摘要:
A method for finding edge points of an object is disclosed. The method includes receiving an electronic image of an object, selecting one or more edge points in the image of the object, creating an image template for each edge point in the object image. The method further includes receiving a command to measure a second object of the same kind as the object and obtaining a measured object image, reading the image templates for the same kind of object from the storage device, and finding a matched sub-image to each image template from the measured object image according to an image matching algorithm, obtaining a central point of each matched sub-image and displaying coordinates of the central point of the matched sub-image.
摘要:
A computer and a method for generation commands include loading a data exchange format (DXF) image, and selecting a measurement tool and selecting a DXF feature of the DXF image. The generation commands method further includes generating an edge detection command of the selected DXF feature according to the measurement tool when the size of the selected DXF feature is not larger than the size of an image area. And an edge detection command corresponding to each of the reselected measurement tools is generated when the size of the selected DXF feature is larger than the size of the image area.
摘要:
A computer-implemented method for adjusting light intensity of light sources of an image measuring machine in measurement of a surface image of an object includes obtaining the surface image of the object, setting one light source to be adjusted and adjusting a light intensity of the light source according to an adjusting mode. The method further includes computing an optimum light intensity level, adjusting a light intensity to the optimum light intensity level to obtain an optimum surface image of the object, and storing the optimum surface image and the optimum light intensity level into a storage system.
摘要:
A computer-implemented method for adjusting backlight in measurement of a profile image of an object includes setting a light source of an image measuring machine to an original intensity level, obtaining the profile image of the object laid on the image measuring machine, and performing a mean filter processing and a binary image processing on the profile image. The method further includes setting intensity variables to adjust backlight intensity of the light source, uses the intensity variables to calculate an optimum intensity level of the backlight intensity utilizing an iterative method, and adjusting the backlight intensity of the light source to the optimum intensity level to obtain an optimum profile image of the object.
摘要:
A measuring device and method is used to select focusing points on an object. A CCD of the measuring device is positioned at the top of an initial focusing range, then moves to the bottom of the initial focusing range at a first speed to capture first images of the object. Image points corresponding to each focusing point in the first images are identified to compute coordinates of a first focal point of each focusing point. The initial focusing range is updated according to Z-coordinates of the first focal points. The CCD is positioned at the bottom of the updated focusing range, then, moves to the top of the updated focusing range at a second speed to capture second images of the object. Image points corresponding to each focusing point in the second images are identified to compute coordinates of a second focal point of each focusing point.
摘要:
A positioning system and method for focusing a charge coupled device (CCD) lens on a selected surface of an object to be measured is provided. The positioning system and method moves the CCD lens downwards to approximate an estimate Z-axis coordinate of the CCD lens, and moves the CCD lens upwards to find an accurate Z-axis coordinate of the CCD lens according to the selected surface of the object. The system and method further moves the CCD lens to a position corresponding to the accurate Z-axis coordinate to focus the CCD lens on the selected surface.
摘要:
A computer-based method for adjusting luminance of a light-emitting device on image measuring machine is provided. The method includes reading a model definition curve and model coordinates of an object and a charge couple device (CCD). The method further includes locating the object and the CCD to positions on the image measuring machine, and capturing a digital image of the object. Furthermore, the method includes adjusting a resistance of the light-emitting device to ensure an ordinate deviation corresponding to each abscissa value between a new definition curve and the model definition curve falls in an allowable deviation range. A related system is also provided.
摘要:
A computer-implemented method for adjusting light intensity of light sources of an image measuring machine in measurement of a surface image of an object includes obtaining the surface image of the object, setting one light source to be adjusted and adjusting a light intensity of the light source according to an adjusting mode. The method further includes computing an optimum light intensity level, adjusting a light intensity to the optimum light intensity level to obtain an optimum surface image of the object, and storing the optimum surface image and the optimum light intensity level into a storage system.
摘要:
An electronic device includes an image processing system to binarize a gray-scale image to generate a corresponding binary image in the electronic device. Binarization of the gray-scale image by the image processing system includes generation of a binarization array to store binarization threshold values that each corresponds to a pixel of the gray-scale image, and binarization of the gray-scale image according to all binarization threshold values stored in the binarization array.
摘要:
A method for correcting an image of a physical object first captures images of a circle and a rectangle set of a calibration plate placed on a measurement machine, and determines correction data using the images of the circle and the rectangle. The method further corrects the image of the physical object captured by the measurement machine according to the correction data, and displays a corrected image of the physical object.