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公开(公告)号：US20140178853A1
公开(公告)日：2014-06-26
申请号：US13725091
申请日：2012-12-21
Applicant: GENERAL ELECTRIC COMPANY
Inventor： Daniel Scott Groninger , Robert Carroll Ward , Francois Xavier de Fromont , Chad Martin Shaffer
IPC: G09B5/00
Abstract: A testing system for use in conducting testing of a structure, and a method for configuring a testing system are provided. The testing system includes a testing device that includes a presentation interface, a user input interface, a memory device and a processor coupled in communication with the presentation interface, the user input interface, and the memory device. The processor causes the testing device to present to a user, prior to a test session, at least one demonstrative instruction for conducting a test session using the testing device, and at least one test instruction for use while the user is conducting a test session using the device.
Abstract translation: 提供了一种用于进行结构测试的测试系统和一种用于配置测试系统的方法。 测试系统包括测试设备，该测试设备包括呈现界面，用户输入接口，存储设备和与显示界面，用户输入接口和存储设备通信耦合的处理器。 处理器使得测试设备在测试会话之前呈现给用户至少一个用于使用测试设备进行测试会话的演示指令，以及至少一个用于在用户正在进行测试会话期间使用的测试指令 装置。
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公开(公告)号：US20170089694A1
公开(公告)日：2017-03-30
申请号：US14865533
申请日：2015-09-25
Applicant: General Electric Company
Inventor： Daniel Scott Groninger
CPC classification number: G01B21/00 , G01N27/90 , G01N27/9006 , G01N29/0609 , G01N29/0645 , G01N29/22 , G01N29/265
Abstract: An inspection system, in an embodiment, can be operable with a probe and a position tracker to inspect an object. The system can be operable to display at least one probe travel axis, receive first and second inspection values from the probe, associate the first inspection value with a first position point, and associate the second inspection value with a second position point. The system displays an inspection path based on the associations. The inspection path extends relative to the probe travel axis.
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Patent Agency Ranking
公开(公告)号：US09465008B2
公开(公告)日：2016-10-11
申请号：US14304180
申请日：2014-06-13
Applicant: General Electric Company
Inventor： Daniel Scott Groninger , Soundarrajan Kaliaperumal , Galen Lee Swyers , David George Perrett
CPC classification number: G01N27/9086 , G01B7/105 , G01N27/9046
Abstract: A method and system for dynamically adjusting a gain of an eddy current device are provided. The method includes providing calibration information to the eddy current device using a probe and switching between a first mode and a second mode of the eddy current device, the first mode exciting only a first coil to measure liftoff of the probe from a surface of a workpiece, the second mode exciting the first coil and a second coil to measure dimensions of a flaw within a workpiece. The method also includes determining a thickness of a non-conductive coating covering at least a portion of the workpiece using the first coil, adjusting a gain setting of the eddy current device based on the determined thickness and the calibration information, and determining dimensions of the flaw using the first and second coils and the adjusted gain setting.
Abstract translation: 提供了用于动态调节涡流装置的增益的方法和系统。 该方法包括使用探头向涡流装置提供校准信息，并且在涡流装置的第一模式和第二模式之间切换，第一模式仅激励第一线圈以测量探头从工件表面起飞 激励第一线圈的第二模式和用于测量工件内的缺陷的尺寸的第二线圈。 该方法还包括使用第一线圈确定覆盖工件的至少一部分的非导电涂层的厚度，基于所确定的厚度和校准信息来调整涡流装置的增益设置，以及确定 使用第一和第二线圈的缺陷和调整的增益设置。
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公开(公告)号：US09881510B2
公开(公告)日：2018-01-30
申请号：US13725091
申请日：2012-12-21
Applicant: General Electric Company
Inventor： Daniel Scott Groninger , Robert Carroll Ward , Francois Xavier de Fromont , Chad Martin Shaffer
Abstract: A testing system for use in conducting testing of a structure, and a method for configuring a testing system are provided. The testing system includes a testing device that includes a presentation interface, a user input interface, a memory device and a processor coupled in communication with the presentation interface, the user input interface, and the memory device. The processor causes the testing device to present to a user, prior to a test session, at least one demonstrative instruction for conducting a test session using the testing device, and at least one test instruction for use while the user is conducting a test session using the device.
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公开(公告)号：US20150362462A1
公开(公告)日：2015-12-17
申请号：US14304180
申请日：2014-06-13
Applicant: General Electric Company
Inventor： Daniel Scott Groninger , Soundarrajan Kaliaperumal , Galen Lee Swyers , David George Perrett
CPC classification number: G01N27/9086 , G01B7/105 , G01N27/9046
Abstract: A method and system for dynamically adjusting a gain of an eddy current device are provided. The method includes providing calibration information to the eddy current device using a probe and switching between a first mode and a second mode of the eddy current device, the first mode exciting only a first coil to measure liftoff of the probe from a surface of a workpiece, the second mode exciting the first coil and a second coil to measure dimensions of a flaw within a workpiece. The method also includes determining a thickness of a non-conductive coating covering at least a portion of the workpiece using the first coil, adjusting a gain setting of the eddy current device based on the determined thickness and the calibration information, and determining dimensions of the flaw using the first and second coils and the adjusted gain setting.
Abstract translation: 提供了用于动态调节涡流装置的增益的方法和系统。 该方法包括使用探头向涡流装置提供校准信息，并且在涡流装置的第一模式和第二模式之间切换，第一模式仅激励第一线圈以测量探头从工件表面起飞 激励第一线圈的第二模式和用于测量工件内的缺陷的尺寸的第二线圈。 该方法还包括使用第一线圈确定覆盖工件的至少一部分的非导电涂层的厚度，基于所确定的厚度和校准信息来调整涡流装置的增益设置，以及确定 使用第一和第二线圈的缺陷和调整的增益设置。
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公开(公告)号：US20180292205A1
公开(公告)日：2018-10-11
申请号：US16002779
申请日：2018-06-07
Applicant: General Electric Company
Inventor： Daniel Scott Groninger
IPC: G01B21/00 , G01N27/90 , G01N29/06 , G01N29/22 , G01N29/265
Abstract: An inspection system, in an embodiment, can be operable with a probe and a position tracker to inspect an object. The system can be operable to display at least one probe travel axis, receive first and second inspection values from the probe, associate the first inspection value with a first position point, and associate the second inspection value with a second position point. The system displays an inspection path based on the associations. The inspection path extends relative to the probe travel axis.
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公开(公告)号：US10018465B2
公开(公告)日：2018-07-10
申请号：US14865533
申请日：2015-09-25
Applicant: General Electric Company
Inventor： Daniel Scott Groninger
IPC: G01B21/00 , G01N27/90 , G01N29/22 , G01N29/06 , G01N29/265
CPC classification number: G01B21/00 , G01N27/90 , G01N27/9006 , G01N29/0609 , G01N29/0645 , G01N29/22 , G01N29/265
Abstract: An inspection system, in an embodiment, can be operable with a probe and a position tracker to inspect an object. The system can be operable to display at least one probe travel axis, receive first and second inspection values from the probe, associate the first inspection value with a first position point, and associate the second inspection value with a second position point. The system displays an inspection path based on the associations. The inspection path extends relative to the probe travel axis.
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