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公开(公告)号:US20190385825A1
公开(公告)日:2019-12-19
申请号:US16418274
申请日:2019-05-21
Applicant: Applied Materials, Inc.
Inventor: Jian WU , Wei LIU , Theresa Kramer GUARINI , Linlin WANG , Malcolm BEVAN , Lara HAWRYLCHAK
Abstract: Embodiments described herein generally relate to a method and apparatus for fabricating a chamber component for a plasma process chamber. In one embodiment a chamber component used within a plasma processing chamber is provided that includes a metallic base material comprising a roughened non-planar first surface, wherein the roughened non-planar surface has an Ra surface roughness of between 4 micro-inches and 80 micro-inches, a planar silica coating formed over the roughened non-planar surface, wherein the planar silica coating has a surface that has an Ra surface roughness that is less than the Ra surface roughness of the roughened non-planar surface, a thickness between about 0.2 microns and about 10 microns, less than 1% porosity by volume, and contains less than 2E12 atoms/centimeters2 of aluminum.
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公开(公告)号:US20230245863A1
公开(公告)日:2023-08-03
申请号:US18131306
申请日:2023-04-05
Applicant: Applied Materials, Inc.
Inventor: Jian WU , Wei LIU , Theresa Kramer GUARINI , Linlin WANG , Malcolm BEVAN , Lara HAWRYLCHAK
CPC classification number: H01J37/32495 , C23C26/00 , H01J37/32477
Abstract: Embodiments described herein generally relate to a method and apparatus for fabricating a chamber component for a plasma process chamber. In one embodiment a chamber component used within a plasma processing chamber is provided that includes a metallic base material comprising a roughened non-planar first surface, wherein the roughened non-planar surface has an Ra surface roughness of between 4 micro-inches and 80 micro-inches, a planar silica coating formed over the roughened non-planar surface, wherein the planar silica coating has a surface that has an Ra surface roughness that is less than the Ra surface roughness of the roughened non-planar surface, a thickness between about 0.2 microns and about 10 microns, less than 1% porosity by volume, and contains less than 2E12 atoms/centimeters2 of aluminum.
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公开(公告)号:US20230187262A1
公开(公告)日:2023-06-15
申请号:US18106739
申请日:2023-02-07
Applicant: Applied Materials, Inc.
Inventor: Jian WU , Toshiyuki NAKAGAWA , Koji NAKANISHI
IPC: H01L21/687 , H01L21/67 , C23C16/24 , C23C16/50
CPC classification number: H01L21/68757 , H01L21/67115 , C23C16/24 , C23C16/50 , H01L21/68735 , H01L2221/683
Abstract: The present disclosure relates to a support ring for a thermal processing chamber. The support ring has a polysilicon coating. The polysilicon coating is formed using a plasma spray deposition process.
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公开(公告)号:US20190287845A1
公开(公告)日:2019-09-19
申请号:US16294603
申请日:2019-03-06
Applicant: Applied Materials, Inc.
Inventor: Jian WU , Toshiyuki NAKAGAWA , Koji NAKANISHI
IPC: H01L21/687 , H01L21/67 , C23C16/24 , C23C16/50
Abstract: The present disclosure relates to a support ring for a thermal processing chamber. The support ring has a polysilicon coating. The polysilicon coating is formed using a plasma spray deposition process.
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公开(公告)号:US20230295789A1
公开(公告)日:2023-09-21
申请号:US17695475
申请日:2022-03-15
Applicant: Applied Materials, Inc.
Inventor: David JORGENSEN , Jian WU , Abhilash J. MAYUR
Abstract: This application generally relates to a chamber component for a thermal processing chamber comprising a base component having a coating disposed thereon, the coating having a base component having a coating disposed thereon, the coating includes a surface, a thickness, and a plurality of cracks extending from the surface of the coating through at least 40 percent of the thickness of the coating.
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公开(公告)号:US20220013336A1
公开(公告)日:2022-01-13
申请号:US16926104
申请日:2020-07-10
Applicant: Applied Materials, Inc.
Inventor: Jian WU , Lara A. HAWRYLCHAK , Ren-Guan DUAN , Bernard L. HWANG , Malcolm J. BEVAN , Wei LIU
IPC: H01J37/32 , H01L21/683 , B08B7/00
Abstract: A method and apparatus for the use of hydrogen plasma treatments is described herein. The process chamber includes a plurality of chamber components. The plurality of chamber components may be coated with a yttrium zirconium oxide composition, such as a Y2O3—ZrO2 solid solution. Some of the plurality of chamber components are replaced with a bulk yttrium zirconium oxide ceramic. Yet other chamber components are replaced with similar components of different materials.
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公开(公告)号:US20240079252A1
公开(公告)日:2024-03-07
申请号:US17903964
申请日:2022-09-06
Applicant: Applied Materials, Inc.
Inventor: Dongming IU , Jian WU
IPC: H01L21/67
CPC classification number: H01L21/67115 , H01L21/67103 , H01L21/67248
Abstract: A reflector plate assembly for processing a substrate includes a reflector plate having a first surface, wherein the first surface is a bare polished surface, a reflector disk embedded within the reflector plate from the first surface, a coating layer on the reflector disk, and a pyrometer disposed through an opening of the reflector disk.
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