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公开(公告)号：US20240266157A1
公开(公告)日：2024-08-08
申请号：US18615240
申请日：2024-03-25
发明人： Russell Jurek , David Dellagiacoma , Kevin Hunter
CPC分类号： H01J43/28 , H01J49/025 , H01J49/26
摘要： A detector includes: one or more electron emissive surfaces; first and second housing elements defining a space therebetween; and a deformable member or a deformable mass some or all of which occupies the space. The first and second housing elements and the deformable member or the deformable mass define on one side an environment internal the detector and on another side an environment external the detector. The deformable member or the deformable mass has a central region which when contacted by the first and/or second housing elements is deformed so as to inhibit or prevent passage of a gas through the space.
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公开(公告)号：US11848180B2
公开(公告)日：2023-12-19
申请号：US17040410
申请日：2019-03-22
发明人： Russell Jurek , Kevin Hunter
CPC分类号： H01J43/18 , H01J43/10 , H01J43/28 , H01J47/002 , H01J47/005 , H01J49/025 , H01J49/288
摘要： Components of scientific analytical equipment. More particularly, ion detectors of the type which incorporate electron multipliers and modifications thereto for extending the operational lifetime or otherwise improving performance. The ion detector may be embodied in the form of a particle detector having one or more electron emissive surfaces and/or an electron collector surface therein, the particle detector being configured such that in operation the environment about the electron emissive surface(s) and/or the electron collector surface is/are different to the environment immediately external to the detector.
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公开(公告)号：US20210151304A1
公开(公告)日：2021-05-20
申请号：US17046952
申请日：2019-04-12
发明人： Russell Jurek , Kevin Hunter
摘要： A sample analysis apparatus for scientific analytical equipment such as mass spectrometers. The sample analysis apparatus includes an ion source configured to generate an ion from a sample input into the particle detection apparatus, and an ion detector having an input configured to receive an ion generated from an ion source. The sample analysis apparatus is configured such that a contaminant comingling with an ion generated by the ion source and flowing in the same general direction as the ion, is inhibited or prevented from entering the detector input.
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公开(公告)号：US20210074531A1
公开(公告)日：2021-03-11
申请号：US17040410
申请日：2019-03-22
发明人： Russell Jurek , Kevin Hunter
摘要： The present invention relates to generally to components of scientific analytical equipment. More particularly, the invention relates to ion detectors of the type which incorporate electron multipliers and modifications thereto for extending the operational lifetime or otherwise improving performance. The invention may be embodied in the form of a particle detector having one or more electron emissive surfaces and/or an electron collector surface therein, the particle detector being configured such that in operation the environment about the electron emissive surface(s) and/or the electron collector surface is/are different to the environment immediately external to the detector.
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公开(公告)号：US11869757B2
公开(公告)日：2024-01-09
申请号：US17616831
申请日：2020-06-05
发明人： Russell Jurek , Kevin Hunter , Antony Jones , Aditya Wakhle
摘要： Ion detectors of the type used in scientific instrumentation, such as mass spectrometers. More particularly, a self-contained particle detector includes an enclosure formed in part by a transmission mode secondary electron emissive element, the enclosure defining an internal environment and an external environment, wherein the transmission mode secondary electron emissive element has an externally facing surface and an internally facing surface and is configured such that impact of a particle on the externally facing surface causes emission of one or more secondary electrons from the internally facing surface.
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公开(公告)号：US20230015584A1
公开(公告)日：2023-01-19
申请号：US17783480
申请日：2020-12-07
发明人： Russell Jurek
摘要： Scientific instruments (such as mass spectrometers) include an electron multiplier and a cross-filed ion detector including an ion impact plate. The electron multiplier receives and amplifies secondary electrons emitted by the impact plate to generate an output signal. The output signal is amplified and subsequently digitized. Amplification is limited so as to keep secondary electrons to a maximum thereby decreasing electron flux and improving instrument life.
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公开(公告)号：US20220277942A1
公开(公告)日：2022-09-01
申请号：US17637313
申请日：2020-08-24
发明人： Kevin Hunter , Russell Jurek
摘要： A method for operating scientific analytical equipment such as mass spectrometers for the purpose of improving the performance and/or service life. Such method may include: providing an ion stream comprising ions having a range of masses, separating the ions of the ion stream on the basis of mass, and controlling the timing and/or order of impact of the separated ions on an electron emissive surface of the ion detector so as to modify one or more parameters of the ion detector.
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8.发明申请公开(公告)号：US20210175043A1
公开(公告)日：2021-06-10
申请号：US16754802
申请日：2018-08-29
发明人： Wayne Sheils , Toby Shanley
摘要： Components of scientific analytical equipment, and particularly to methods for extending the operational lifetime or otherwise improving the performance of dynodes used in electron multipliers. The method includes: (i) increasing the secondary electron yield of a dynode and/or (ii) decreasing the rate of degradation of electron yield of a dynode, by exposing a dynode electron-emissive surface to an electron flux under conditions causing electron-impact induced removal of a contaminant deposited on the dynode electron-emissive surface. The conditions may be selected such that the electron-mediated removal is enhanced relative to a contaminant deposition process so as to provide a net decrease in the rate of contaminant deposition and/or a decrease in the amount of contaminant present on the dynode electron-emissive surface.
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公开(公告)号：US20240258089A1
公开(公告)日：2024-08-01
申请号：US18564743
申请日：2022-05-26
发明人： Daen Ekers , David Whiteley
摘要： The present invention relates to electron multipliers as used in ion detection apparatus such as mass spectrometers. The multiplier comprises a voltage stabilizing component or system, and is configured to reduce a negative effect of voltage fluctuations within and/or electromagnetic radiation emitted by the voltage stabilizing component or system during operation on an output signal of the electron multiplier. The multiplier may be configured so as to decouple the voltage fluctuations within and/or the electromagnetic radiation emitted by the voltage stabilizing component or system from its output signal.
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公开(公告)号：US20220293402A1
公开(公告)日：2022-09-15
申请号：US17616831
申请日：2020-06-05
发明人： Russell Jurek , Kevin Hunter , Antony Jones , Aditya Wakhle
摘要： Ion detectors of the type used in scientific instrumentation, such as mass spectrometers. More particularly, a self-contained particle detector includes an enclosure formed in part by a transmission mode secondary electron emissive element, the enclosure defining an internal environment and an external environment, wherein the transmission mode secondary electron emissive element has an externally facing surface and an internally facing surface and is configured such that impact of a particle on the externally facing surface causes emission of one or more secondary electrons from the internally facing surface.
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