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    DETERMINATION METHOD
    2.
    发明申请
    DETERMINATION METHOD 有权

    公开(公告)号：US20210174506A1

    公开(公告)日：2021-06-10

    申请号：US17181651

    申请日：2021-02-22

    Applicant: FUJIFILM Corporation

    Inventor： Sohichiro NAKAMURA ,  Ryusuke OSAKI ,  Sho ONOZAWA

    IPC: G06T7/00 ,  C12N5/071

    Abstract: A determination method of non-destructively and easily determining a state of an aggregate of a plurality of cells formed by three-dimensional culture is provided. A determination method according to the disclosed technology includes generating a phase difference image of an aggregate of a plurality of cells from a hologram obtained by imaging the aggregate, deriving a phase difference amount density by dividing a total phase difference amount that is a value obtained by integrating a phase difference amount of each of a plurality of pixels constituting the phase difference image by a volume of the aggregate, and determining a state of the aggregate on the basis of a time transition of the phase difference amount density.

    LIGHT SCATTERING MEASUREMENT DEVICE AND LIGHT SCATTERING MEASUREMENT METHOD
    4.
    发明公开
    LIGHT SCATTERING MEASUREMENT DEVICE AND LIGHT SCATTERING MEASUREMENT METHOD 审中-公开

    公开(公告)号：US20240077399A1

    公开(公告)日：2024-03-07

    申请号：US18509253

    申请日：2023-11-14

    Applicant: FUJIFILM Corporation

    Inventor： Sohichiro NAKAMURA ,  Kenichi HAMADA

    IPC: G01N15/02

    CPC classification number: G01N15/0205

    Abstract: Provided are a light scattering measurement device and a light scattering measurement method that specify a material of a particle included in a dispersion liquid including at least one type of particles. The light scattering measurement device includes a light source unit that irradiates the dispersion liquid including at least one type of particles with measurement light, a parameter setting unit that sets at least one of a scattering angle or a measurement wavelength as a measurement parameter, a scattered light measurement unit that obtains a plurality of pieces of scattering intensity data by measuring a scattering intensity of scattered light emitted from the dispersion liquid by the measurement light a plurality of times while changing a value of the measurement parameter a plurality of times, and a calculation unit that calculates scattering intensity time variation characteristic data and scattering intensity parameter-dependent data from the scattering intensity data, and specifies a material of each type of particle of the particles of the dispersion liquid specified by fitting the scattering intensity time variation characteristic data and the scattering intensity parameter-dependent data using a theoretical formula or a simulation based on a theory of electromagnetic wave behavior that defines a relationship of a refractive index, a particle diameter, and the scattering intensity.

    OPTICAL MEASUREMENT DEVICE
    6.
    发明公开
    OPTICAL MEASUREMENT DEVICE 审中-公开

    公开(公告)号：US20230375453A1

    公开(公告)日：2023-11-23

    申请号：US18361895

    申请日：2023-07-30

    Applicant: FUJIFILM Corporation

    Inventor： Sohichiro NAKAMURA ,  Kenichi HAMADA

    IPC: G01N15/02

    CPC classification number: G01N15/0205

    Abstract: Provided is an optical measurement device capable of easily measuring a scattering intensity at different scattering angles or different wavelengths. An optical measurement device with a low-coherence interferometer includes a detection unit having at least one of a first detection unit that detects an interference light intensity per wavelength by means of interference between at least a part of scattered light obtained by allowing incident light to be incident on a dispersion liquid including particles and reference light or a second detection unit that detects an interference light intensity per scattering angle by means of interference between at least a part of the scattered light obtained by allowing the incident light to be incident on the dispersion liquid including the particles and the reference light, and a conversion unit extracts a scattering intensity at a specific depth and a specific wavelength of the dispersion liquid from data of the interference light intensity per wavelength detected by the first detection unit or a scattering intensity at a specific depth and a specific scattering angle of the dispersion liquid from data of the interference light intensity per scattering angle detected by the second detection unit and converts data of the extracted scattering intensity into time fluctuation data of the scattered light at the specific depth of the dispersion liquid.

    DETERMINATION METHOD
    7.
    发明申请
    DETERMINATION METHOD 有权

    公开(公告)号：US20210174507A1

    公开(公告)日：2021-06-10

    申请号：US17182569

    申请日：2021-02-23

    Applicant: FUJIFILM Corporation

    Inventor： Sohichiro NAKAMURA ,  Sho ONOZAWA ,  Ryusuke OSAKI

    IPC: G06T7/00 ,  G06F17/18 ,  G01N21/45 ,  C12Q1/02 ,  G06T7/62

    Abstract: A determination method of non-destructively and easily determining a state of an aggregate of a plurality of cells formed by three-dimensional culture is provided. A determination method according to the disclosed technology includes generating a phase difference image of an aggregate of a plurality of cells from a hologram obtained by imaging the aggregate, deriving a first index value that indicates a randomness of an array of a phase difference amount in a plurality of pixels constituting the phase difference image, and determining a state of the cells constituting the aggregate on the basis of the first index value.

    IMAGING METHOD AND IMAGING DEVICE
    8.
    发明公开
    IMAGING METHOD AND IMAGING DEVICE 审中-公开

    公开(公告)号：US20230353888A1

    公开(公告)日：2023-11-02

    申请号：US18348311

    申请日：2023-07-06

    Applicant: FUJIFILM Corporation

    Inventor： Masayuki NAYA ,  Ryusuke OSAKI ,  Sohichiro NAKAMURA

    IPC: H04N23/95 ,  H04N23/56 ,  G02B26/08

    CPC classification number: H04N23/95 ,  H04N23/56 ,  G02B26/0833

    Abstract: Pixels of a mask image with which a target object is irradiated are shifted by a determined distance by sequentially turning on one light emission point or two or more light emission points of a light source with respect to a single mask pattern generated in a spatial modulation element, a pixel shift amount of the mask pattern determined by a position of the light emission point to be turned on of the light source is known, the target object is irradiated with mask images according to a plurality of mask patterns depending on the positions of the light emission point of the light source and the spatial modulation element, and a computer calculates a correlation between a light intensity detected by a detector and the mask image with which the target object is irradiated, to construct an image of the target object. With this, an imaging device and an imaging method capable of achieving an increase in speed of mask pattern irradiation in single-pixel imaging and significantly increasing an input speed of single-pixel imaging are provided.

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