amplifiers of the phased array can be based on a signal derived from the combined RF sample signals.
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公开(公告)号：US20210134641A1
公开(公告)日：2021-05-06
申请号：US16486695
申请日：2018-02-17
Applicant: ANALOG DEVICES GLOBAL UNLIMITED COMPANY
Inventor： James G. Fiorenza , Susan L. Feindt , Michael D. Delaus , Matthew Duffy , Ryan lutzi , Kenneth Flanders , Rama Krishna Kotlanka
IPC: H01L21/683 , H01L25/075 , H01L33/00 , H01L33/32 , H01L33/62
Abstract: A transfer printing method is described that can be used for a wide variety of materials, such as to allow for circuits formed of different materials to be integrated together on a single integrated circuit. A tether (18) is formed on dice regions (16) of a first wafer (30), followed by attachment of a second wafer (32) to the tethers. The dice regions (16) are processed so as to be separated, followed by transfer printing of the dice regions to a third wafer (34).
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公开(公告)号：US10972063B2
公开(公告)日：2021-04-06
申请号：US16174830
申请日：2018-10-30
Applicant: Analog Devices Global Unlimited Company
Inventor： Simon Nicholas Fiedler Basilico , Yoshinori Kusuda , Camille Louis Huin , Gary Carreau , Gustavo Castro , Sean Patrick Kowalik , Michael C. W. Coln , Scott Andrew Hunt
Abstract: Amplifier systems for measuring a wide range of current are provided herein. In certain embodiments, an amplifier system includes a controllable sensing circuit, a first amplifier including an output configured to drive a device under test (DUT) through the controllable sensing circuit, and a second amplifier including an input coupled to the controllable sensing circuit and operable to generate a measurement signal indicating an amount of measured current of the DUT. The amplifier system further includes a control circuit operable to control a configuration or mode of the controllable sensing circuit suitable for a particular type of DUT.
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公开(公告)号：US20210088580A1
公开(公告)日：2021-03-25
申请号：US17062225
申请日：2020-10-02
Applicant: Analog Devices Global
Inventor： Edward John Coyne , Alan J. O'Donnell , Shaun Bradley , David Aherne , David Boland , Thomas G. O'Dwyer , Colm Patrick Heffernan , Kevin B. Manning , Mark Forde , David J. Clarke , Michael A. Looby
Abstract: The disclosed technology generally relates to integrated circuit devices with wear out monitoring capability. An integrated circuit device includes a wear-out monitor device configured to record an indication of wear-out of a core circuit separated from the wear-out monitor device, wherein the indication is associated with localized diffusion of a diffusant within the wear-out monitor device in response to a wear-out stress that causes the wear-out of the core circuit.
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Patent Agency Ranking
公开(公告)号：US10859406B2
公开(公告)日：2020-12-08
申请号：US15420719
申请日：2017-01-31
Applicant: Analog Devices Global
Inventor： Aude Richard , Peter James Tonge , Jochen Schmitt , Monsoon Dutt
Abstract: Aspects of the present disclosure relate to correcting for a phase shift between signals associated with an angle sensor and a multi-turn sensor that includes magnetoresistive elements. A processing circuit can determine a phase shift correction and generate position information based on at least the phase shift correction and a signal associated with the multi-turn sensor.
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公开(公告)号：US10797656B2
公开(公告)日：2020-10-06
申请号：US16055437
申请日：2018-08-06
Applicant: Analog Devices Global Unlimited Company
Inventor： Mohamed Moussa Ramadan Esmael
Abstract: Systems, methods, and apparatuses for improving reliability and/or reducing or preventing breakdown of an amplifier, specifically breakdown of a transistor of an amplifier, are disclosed. A protection circuit can be electrically coupled to the amplifier, and can be configured to reduce a voltage swing at the amplifier. The amplifier can include a first transistor, and the protection circuit can include a second transistor electrically coupled to a control terminal of the first transistor of the amplifier. When a power at a control terminal of the second transistor of the protection circuit satisfies a threshold power, the protection circuit can be configured to reduce a power at a power terminal of the first transistor the amplifier. By reducing the voltage at the power terminal of the first transistor the amplifier, the protection circuit can allow the amplifier to operate safely, without breakdown.
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公开(公告)号：US10794950B2
公开(公告)日：2020-10-06
申请号：US16513562
申请日：2019-07-16
Applicant: Analog Devices Global
Inventor： Edward John Coyne , Alan J. O'Donnell , Shaun Bradley , David Aherne , David Boland , Thomas G. O'Dwyer , Colm Patrick Heffernan , Kevin B. Manning , Mark Forde , David J. Clarke , Michael A. Looby
Abstract: The disclosed technology generally relates to integrated circuit devices with wear out monitoring capability. An integrated circuit device includes a wear-out monitor device configured to record an indication of wear-out of a core circuit separated from the wear-out monitor device, wherein the indication is associated with localized diffusion of a diffusant within the wear-out monitor device in response to a wear-out stress that causes the wear-out of the core circuit.
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公开(公告)号：US10782153B2
公开(公告)日：2020-09-22
申请号：US15064544
申请日：2016-03-08
Applicant: Analog Devices Global
Inventor： Jochen Schmitt
IPC: G01D5/16
Abstract: A system includes a multiturn counter that can store a magnetic state associated with a number of accumulated turns of a magnetic field. The multiturn counter includes a plurality of magnetoresistive elements electrically coupled in series with each other. A matrix of electrical connections is arranged to connect magnetoresistive elements of the plurality of magnetoresistive elements to other magnetoresistive elements of the plurality of magnetoresistive elements.
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公开(公告)号：US20200295977A1
公开(公告)日：2020-09-17
申请号：US16833177
申请日：2020-03-27
Applicant: Analog Devices Global Unlimited Company
Inventor： Hajime SHIBATA , Brian HOLFORD , Trevor Clifford CALDWELL , Siddharth DEVARAJAN
Abstract: A continuous-time sampler has series-connected delay lines with intermediate output taps between the delay lines. Signal from an output tap can be buffered by an optional voltage buffer for performance. A corresponding controlled switch is provided with each output tap to connect the output tap to an output of the continuous-time sampler. The delay lines store a continuous-time input signal waveform within the propagation delays. Controlling the switches corresponding to the output taps with pulses that match the propagation delays can yield a same input signal value at the output. The continuous-time sampler effectively “holds” or provides the input signal value at the output for further processing without requiring switched-capacitor circuits that sample the input signal value onto some capacitor. In some cases, the continuous-time sampler can be a recursively-connected delay line. The continuous-time sampler can be used as the front end sampler in a variety of analog-to-digital converters.
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