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    Detector Comprising Transmission Secondary Electron Emmission Means
    1.
    发明申请
    Detector Comprising Transmission Secondary Electron Emmission Means 有权

    公开(公告)号：US20220293402A1

    公开(公告)日：2022-09-15

    申请号：US17616831

    申请日：2020-06-05

    Applicant: ADAPTAS SOLUTIONS PTY LTD

    Inventor： Russell Jurek ,  Kevin Hunter ,  Antony Jones ,  Aditya Wakhle

    IPC: H01J43/10 ,  H01J43/02 ,  H01J43/28

    Abstract: Ion detectors of the type used in scientific instrumentation, such as mass spectrometers. More particularly, a self-contained particle detector includes an enclosure formed in part by a transmission mode secondary electron emissive element, the enclosure defining an internal environment and an external environment, wherein the transmission mode secondary electron emissive element has an externally facing surface and an internally facing surface and is configured such that impact of a particle on the externally facing surface causes emission of one or more secondary electrons from the internally facing surface.

    Improvements to Electron Multipliers Internal Regions
    2.
    发明申请
    Improvements to Electron Multipliers Internal Regions 有权

    公开(公告)号：US20210384018A1

    公开(公告)日：2021-12-09

    申请号：US17282472

    申请日：2019-08-26

    Applicant: ADAPTAS SOLUTIONS PTY LTD

    Inventor： Russell Jurek ,  Kevin Hunter

    IPC: H01J43/28 ,  H01J43/10 ,  H01J43/18

    Abstract: An electron multiplier apparatus of the type used in ion detectors, and modifications thereto for extending the operational lifetime or otherwise improving performance. The electron multiplier includes a series of discrete electron emissive surfaces configured to provide an electron amplification chain, the electron multiplier being configured so as to inhibit or prevent a contaminant from entering into, or passing partially through, or passing completely through the electron multiplier. The electron multiplier may include one or more baffles configured. so as to decrease vacuum conductance of the electron multiplier compared to the same or similar electron multiplier not having one or more baffles.

    Apparatus and methods for controlling a charged particle in a magnetic field
    3.
    发明授权
    Apparatus and methods for controlling a charged particle in a magnetic field 有权

    公开(公告)号：US10991497B2

    公开(公告)日：2021-04-27

    申请号：US16075269

    申请日：2017-02-02

    Applicant: ADAPTAS SOLUTIONS PTY LTD

    Inventor： Richard Stresau ,  Kevin Hunter ,  Yair Benari ,  Russell Jurek ,  Toby Shanley

    IPC: H01F7/02 ,  H01J43/04

    Abstract: An apparatus for providing a magnetic field includes a magnet having a surface, and a structure disposed above the magnet surface. The structure includes a material of high magnetic permeability. The apparatus provides an interface between the material of high magnetic permeability and a material of low magnetic permeability. The apparatus may have two poles in magnetic communication with the magnet, the poles extending above the surface of the magnet, and the structure is disposed between the poles. The structure may have alternating regions of high magnetic permeability and low magnetic permeability. The apparatus alters the magnetic field of the magnet to reduce or remove a disorder in the magnetic field, and/or decrease the magnitude of the magnetic field, and/or induce a distortion in the magnetic field, and/or align or re-align the magnetic field, and/or orientate or re-orientate the magnetic field, and/or alter distribution or shape of the magnetic field.

    Detector Having Improved Construction
    4.
    发明公开
    Detector Having Improved Construction 审中-公开

    公开(公告)号：US20240266157A1

    公开(公告)日：2024-08-08

    申请号：US18615240

    申请日：2024-03-25

    Applicant: ADAPTAS SOLUTIONS PTY LTD

    Inventor： Russell Jurek ,  David Dellagiacoma ,  Kevin Hunter

    IPC: H01J43/28 ,  H01J49/02 ,  H01J49/26

    CPC classification number: H01J43/28 ,  H01J49/025 ,  H01J49/26

    Abstract: A detector includes: one or more electron emissive surfaces; first and second housing elements defining a space therebetween; and a deformable member or a deformable mass some or all of which occupies the space. The first and second housing elements and the deformable member or the deformable mass define on one side an environment internal the detector and on another side an environment external the detector. The deformable member or the deformable mass has a central region which when contacted by the first and/or second housing elements is deformed so as to inhibit or prevent passage of a gas through the space.

    SAMPLE ANALYSIS APPARATUS HAVING IMPROVED INPUT OPTICS AND COMPONENT ARRANGEMENT
    6.
    发明申请
    SAMPLE ANALYSIS APPARATUS HAVING IMPROVED INPUT OPTICS AND COMPONENT ARRANGEMENT 有权

    公开(公告)号：US20210151304A1

    公开(公告)日：2021-05-20

    申请号：US17046952

    申请日：2019-04-12

    Applicant: ADAPTAS SOLUTIONS PTY LTD

    Inventor： Russell Jurek ,  Kevin Hunter

    IPC: H01J49/02 ,  H01J49/04 ,  H01J49/14 ,  H01J49/20

    Abstract: A sample analysis apparatus for scientific analytical equipment such as mass spectrometers. The sample analysis apparatus includes an ion source configured to generate an ion from a sample input into the particle detection apparatus, and an ion detector having an input configured to receive an ion generated from an ion source. The sample analysis apparatus is configured such that a contaminant comingling with an ion generated by the ion source and flowing in the same general direction as the ion, is inhibited or prevented from entering the detector input.

    PARTICLE DETECTOR HAVING IMPROVED PERFORMANCE AND SERVICE LIFE
    7.
    发明申请
    PARTICLE DETECTOR HAVING IMPROVED PERFORMANCE AND SERVICE LIFE 有权

    公开(公告)号：US20210074531A1

    公开(公告)日：2021-03-11

    申请号：US17040410

    申请日：2019-03-22

    Applicant: ADAPTAS SOLUTIONS PTY LTD

    Inventor： Russell Jurek ,  Kevin Hunter

    IPC: H01J43/18 ,  H01J49/28 ,  H01J43/10 ,  H01J49/02 ,  H01J47/00

    Abstract: The present invention relates to generally to components of scientific analytical equipment. More particularly, the invention relates to ion detectors of the type which incorporate electron multipliers and modifications thereto for extending the operational lifetime or otherwise improving performance. The invention may be embodied in the form of a particle detector having one or more electron emissive surfaces and/or an electron collector surface therein, the particle detector being configured such that in operation the environment about the electron emissive surface(s) and/or the electron collector surface is/are different to the environment immediately external to the detector.

    Methods and Apparatus for Improved Pumping of Ion Detector
    9.
    发明申请
    Methods and Apparatus for Improved Pumping of Ion Detector 有权

    公开(公告)号：US20220277942A1

    公开(公告)日：2022-09-01

    申请号：US17637313

    申请日：2020-08-24

    Applicant: Adaptas Solutions Pty Ltd

    Inventor： Kevin Hunter ,  Russell Jurek

    IPC: H01J49/00 ,  H01J49/40 ,  H01J49/42

    Abstract: A method for operating scientific analytical equipment such as mass spectrometers for the purpose of improving the performance and/or service life. Such method may include: providing an ion stream comprising ions having a range of masses, separating the ions of the ion stream on the basis of mass, and controlling the timing and/or order of impact of the separated ions on an electron emissive surface of the ion detector so as to modify one or more parameters of the ion detector.

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