Stacked command queue
    1.
    发明授权

    公开(公告)号:US12073114B2

    公开(公告)日:2024-08-27

    申请号:US17491058

    申请日:2021-09-30

    Abstract: A memory controller includes a command queue with multiple entry stacks, each with a plurality of entries holding memory access commands, one or more parameter indicators each holding a respective characteristic common to the plurality of entries, and a head indicator designating a current entry for arbitration. An arbiter has a single command input for each entry stack. A command queue loader circuit receives incoming memory access commands and loads entries of respective entry stacks with memory access commands having the respective characteristic of each of the one or more parameter indicators in common.

    STACKED COMMAND QUEUE
    2.
    发明申请

    公开(公告)号:US20230102680A1

    公开(公告)日:2023-03-30

    申请号:US17491058

    申请日:2021-09-30

    Abstract: A memory controller includes a command queue with multiple entry stacks, each with a plurality of entries holding memory access commands, one or more parameter indicators each holding a respective characteristic common to the plurality of entries, and a head indicator designating a current entry for arbitration. An arbiter has a single command input for each entry stack. A command queue loader circuit receives incoming memory access commands and loads entries of respective entry stacks with memory access commands having the respective characteristic of each of the one or more parameter indicators in common.

    DYNAMIC RANDOM-ACCESS MEMORY (DRAM) TRAINING ACCELERATION

    公开(公告)号:US20230132306A1

    公开(公告)日:2023-04-27

    申请号:US17506746

    申请日:2021-10-21

    Abstract: A method for performing read training of a memory channel includes writing a data pattern to a memory using a data bus having a predetermined number of bit lanes. An edge of a read data eye is determined individually for each bit lane by reading the data pattern over the data bus using a read bust cycle having a predetermined length, grouping data received on each bit lane over the read burst cycle to form a bit lane data group, and comparing the bit lane data group to corresponding expected data of the data pattern for each bit lane, logging a phase of each bit lane on which said edge is found, and repeating the reading, grouping, comparing, and logging until the edge is found for all of the bit lanes.

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