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1.发明授权公开(公告)号：US11513140B2
公开(公告)日：2022-11-29
申请号：US17169113
申请日：2021-02-05
Applicant: Fluke Corporation
Inventor： Ginger M. Woo , Gloria M. Chun , Ricardo Rodriguez
Abstract: A sensor probe includes a body, a sleeve that is moveable along the body between open and closed positions, a clamp having first and second jaws that contain an interior region within the clamp, and a non-contact sensor coupled to the sleeve and positioned at or near a perimeter of the interior region within the clamp. When the sleeve is in the open position, the first and second jaws create a gap that allows an insulated conductor to pass into the interior region within the clamp. When the sleeve is in the closed position, the first and second jaws close the gap and thereby close the interior region within the clamp. The size of the interior region is reduced when the sleeve is moved toward the closed position. The non-contact sensor is configured to detect an electrical parameter of the insulated conductor without requiring galvanic contact with the conductor.
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公开(公告)号：US11209480B2
公开(公告)日：2021-12-28
申请号：US17018931
申请日：2020-09-11
Applicant: Fluke Corporation
Inventor： Ronald Steuer , Ricardo Rodriguez
IPC: G01R31/302 , G01R31/28
Abstract: Systems and methods for measuring DC voltage of an insulated conductor (e.g., insulated wire) are provided, without requiring a galvanic connection between the conductor and a test electrode or probe. A non-contact DC voltage measurement device may include a conductive sensor that is mechanically oscillated. The device may also include a conductive internal ground guard that is galvanically isolated from the conductive sensor, and a conductive reference shield that is galvanically insulated from the internal ground guard. The device may further include a common mode reference voltage source that generates an alternating current (AC) reference voltage, and a sensor signal measurement subsystem electrically coupled to the conductive sensor. Control circuitry may receive a sensor current signal from the sensor signal measurement subsystem, and determine the DC voltage in the insulated conductor based at least in part on the received sensor current signal.
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公开(公告)号：US10352967B2
公开(公告)日：2019-07-16
申请号：US15625745
申请日：2017-06-16
Applicant: Fluke Corporation
Inventor： Ronald Steuer , Peter Radda , Ricardo Rodriguez , David L. Epperson , Patrick Scott Hunter , Paul Andrew Ringsrud , Clark N. Huber , Christian Karl Schmitzer , Jeffrey Worones , Michael F. Gallavan
Abstract: Systems and methods provide measurement of alternating current (AC) electrical parameters in an insulated wire without requiring a galvanic connection between the insulated wire and a test probe. Measurement systems or instruments may include a housing that includes both a non-contact voltage sensor and a non-contact current sensor. The measurement system obtains measurements from the voltage sensor and the current sensor during a measurement time interval and processes the measurements to determine AC electrical parameters of the insulated wire. The AC electrical parameters may be presented to an operator via a visual indicator device (e.g., display, lights). The AC electrical parameters may additionally or alternatively be communicated to an external device via a wired and/or wireless communications interface. The measurement system may include an alignment feedback sensor that provides feedback to a user regarding the mechanical alignment of the insulated wire relative to the voltage sensor and the current sensor.
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公开(公告)号：US20180136259A1
公开(公告)日：2018-05-17
申请号：US15695998
申请日：2017-09-05
Applicant: Fluke Corporation
Inventor： David L. Epperson , Ronald Steuer , Jeffrey Worones , Patrick Scott Hunter , Ricardo Rodriguez
IPC: G01R15/16 , G01R15/20 , G01R19/165 , G01R19/28
CPC classification number: G01R15/16 , G01R1/22 , G01R15/14 , G01R15/142 , G01R15/20 , G01R19/00 , G01R19/165 , G01R19/28
Abstract: Systems and methods for measuring alternating current (AC) voltage of an insulated conductor are provided, without requiring a galvanic connection between the conductor and a test electrode. A non-galvanic contact voltage measurement device includes a conductive sensor, an internal ground guard, and a reference shield. A reference voltage source is electrically coupleable between the guard and the reference shield to generate an AC reference voltage which causes a reference current to pass through the conductive sensor. Sensor subsystems may be arranged in layers (e.g., stacked layers, nested layers, or components) of conductors and insulators. The sensor subsystems may be packaged as formed sheets, flexible circuits, integrated circuit (IC) chips, nested components, printed circuit boards (PCBs), etc. The sensor subsystems may be electrically coupled to suitable processing or control circuity of a non-contact voltage measurement device to allow for measurement of voltages in insulated conductors.
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公开(公告)号：US20230251289A1
公开(公告)日：2023-08-10
申请号：US18303397
申请日：2023-04-19
Applicant: Fluke Corporation
Inventor： Ginger M. Woo , Gloria M. Chun , Ricardo Rodriguez , Ronald Steuer
IPC: G01R15/18
CPC classification number: G01R15/181 , H04Q9/00
Abstract: A sensor probe includes a body having first and second channels that are spaced apart and extend through the body approximately parallel to each other. A first end of a Rogowski coil is fixed within the first channel. The Rogowski coil passes through the second channel and loops back to the first channel where a second end of the Rogowski coil is selectively insertable into the first channel opposite the first end of the Rogowski coil. A non-contact sensor coupled to the body is positioned between the first and second channels to measure a parameter of an insulated conductor situated within the loop formed by the Rogowski coil. The size of an interior region within the loop is selectively adjustable by sliding movement of the Rogowski coil within the second channel.
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Patent Agency Ranking
6.发明申请公开(公告)号：US20210239741A1
公开(公告)日：2021-08-05
申请号：US17169113
申请日：2021-02-05
Applicant: Fluke Corporation
Inventor： Ginger M. Woo , Gloria M. Chun , Ricardo Rodriguez
Abstract: A sensor probe includes a body, a sleeve that is moveable along the body between open and closed positions, a clamp having first and second jaws that contain an interior region within the clamp, and a non-contact sensor coupled to the sleeve and positioned at or near a perimeter of the interior region within the clamp. When the sleeve is in the open position, the first and second jaws create a gap that allows an insulated conductor to pass into the interior region within the clamp. When the sleeve is in the closed position, the first and second jaws close the gap and thereby close the interior region within the clamp. The size of the interior region is reduced when the sleeve is moved toward the closed position. The non-contact sensor is configured to detect an electrical parameter of the insulated conductor without requiring galvanic contact with the conductor.
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公开(公告)号：US09933459B1
公开(公告)日：2018-04-03
申请号：US15400152
申请日：2017-01-06
Applicant: Fluke Corporation
Inventor： David L. Epperson , Jeffrey Worones , Ricardo Rodriguez
CPC classification number: G01R15/125 , G01B3/008 , G01R1/06705
Abstract: Systems and methods of providing a magnetically coupled ground reference probe for use with test equipment, such as digital multimeters (DMMs). The magnetically coupled ground reference probes disclosed herein may be used instead of a typical test probe or alligator clip. A magnetically coupled ground reference probe may be provided which includes an insulative housing surrounding a conductive magnet such as a permanent magnet or an electromagnet. The magnet may autonomously retract into a cavity of the insulative housing when not coupled to a ground reference so that the magnet does not contact a high potential source when being handled by the operator. In at least some implementations, at least a portion of the insulation material of the housing may be compressible to allow the magnet to come into physical contact with a ground reference surface while providing a sufficient creepage and clearance path.
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公开(公告)号：US09651606B2
公开(公告)日：2017-05-16
申请号：US14306094
申请日：2014-06-16
Applicant: Fluke Corporation
Inventor： Matthew B. Marzynski , Ricardo Rodriguez
CPC classification number: G01R31/245 , G01R31/44
Abstract: A fluorescent lamp testing device 10 has a microcontroller 100 that controls tests for ballast discrimination as well as gas integrity, ballast operation, filament continuity and line voltage. The ballast discrimination test is performed by the microcontroller 100 in combination with a photodiode 30 and high/low pass filter 32. Gas integrity is tested with pulse width modulation and a high-voltage, step-up transformer (PWM/T) circuit 42 and an antenna 40. A built in continuity tester has input pins 52, 54 to test the continuity of the filaments in the fluorescent lamp 12. The antenna 40 and a voltage-divider/voltage-sensor connected to the secondary coil in the transformer test for ballast operation. A PCB conductive loop 18, rectifier 20 and op amp 22 test for line voltage.
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公开(公告)号：US10746767B2
公开(公告)日：2020-08-18
申请号：US15975187
申请日：2018-05-09
Applicant: Fluke Corporation
Inventor： Jeffrey Worones , Ronald Steuer , Ricardo Rodriguez
Abstract: Systems and methods are provided for measuring electrical parameters in an insulated conductor without requiring a galvanic connection. A non-contact, electrical parameter sensor probe may be operative to measure both current and voltage in an insulated conductor. The sensor probe includes a body, a Rogowski coil coupled to the body, and a non-contact voltage sensor coupled to the body or the Rogowski coil. The size of the loop of the Rogowski coil is selectively adjustable, such that the loop may be tightened around the conductor under test until the conductor is positioned adjacent a portion of the body or Rogowski coil that includes the non-contact voltage sensor. Measured electrical parameters may be provided to a user, e.g., via a display, or may be transmitted to one or more external systems via a suitable wired or wireless connection.
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公开(公告)号：US10605832B2
公开(公告)日：2020-03-31
申请号：US15695998
申请日：2017-09-05
Applicant: Fluke Corporation
Inventor： David L. Epperson , Ronald Steuer , Jeffrey Worones , Patrick Scott Hunter , Ricardo Rodriguez
Abstract: Systems and methods for measuring alternating current (AC) voltage of an insulated conductor are provided, without requiring a galvanic connection between the conductor and a test electrode. A non-galvanic contact voltage measurement device includes a conductive sensor, an internal ground guard, and a reference shield. A reference voltage source is electrically coupleable between the guard and the reference shield to generate an AC reference voltage which causes a reference current to pass through the conductive sensor. Sensor subsystems may be arranged in layers (e.g., stacked layers, nested layers, or components) of conductors and insulators. The sensor subsystems may be packaged as formed sheets, flexible circuits, integrated circuit (IC) chips, nested components, printed circuit boards (PCBs), etc. The sensor subsystems may be electrically coupled to suitable processing or control circuitry of a non-contact voltage measurement device to allow for measurement of voltages in insulated conductors.
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