摘要:
Aspects of the present invention provide solutions for projecting slack in an integrated circuit. A statistical static timing analysis (SSTA) is computed to get a set of Gaussian distributions over a plurality of variation sources in the integrated circuit. Based on the Gaussian distributions, a truncated subset and a remainder subset of the Gaussian distributions are identified. Then data factors that represent a ratio between the remainder subset and the truncated subset are obtained. These data factors are applied to the SSTA to root sum square (RSS) project the slack for the integrated circuit that takes into account the absence of the truncated subset.
摘要:
Aspects of the present invention provide solutions for projecting slack in an integrated circuit. A statistical static timing analysis (SSTA) is computed to get a set of Gaussian distributions over a plurality of variation sources in the integrated circuit. Based on the Gaussian distributions, a truncated subset and a remainder subset of the Gaussian distributions are identified. Then data factors that represent a ratio between the remainder subset and the truncated subset are obtained. These data factors are applied to the SSTA to root sum square (RSS) project the slack for the integrated circuit that takes into account the absence of the truncated subset.
摘要:
Systems and methods for statistical clock cycle computation and closing timing of an integrated circuit design to a maximum clock cycle or period. The method includes loading a design and timing model for at least one circuit path of an integrated circuit or a region of the integrated circuit into a computing device. The method further includes performing a statistical static timing analysis (SSTA) of the at least one circuit path using the loaded design and timing model to obtain slack canonical data. The method further includes calculating a maximum circuit clock cycle for the integrated circuit or the specified region of the integrated circuit in linear canonical form based upon the slack canonical data obtained from the SSTA.
摘要:
Disclosed is a computer-implemented method for designing a chip to optimize yielding parts in different bins as a function of multiple diverse metrics and further to maximize the profit potential of the resulting chip bins. The method separately calculates joint probability distributions (JPD), each JPD being a function of a different metric (e.g., performance, power consumption, etc.). Based on the JPDs, corresponding yield curves are generated. A profit function then reduces the values of all of these metrics (e.g., performance values, power consumption values, etc.) to a common profit denominator (e.g., to monetary values indicating profit that may be associated with a given metric value). The profit function and, more particularly, the monetary values can be used to combine the various yield curves into a combined profit-based yield curve from which a profit model can be generated. Based on this profit model, changes to the chip design can be made in order to optimize yield as a function of all of the diverse metrics (e.g., performance, power consumption, etc.) and further to maximize the profit potential of the resulting chips.
摘要:
Disclosed is a computer-implemented method for designing a chip to optimize yielding parts in different bins as a function of multiple diverse metrics and further to maximize the profit potential of the resulting chip bins. The method separately calculates joint probability distributions (JPD), each JPD being a function of a different metric (e.g., performance, power consumption, etc.). Based on the JPDs, corresponding yield curves are generated. A profit function then reduces the values of all of these metrics (e.g., performance values, power consumption values, etc.) to a common profit denominator (e.g., to monetary values indicating profit that may be associated with a given metric value). The profit function and, more particularly, the monetary values can be used to combine the various yield curves into a combined profit-based yield curve from which a profit model can be generated. Based on this profit model, changes to the chip design can be made in order to optimize yield as a function of all of the diverse metrics (e.g., performance, power consumption, etc.) and further to maximize the profit potential of the resulting chips.
摘要:
Methods for analyzing timing of an integrated circuit using block-based static statistical timing analysis and for practical worst test definition and debug. The method includes building a timing graph, determining a slack for each of the nodes in the timing graph, and identifying a statistically worst slack for at least one of the nodes. The method further includes replacing this statistically worst slack with a proxy worst slack.
摘要:
Methods for analyzing timing of an integrated circuit using block-based static statistical timing analysis and for practical worst test definition and debug. The method includes building a timing graph, determining a slack for each of the nodes in the timing graph, and identifying a statistically worst slack for at least one of the nodes. The method further includes replacing this statistically worst slack with a proxy worst slack.
摘要:
A logical design including multiple logical blocks is mapped onto an integrated circuit chip. A chip level floor plan is created on the chip, including temporary areas on the chip set aside for accommodating logical blocks having logical content including timing requirements based on the logical design. The temporary areas are translated into physical cells on the chip with pins assigned for inputs and outputs for the logical blocks. The logical blocks are mapped to the physical cells on the chip in a time sensitive manner using timing assertions to form temporary logical partitions. Blocks on the chip, including the temporary logical partitions, are connected based on the timing assertions. A timing analysis is performed on the chip to determine timing slack associated with each temporary logical partition. A determination is made whether the timing slack is acceptable. If the timing slack is not acceptable, the slack is apportioned for, and apportioned slack information is fed back in the form of timing assertions. Mapping, connecting, performing a timing analysis, and apportioning for slack are repeated until the timing slack associated with each temporary logical partition is determined to be acceptable.
摘要:
A method and system for enhancing processing efficiency in a data processing system which includes multiple scalar instruction processors and a vector instruction processor. An ordered sequence of intermixed scalar and vector instructions is processed in a nonsequential order by coupling those instructions to selected processors. As each instruction is finished an indication of that state is stored within a finish instruction array. The first vector instruction within the ordered sequence is initiated within the vector instruction processor only after an indication that each scalar instruction preceding the first vector instruction is finished. A vector advance signal is generated by the vector instruction processor each time processing of a vector instruction is initiated. A subsequent vector instruction is then initiated when the vector processor assets are available only in response to the presence of the vector advance signal and an indication that all scalar instructions which proceed the subsequent vector instruction within the ordered sequence have finished, without encountering an exception. In this manner, chained processing of vector instructions may be accomplished by initiating processing of a subsequent vector instruction only after possible interruption by a scalar instruction exception is no longer possible.
摘要:
Run-time reduction is achieved in timing performance of a logical design, such as a digital integrated circuit. A portion of the logical design that is expected to be stable with respect to timing performance, such as a clock tree, is identified. Timing sensitivities, including sensitivities to sources of variability, of the identified portion of the logical design are determined at a given instant. The timing sensitivities of the identified portion of the logical design are saved for re-use. The saved timing sensitivities are re-used throughout the timing analysis and in subsequent timing analyses.