公开(公告)号：US20030015671A1

公开(公告)日：2003-01-23

申请号：US09908925

申请日：2001-07-19

Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION

Inventor： David E. Lackey ,  Theodore M. Levin ,  Leah M. Pastel

IPC: G21G005/00 ,  A61N005/00

CPC classification number: H01J37/3056 ,  H01J2237/304 ,  H01J2237/31737 ,  H01J2237/31742

Abstract: An apparatus for assisting backside focused ion beam (FIB) device modification is disclosed. The apparatus for assisting backside FIB device modification includes an FIB device modification circuit and a control circuit. The FIB device modification circuit includes an input, an output, an FIB input pad, and an FIB output pad. The FIB device modification circuit allows the input to be electrically connected to the output. The control circuit, which is coupled to the FIB device modification circuit, may include a jumper and a cut. The control circuit is preferably located in a proximity of a backside of a substrate to allow the jumper and the cut to be modified by an FIB machine.

公开(公告)号：US20030033566A1

公开(公告)日：2003-02-13

申请号：US09927011

申请日：2001-08-09

Applicant: International Business Machines Corporation

Inventor： Thomas W. Bartenstein ,  L. Owen Farnsworth III ,  Douglas C. Heaberlin ,  Edward E. Horton III ,  Leendert M. Huisman ,  Leah M. Pastel ,  Glen E. Richard ,  Raymond J. Rosner ,  Francis Woytowich

IPC: G11C029/00

CPC classification number: G11C29/26

Abstract: A method of testing a semiconductor device having a memory is disclosed. The method includes selecting a portion of the memory; testing the selected portion of the memory; designating the selected portion of the memory as a designated memory in response to an acceptable testing result; and storing data in the designated portion of the memory for retrieval at a later time. Provision for soft repair of the selected memory is made. Test data can be compressed before being stored in the designated memory.

Abstract translation: 公开了一种测试具有存储器的半导体器件的方法。 该方法包括选择存储器的一部分; 测试存储器的选定部分; 响应于可接受的测试结果，将存储器的所选部分指定为指定存储器; 并在稍后的时间将数据存储在存储器的指定部分中以进行检索。 对所选择的存储器进行软修复。 测试数据可以在存储在指定的存储器中之前进行压缩。