Modular power circuit assembly
    1.
    发明授权
    Modular power circuit assembly 失效
    模块化电源电路组件

    公开(公告)号:US5353194A

    公开(公告)日:1994-10-04

    申请号:US142723

    申请日:1993-10-24

    Abstract: A modular construction power circuit arrangement is disclosed which comprises a thin metal plate performing holder and heat sink functions, a multiplicity of electronic devices in the form of semiconductor material chips having metalized pads as their terminals, a printed circuit board attached to the thin metal plate, electric conductors between the metalized pads and the printed circuit on the board, terminating connectors which form a part of the printed circuit board for connecting the circuit arrangement to external circuits, and a plastics material body which conglomerates a portion of the thin metal plate, the semiconductor material chips, and the printed circuit board. At least one of the semiconductor material chips is attached directly to the thin metal plate and extends therefrom through an opening in the printed circuit board.

    Abstract translation: 公开了一种模块化结构电力电路装置,其包括执行保持器和散热器功能的薄金属板,具有金属化焊盘作为其端子的半导体材料芯片形式的多个电子器件,附接到薄金属板的印刷电路板 ,金属化焊盘与板上的印刷电路之间的电导体,形成用于将电路装置连接到外部电路的印刷电路板的一部分的终端连接器以及聚集薄金属板的一部分的塑料材料体, 半导体材料芯片和印刷电路板。 半导体材料芯片中的至少一个直接附接到薄金属板,并从其穿过印刷电路板的开口延伸。

    "> Universal multicontact connection between an EWS probe card and a test
card of a
    4.
    发明授权
    Universal multicontact connection between an EWS probe card and a test card of a "test-on-wafer" station 失效
    EWS探针卡与“测试在线”站的测试卡之间的通用多重连接

    公开(公告)号:US5187431A

    公开(公告)日:1993-02-16

    申请号:US716704

    申请日:1991-06-18

    CPC classification number: H01R31/06 G01R1/07378 H01R12/52

    Abstract: An universal connector employing a plurality of double female contacts installed with a certain clearance in receptacles of a body which may be suspended in a coupling position with a plurality of male contacts arranged on the top face of an EWS probe card and with a plurality of male contacts arranged on the bottom surface of a test card in a test-on-wafer station, provides a multicontact universal connection for any pair of so equipped cards of the inventories of probe cards and of test cards of the station. The connection is easily set up and exhibits excellent stability and uniformity characteristics of the electrical couplings, while reducing sensibly the time necessary for the setting-up and debugging of the test station for initiating a certain cycle of testing-on-wafer. The stability and reproducibility of the electrical couplings provided by the connection increases the precision of the measurements of critical parameters of the integrated devices with a positive effect on the production yield.

Patent Agency Ranking