公开(公告)号：US11869757B2

公开(公告)日：2024-01-09

申请号：US17616831

申请日：2020-06-05

Applicant: ADAPTAS SOLUTIONS PTY LTD

Inventor： Russell Jurek ,  Kevin Hunter ,  Antony Jones ,  Aditya Wakhle

IPC: H01J43/10 ,  H01J43/02 ,  H01J1/32 ,  H01J43/24 ,  H01J43/28 ,  G01T1/28 ,  H01J49/02 ,  H01J49/26

CPC classification number: H01J43/10 ,  H01J43/02 ,  H01J43/28 ,  G01T1/28 ,  H01J49/025 ,  H01J49/26

Abstract: Ion detectors of the type used in scientific instrumentation, such as mass spectrometers. More particularly, a self-contained particle detector includes an enclosure formed in part by a transmission mode secondary electron emissive element, the enclosure defining an internal environment and an external environment, wherein the transmission mode secondary electron emissive element has an externally facing surface and an internally facing surface and is configured such that impact of a particle on the externally facing surface causes emission of one or more secondary electrons from the internally facing surface.

公开(公告)号：US20220293402A1

公开(公告)日：2022-09-15

申请号：US17616831

申请日：2020-06-05

Applicant: ADAPTAS SOLUTIONS PTY LTD

Inventor： Russell Jurek ,  Kevin Hunter ,  Antony Jones ,  Aditya Wakhle

IPC: H01J43/10 ,  H01J43/02 ,  H01J43/28

Abstract: Ion detectors of the type used in scientific instrumentation, such as mass spectrometers. More particularly, a self-contained particle detector includes an enclosure formed in part by a transmission mode secondary electron emissive element, the enclosure defining an internal environment and an external environment, wherein the transmission mode secondary electron emissive element has an externally facing surface and an internally facing surface and is configured such that impact of a particle on the externally facing surface causes emission of one or more secondary electrons from the internally facing surface.