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公开(公告)号:US11482433B2
公开(公告)日:2022-10-25
申请号:US16932594
申请日:2020-07-17
Applicant: Intel Corporation
Inventor: Ashutosh Sagar , Chao-Kai Liang , Miye Hopkins , Weimin Han , Robert James
IPC: H01L21/67 , H05B6/70 , H01L21/677
Abstract: Stacked thermal process chamber module for remote radiative heating of semiconductor device workpieces. A stacked thermal process module may include a stack of thermal process chambers and one or more generators of electromagnetic radiation. The electromagnetic radiation may be transported from a generator remote from the process chambers through one or more waveguides, thereby minimizing the volume and/or cleanroom footprint of the stacked thermal process chamber module. A waveguide may terminate in a process chamber so that electromagnetic radiation delivered during a thermal process may be coupled into one or more materials of the workpiece. The radiative heating process may overcome many of the limitations of thermal process chambers that instead employ a local heat source located within a process chamber.
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公开(公告)号:US20200066841A1
公开(公告)日:2020-02-27
申请号:US16461071
申请日:2016-12-12
Applicant: Intel Corporation
Inventor: Ashutosh Sagar , Sridhar Govindaraju
Abstract: An apparatus includes a non-planar semiconductor body; and a contact for the semiconductor body. The contact includes an epitaxial material that is formed on and contacts the semiconductor body. The contact includes a second material that is formed on and contacts the epitaxial material; and the second material at least partially conforms to an undercut of the epitaxial material.
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公开(公告)号:US11978776B2
公开(公告)日:2024-05-07
申请号:US16461071
申请日:2016-12-12
Applicant: Intel Corporation
Inventor: Ashutosh Sagar , Sridhar Govindaraju
IPC: H01L29/417 , H01L21/8234 , H01L29/45 , H01L29/66 , H01L29/78
CPC classification number: H01L29/41791 , H01L21/823418 , H01L21/823431 , H01L29/66795 , H01L29/7851 , H01L29/7853 , H01L29/456 , H01L29/785 , H01L2029/7858 , H01L2224/16502 , H01L2924/01322 , H01L2924/014
Abstract: An apparatus includes a non-planar semiconductor body; and a contact for the semiconductor body. The contact includes an epitaxial material that is formed on and contacts the semiconductor body. The contact includes a second material that is formed on and contacts the epitaxial material; and the second material at least partially conforms to an undercut of the epitaxial material.
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公开(公告)号:US20220020613A1
公开(公告)日:2022-01-20
申请号:US16932594
申请日:2020-07-17
Applicant: Intel Corporation
Inventor: Ashutosh Sagar , Chao-Kai Liang , Miye Hopkins , Weimin Han , Robert James
Abstract: Stacked thermal process chamber module for remote radiative heating of semiconductor device workpieces. A stacked thermal process module may include a stack of thermal process chambers and one or more generators of electromagnetic radiation. The electromagnetic radiation may be transported from a generator remote from the process chambers through one or more waveguides, thereby minimizing the volume and/or cleanroom footprint of the stacked thermal process chamber module. A waveguide may terminate in a process chamber so that electromagnetic radiation delivered during a thermal process may be coupled into one or more materials of the workpiece. The radiative heating process may overcome many of the limitations of thermal process chambers that instead employ a local heat source located within a process chamber.
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