ELECTRO-CHEMICAL PROCESSOR
    1.
    发明申请
    ELECTRO-CHEMICAL PROCESSOR 有权
    电化学处理器

    公开(公告)号:US20080048306A1

    公开(公告)日:2008-02-28

    申请号:US11467232

    申请日:2006-08-25

    IPC分类号: H01L23/06

    摘要: A processor for making porous silicon or processing other substrates has first and second chamber assemblies. The first and second chamber assemblies include first and second seals for sealing against a wafer, and first and second electrodes, respectively. The second seal is moveable towards and away from a wafer in the processor, to move between a wafer load/unload position, and a wafer process position. The second electrode may move with the second seal. A light source shines light onto the first side of the wafer. The processor may be pivotable from a substantially horizontal orientation, for loading and unloading a wafer, to a substantially vertical orientation, for processing a wafer.

    摘要翻译: 用于制造多孔硅或处理其它衬底的处理器具有第一和第二室组件。 第一和第二室组件包括分别用于密封晶片的第一和第二密封件以及第一和第二电极。 第二密封件可朝向和远离处理器中的晶片移动,以在晶片装载/卸载位置与晶片工艺位置之间移动。 第二电极可以与第二密封件一起移动。 光源将光照射到晶片的第一面上。 处理器可以从用于加载和卸载晶片的基本上水平的方向枢转到基本垂直的取向,用于处理晶片。

    Electro-chemical processor
    2.
    发明授权
    Electro-chemical processor 有权
    电化学处理器

    公开(公告)号:US07935230B2

    公开(公告)日:2011-05-03

    申请号:US11608151

    申请日:2006-12-07

    IPC分类号: C25F7/00

    CPC分类号: C25D17/001 C25D17/004

    摘要: A processor for making porous silicon or processing other substrates has first and second chamber assemblies. The first and second chamber assemblies include first and second seals for sealing against a wafer, and first and second electrodes, respectively. The first and/or second seal is moveable towards and away from a wafer in the processor, to move between a wafer load/unload position, and a wafer process position. The first electrode may move along with the first seal, and the second electrode may move along with the second seal. A light source shines light onto the first side of the wafer. The processor may be pivotable from a substantially horizontal orientation, for loading and unloading a wafer, to a substantially vertical orientation, for processing a wafer.

    摘要翻译: 用于制造多孔硅或处理其它衬底的处理器具有第一和第二室组件。 第一和第二室组件包括分别用于密封晶片的第一和第二密封件以及第一和第二电极。 第一和/或第二密封件可朝向和远离处理器中的晶片移动,以在晶片装载/卸载位置与晶片工艺位置之间移动。 第一电极可以与第一密封件一起移动,并且第二电极可以与第二密封件一起移动。 光源将光照射到晶片的第一面上。 处理器可以从用于加载和卸载晶片的基本上水平的方向枢转到基本垂直的取向,用于处理晶片。

    Electro-chemical processor
    3.
    发明授权
    Electro-chemical processor 有权
    电化学处理器

    公开(公告)号:US07927469B2

    公开(公告)日:2011-04-19

    申请号:US11467232

    申请日:2006-08-25

    IPC分类号: C25F7/00

    摘要: A processor for making porous silicon or processing other substrates has first and second chamber assemblies. The first and second chamber assemblies include first and second seals for sealing against a wafer, and first and second electrodes, respectively. The second seal is moveable towards and away from a wafer in the processor, to move between a wafer load/unload position, and a wafer process position. The second electrode may move with the second seal. A light source shines light onto the first side of the wafer. The processor may be pivotable from a substantially horizontal orientation, for loading and unloading a wafer, to a substantially vertical orientation, for processing a wafer.

    摘要翻译: 用于制造多孔硅或处理其它衬底的处理器具有第一和第二室组件。 第一和第二室组件包括分别用于密封晶片的第一和第二密封件以及第一和第二电极。 第二密封件可朝向和远离处理器中的晶片移动,以在晶片装载/卸载位置与晶片工艺位置之间移动。 第二电极可以与第二密封件一起移动。 光源将光照射到晶片的第一面上。 处理器可以从用于加载和卸载晶片的基本上水平的方向枢转到基本垂直的取向,用于处理晶片。

    ELECTRO-CHEMICAL PROCESSOR
    4.
    发明申请
    ELECTRO-CHEMICAL PROCESSOR 有权
    电化学处理器

    公开(公告)号:US20080003781A1

    公开(公告)日:2008-01-03

    申请号:US11608151

    申请日:2006-12-07

    IPC分类号: H01L21/326

    CPC分类号: C25D17/001 C25D17/004

    摘要: A processor for making porous silicon or processing other substrates has first and second chamber assemblies. The first and second chamber assemblies include first and second seals for sealing against a wafer, and first and second electrodes, respectively. The first and/or second seal is moveable towards and away from a wafer in the processor, to move between a wafer load/unload position, and a wafer process position. The first electrode may move along with the first seal, and the second electrode may move along with the second seal. A light source shines light onto the first side of the wafer. The processor may be pivotable from a substantially horizontal orientation, for loading and unloading a wafer, to a substantially vertical orientation, for processing a wafer.

    摘要翻译: 用于制造多孔硅或处理其它衬底的处理器具有第一和第二室组件。 第一和第二室组件包括分别用于密封晶片的第一和第二密封件以及第一和第二电极。 第一和/或第二密封件可朝向和远离处理器中的晶片移动,以在晶片装载/卸载位置与晶片工艺位置之间移动。 第一电极可以与第一密封件一起移动,并且第二电极可以与第二密封件一起移动。 光源将光照射到晶片的第一面上。 处理器可以从用于加载和卸载晶片的基本上水平的方向枢转到基本垂直的取向,用于处理晶片。

    Electro-chemical processor
    5.
    发明授权
    Electro-chemical processor 失效
    电化学处理器

    公开(公告)号:US07909967B2

    公开(公告)日:2011-03-22

    申请号:US11457192

    申请日:2006-07-13

    IPC分类号: C25F7/00

    CPC分类号: C25F7/00

    摘要: An electro-chemical processor for making porous silicon or processing other substrates has first and second chamber assemblies. The first and second chamber assemblies include first and second seals for sealing against a wafer, and first and second electrodes, respectively. The first seal is moveable towards and away from a wafer in the processor, to move between a wafer load/unload position, and a wafer process position. The first electrode may move along with the first seal. The processor may be pivotable from a substantially horizontal orientation, for loading and unloading a wafer, to a substantially vertical orientation, for processing a wafer.

    摘要翻译: 用于制造多孔硅或处理其它衬底的电化学处理器具有第一和第二室组件。 第一和第二室组件包括分别用于密封晶片的第一和第二密封件以及第一和第二电极。 第一密封件可朝向和远离处理器中的晶片移动,以在晶片装载/卸载位置与晶片工艺位置之间移动。 第一电极可以与第一密封件一起移动。 处理器可以从用于加载和卸载晶片的基本上水平的方向枢转到基本垂直的取向,用于处理晶片。

    ELECTRO-CHEMICAL PROCESSOR
    6.
    发明申请
    ELECTRO-CHEMICAL PROCESSOR 失效
    电化学处理器

    公开(公告)号:US20100078334A1

    公开(公告)日:2010-04-01

    申请号:US11457192

    申请日:2006-07-13

    CPC分类号: C25F7/00

    摘要: An electro-chemical processor for making porous silicon or processing other substrates has first and second chamber assemblies. The first and second chamber assemblies include first and second seals for sealing against a wafer, and first and second electrodes, respectively. The first seal is moveable towards and away from a wafer in the processor, to move between a wafer load/unload position, and a wafer process position. The first electrode may move along with the first seal. The processor may be pivotable from a substantially horizontal orientation, for loading and unloading a wafer, to a substantially vertical orientation, for processing a wafer.

    摘要翻译: 用于制造多孔硅或处理其它衬底的电化学处理器具有第一和第二室组件。 第一和第二室组件包括分别用于密封晶片的第一和第二密封件以及第一和第二电极。 第一密封件可朝向和远离处理器中的晶片移动,以在晶片装载/卸载位置与晶片工艺位置之间移动。 第一电极可以与第一密封件一起移动。 处理器可以从用于加载和卸载晶片的基本上水平的方向枢转到基本垂直的取向,用于处理晶片。

    Method and apparatus for controlling vessel characteristics, including shape and thieving current for processing microfeature workpieces
    8.
    发明授权
    Method and apparatus for controlling vessel characteristics, including shape and thieving current for processing microfeature workpieces 有权
    用于控制容器特性的方法和装置,包括加工微型工件的形状和盗窃电流

    公开(公告)号:US07857958B2

    公开(公告)日:2010-12-28

    申请号:US11776918

    申请日:2007-07-12

    IPC分类号: C25D5/00 C25D21/12

    摘要: A method and apparatus for processing a microfeature workpiece. In one embodiment, the apparatus includes a support member configured to carry a microfeature workpiece at a workpiece plane, and a vessel positioned at least proximate to the support member. The vessel has a vessel surface facing toward the support member and positioned to carry a processing liquid. The vessel surface is shaped to provide an at least approximately uniform current density at the workpiece plane. At least one electrode, such as a thieving electrode, is disposed within the vessel. In a further aspect of this embodiment, the thieving electrode can be easily removable along with conductive material it attracts from the processing liquid. The shape of the vessel surface, the current supplied to the thieving electrode and/or the diameter of an aperture upstream of the workpiece are changed dynamically in other embodiments.

    摘要翻译: 一种用于处理微特征工件的方法和装置。 在一个实施例中,该装置包括构造成在工件平面处承载微特征工件的支撑构件和至少靠近支撑构件定位的容器。 容器具有面向支撑构件的容器表面并且定位成承载处理液体。 容器表面成形为在工件平面处提供至少近似均匀的电流密度。 至少一个电极,例如电极,设置在容器内。 在该实施例的另一方面,该窃电电极可以容易地从其从处理液体吸引的导电材料移除。 在其他实施例中,容器表面的形状,提供给电极的电流和/或工件上游的孔的直径被动态地改变。

    Method and apparatus for controlling vessel characteristics, including shape and thieving current for processing microfeature workpieces
    9.
    发明授权
    Method and apparatus for controlling vessel characteristics, including shape and thieving current for processing microfeature workpieces 有权
    用于控制容器特性的方法和装置,包括加工微型工件的形状和盗窃电流

    公开(公告)号:US07247223B2

    公开(公告)日:2007-07-24

    申请号:US10426029

    申请日:2003-04-28

    IPC分类号: C25D17/02 C25D7/12

    摘要: A method and apparatus for processing a microfeature workpiece. In one embodiment, the apparatus includes a support member configured to carry a microfeature workpiece at a workpiece plane, and a vessel positioned at least proximate to the support member. The vessel has a vessel surface facing toward the support member and positioned to carry a processing liquid. The vessel surface is shaped to provide an at least approximately uniform current density at the workpiece plane. At least one electrode, such as a thieving electrode, is disposed within the vessel. In a further aspect of this embodiment, the thieving electrode can be easily removable along with conductive material it attracts from the processing liquid. The shape of the vessel surface, the current supplied to the thieving electrode and/or the diameter of an aperture upstream of the workpiece are changed dynamically in other embodiments.

    摘要翻译: 一种用于处理微特征工件的方法和装置。 在一个实施例中,该装置包括构造成在工件平面处承载微特征工件的支撑构件和至少靠近支撑构件定位的容器。 容器具有面向支撑构件的容器表面并且定位成承载处理液体。 容器表面成形为在工件平面处提供至少近似均匀的电流密度。 至少一个电极,例如电极,设置在容器内。 在该实施例的另一方面,该窃电电极可以容易地从其从处理液体吸引的导电材料移除。 在其他实施例中,容器表面的形状,提供给电极的电流和/或工件上游的孔的直径被动态地改变。

    Workpiece processor having processing chamber with improved processing fluid flow

    公开(公告)号:US06569297B2

    公开(公告)日:2003-05-27

    申请号:US09804696

    申请日:2001-03-12

    IPC分类号: C25D1700

    摘要: A processing container (610) for providing a flow of a processing fluid during immersion processing of at least one surface of a microelectronic workpiece is set forth. The processing container comprises a principal fluid flow chamber (505) providing a flow of processing fluid to at least one surface of the workpiece and a plurality of nozzles (535) disposed to provide a flow of processing fluid to the principal fluid flow chamber. The plurality of nozzles are arranged and directed to provide vertical and radial fluid flow components that combine to generate a substantially uniform normal flow component radially across the surface of the workpiece. An exemplary apparatus using such a processing container is also set forth that is particularly adapted to carry out an electroplating process. In accordance with a further aspect of the present disclosure, an improved fluid removal path (640) is provided for removing fluid from a principal fluid flow chamber during immersion processing of a microelectronic workpiece.