公开(公告)号：US10891172B2

公开(公告)日：2021-01-12

申请号：US15770790

申请日：2015-12-24

Applicant: INTEL CORPORATION

Inventor： Yuping Yang ,  Dujian Wu ,  Shijie Liu ,  Daquan Dong

IPC: G06F9/54 ,  G06F9/4401 ,  G06F9/455 ,  G06F9/48

Abstract: A method includes modifying a basic input/output system (BIOS) to load a virtual general purpose input/output (GPIO) driver in an operating system, the virtual GPIO driver comprising at least one control method to monitor a system control interrupt (SCI) (202). The method can also include detecting the system control interrupt invoking the virtual GPIO driver (204) and executing the control method corresponding to the system control interrupt, the control method to be identified in the modified BIOS (206). Furthermore, the method can include detecting an error from the execution of the control method (208) and modifying an operating system to prevent the error (208), the modification comprising a modification to the control method.

公开(公告)号：US11894084B2

公开(公告)日：2024-02-06

申请号：US17421483

申请日：2019-02-08

Applicant: Intel Corporation

Inventor： Dujian Wu ,  Shijian Ge ,  Daocheng Bu

IPC: G11C29/10 ,  G11C29/02 ,  G11C29/38 ,  G11C29/46 ,  G11C29/12

CPC classification number: G11C29/10 ,  G11C29/12005 ,  G11C29/12015 ,  G11C29/38 ,  G11C29/46

Abstract: Method, systems and apparatuses may provide for technology that executes a margin test of a first memory storage based on a subset of first signals associated with the first memory storage. The technology determines, based on the margin test, first margin data to indicate whether the first memory storage complies with one or more electrical constraints. The technology determines, based on the first margin data, whether to execute a signal training process.

公开(公告)号：US11625167B2

公开(公告)日：2023-04-11

申请号：US17255189

申请日：2018-11-16

Applicant: Intel Corporation

Inventor： Dujian Wu ,  Yuping Yang ,  Donggui Yin

IPC: G06F3/06 ,  G06F12/02

Abstract: An embodiment of a semiconductor apparatus may include technology to determine if a threshold is met based on runtime memory usage, and enable foreground memory deduplication if the threshold is determined to be met. Other embodiments are disclosed and claimed.

公开(公告)号：US11455261B2

公开(公告)日：2022-09-27

申请号：US16643353

申请日：2017-09-29

Applicant: Intel Corporation

Inventor： Kevin Yufu Li ,  Donggui Yin ,  Zijian You ,  Shihui Li ,  Dujian Wu

IPC: G06F3/00 ,  G06F13/16 ,  G06F9/4401 ,  G06F13/40

Abstract: An embodiment of a semiconductor package apparatus may include technology to identify a partial set of populated memory channels from a full set of populated memory channels of a multi-channel memory system, and complete a first boot of an operating system with only the identified partial set of memory channels of the multi-channel memory system. Other embodiments are disclosed and claimed.

公开(公告)号：US20210311818A1

公开(公告)日：2021-10-07

申请号：US17255109

申请日：2018-12-11

Applicant: INTEL CORPORATION

Inventor： Vincent Zimmer ,  Anil Agrawal ,  Dujian Wu ,  Shijian Ge ,  Zhenglong Wu

IPC: G06F11/07

Abstract: Systems, apparatuses and methods may provide for technology that handles failures in memory hardware (e.g., dynamic random access memory (DRAM)) via runtime post package repair. Such technology may include operations to perform a runtime post package repair in response to a memory hardware failure detected in the memory. In such an example, the runtime post package repair may be done after power up boot operations have been completed.

公开(公告)号：US20210271397A1

公开(公告)日：2021-09-02

申请号：US17255189

申请日：2018-11-16

Applicant: Intel Corporation

Inventor： Dujian Wu ,  Yuping Yang ,  Donggui Yin

IPC: G06F3/06 ,  G06F12/02

Abstract: An embodiment of a semiconductor apparatus may include technology to determine if a threshold is met based on runtime memory usage, and enable foreground memory deduplication if the threshold is determined to be met. Other embodiments are disclosed and claimed.