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公开(公告)号:US10450226B2
公开(公告)日:2019-10-22
申请号:US15818016
申请日:2017-11-20
Applicant: AGC Inc.
Inventor: Izuru Kashima , Yusuke Fujiwara , Kiyoshi Tamai , Yuichi Suzuki , Daisuke Kobayashi , Yoichi Sera , Taku Yamada
Abstract: A chemically strengthened glass having a compressive stress layer formed in a surface layer thereof according to an ion exchange method, in which the glass has a surface roughness (Ra) of 0.20 nm or higher, a hydrogen concentration Y in a region to a depth X from an outermost surface of the glass satisfies the following relational equation (I) at X=from 0.1 to 0.4 (μm), a surface strength F (N) measured by a ball-on-ring test under the following conditions is (F≥1500×t2) relative to a sheet thickness t (mm) of the glass, and a surface of the glass has no polishing flaw: Y=aX+b (I) in which meanings of respective symbols in the equation (I) are as follows: Y: hydrogen concentration (as H2O, mol/L); X: depth from the outermost surface of the glass (μm); a: −0.270 to −0.005; and b: 0.020 to 0.220.
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公开(公告)号:US11150550B2
公开(公告)日:2021-10-19
申请号:US16056786
申请日:2018-08-07
Applicant: AGC INC.
Inventor: Hiroshi Hanekawa , Tsuyoshi Kakuta , Yoichi Sera , Sadatatsu Ikeda
Abstract: A reflective mask blank includes, on/above a substrate in the following order from the substrate side a multilayer reflective film which reflects EUV light and an absorber film which absorbs EUV light. The absorber film is a tantalum-based material film containing a tantalum-based material. The absorber film provides a peak derived from the tantalum-based material in an X-ray diffraction pattern, the peak having a peak diffraction angle (2θ) of 36.8 degrees or more and a full width at half maximum of 1.5 degrees or more.
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公开(公告)号:US10927039B2
公开(公告)日:2021-02-23
申请号:US15651353
申请日:2017-07-17
Applicant: AGC Inc.
Inventor: Izuru Kashima , Yusuke Fujiwara , Kiyoshi Tamai , Yuichi Suzuki , Yoichi Sera , Daisuke Kobayashi
Abstract: An object of the present invention is to provide a chemically strengthened glass that can effectively suppress strength of a glass from being deteriorated even though performing chemical strengthening and has high transmittance (that is, low reflectivity). The present invention relates to a chemically strengthened glass having a compressive stress layer formed on a surface layer thereof by an ion exchange method, in which the glass contains sodium and boron, and has a delta transmittance being +0.1% or more, and in which a straight line obtained by a linear approximation of a hydrogen concentration Y in a region of a depth X from an outermost surface of the glass satisfies a specific relational equation in X=0.1 to 0.4 (μm).
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公开(公告)号:US11703751B2
公开(公告)日:2023-07-18
申请号:US17463724
申请日:2021-09-01
Applicant: AGC INC.
Inventor: Hiroshi Hanekawa , Tsuyoshi Kakuta , Yoichi Sera , Sadatatsu Ikeda
Abstract: A reflective mask blank includes, on/above a substrate in the following order from the substrate side a multilayer reflective film which reflects EUV light and an absorber film which absorbs EUV light. The absorber film is a tantalum-based material film containing a tantalum-based material. The absorber film provides a peak derived from the tantalum-based material in an X-ray diffraction pattern, the peak having a peak diffraction angle (2θ) of 36.8 degrees or more and a full width at half maximum of 1.5 degrees or more.
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公开(公告)号:US10308549B2
公开(公告)日:2019-06-04
申请号:US15000719
申请日:2016-01-19
Applicant: AGC Inc.
Inventor: Izuru Kashima , Yusuke Fujiwara , Kiyoshi Tamai , Yuichi Suzuki , Daisuke Kobayashi , Yoichi Sera , Taku Yamada , Noriko Tanabe
Abstract: A chemically strengthened glass having a compressive stress layer formed in a surface layer thereof according to an ion exchange method, in which a surface of the glass has polishing flaws, the glass has a texture direction index (Stdi) of 0.30 or more, a hydrogen concentration Y in a region to a depth X from an outermost surface of the glass satisfies the following relational equation (I) at X=from 0.1 to 0.4 (μm), and a surface strength F (N) measured by a ball-on-ring test is (F≥1400×t2) relative to a sheet thickness t (mm) of the glass: Y=aX+b (I) in which meanings of respective symbols in the equation (I) are as follows: Y: hydrogen concentration (as H2O, mol/L), X: depth from the outermost surface of the glass (μm), a: −0.300 or more, and b: 0.220 or less.
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