摘要:
A method for eliminating bit line leakage current of a memory cell in random access memory devices comprises the steps of: periodically activating a pre-charge equalization circuit, which provides a pre-charge voltage to a pair of complementary bit lines of a memory cell, if the memory cell is in a self-refresh mode or a standby mode; and temporarily activating the pre-charge equalization circuit after the memory cell is refreshed if the memory cell is in the self-refresh mode or the standby mode.
摘要:
The present invention provides a semiconductor memory device, the voltage divider circuit comprises a data line sense amplifier and an input output data sensing circuit. The data line sense amplifier receives a data line signal pair and senses the data line signal pair in a first timing period to generate a first output data and a second output data, wherein, the first output data and the second output data are complementary. The input output data sensing circuit receives at least one reference output data and one of the first and the second output data. The input output data sensing circuit generates a sensed data by comparing voltage levels of the reference output data and the one of the first and the second output data in a second timing period, wherein the voltage level of the reference output data is a pre-determined voltage level.
摘要:
An over erase correction method of a flash memory apparatus is provided. The flash memory apparatus includes at least a microprocessor, a memory array, a bit line exchange unit and a column decoder. By controlling the column decoder of the flash memory during a period of the over-erase correction, the column decoder outputs control signals to the bit line exchange unit for selecting at least one of the bit lines according to a magnitude of the bit line leakage current. The drop in the charge pump voltage due to the bit line leakage current is reduced, and thus, the over-erase correction is executed effectively during the period of the over-erase correction.
摘要:
A voltage regulator circuit for a memory circuit comprises a voltage divider, a capacitor, an active-mode voltage regulator and a standby-mode voltage regulator. The active-mode voltage regulator is always on while in active mode, and turned on whenever a refresh is requested. The standby-mode voltage regulator is periodically turned on while in standby mode, and turned on whenever a refresh is requested. In addition, the active voltage regulator uses stronger transistors than those used by the standby-mode voltage regulator, and both the active-mode voltage regulator and the standby-mode voltage regulator are coupled to the voltage divider and the capacitor.
摘要:
A power-up circuit comprises an external supply voltage potential detector, a first internal supply voltage potential detector, a second internal supply voltage potential detector, and a logic circuit. The external supply voltage potential detector is configured to detect a supply voltage that is external to the memory device and to generate a first detection signal indicating whether a voltage potential of the external supply voltage reaches a first predetermined value. The first internal supply voltage potential detector is configured to detect a first internal supply voltage that is internal to the memory device and to generate a second detection signal indicating whether a voltage potential of the first internal supply voltage reaches a second predetermined value. The second internal supply voltage potential detector is configured to detect a second internal supply voltage that is internal to the memory device and to receive the first detection signal and an output voltage of the first internal supply voltage potential detector for generating a third detection signal indicating whether the voltage potentials of the external supply voltage and the first and second internal supply voltages reach the first, second, and third predetermined values respectively. The logic circuit is configured to receive the third detection signal and to generate a power-up signal.
摘要:
A method for determining a temperature in a circuit comprises receiving a periodic signal. A frequency of the periodic signal is an increasing function of temperature. A number of oscillations of the periodic signal is determined during a time interval. A length of the time interval is an increasing function of temperature. The temperature is based on the determined number of oscillations.
摘要:
A temperature detector in an integrated circuit comprises a temperature-dependent voltage generator, a ring oscillator, a timer and a clock-driven recorder. The temperature-dependent voltage generator is configured to generate at least one temperature-dependent voltage. The ring oscillator is configured to generate a clock signal, which is affected by one of the at least one temperature-dependent voltage. The timer is configured to generate a time-out signal, which is affected by one of the temperature-dependent voltage. The clock-driven recorder has a clock input terminal in response to the clock signal and time-out signal.
摘要:
A level shifter comprises a voltage converting circuit, a voltage pull-up circuit, and a control signal generating circuit. The voltage converting circuit is configured to receive an input signal of a first voltage level and to output an output signal of a second voltage level. The voltage pull-up circuit is coupled to the voltage converting circuit and configured to expeditiously pull up a voltage of an output node of the level shifter to the second voltage level in response to a control signal. The control signal generating circuit is configured to receive the input signal and to provide the control signal to the voltage pull-up circuit. The control signal generating circuit includes three transistors.
摘要:
A method for erasing flash memory comprises the steps of: setting a critical ending condition; simultaneously erasing selected multiple sectors of the flash memory; stopping simultaneous erasing if one of the selected multiple sectors meets the critical ending condition; and erasing the remainder of each of the selected multiple sectors sequentially.
摘要:
A transmission method for a serial periphery interface (SPI) serial flash includes the steps of providing a first system clock signal and transmitting a plurality of data strings with each two bits of the data strings transmitted in a period of the first system clock signal. A second system clock signal is generated by the first system clock signal to provide a double frequency to enhance the transmission rate of all the data inputted into or outputted from the SPI serial flash.