公开(公告)号：US10935584B2

公开(公告)日：2021-03-02

申请号：US16551240

申请日：2019-08-26

Applicant: Keysight Technologies, Inc.

Inventor： Hong-Wei Kong ,  Ya Jing ,  Zhu Wen

IPC: H04B17/00 ,  G01R29/08 ,  G01R29/10 ,  H04B17/10 ,  H04B7/06 ,  H04B7/0452 ,  H04B17/309 ,  H04B17/15 ,  H04B17/391

Abstract: A system and a method to determine beam dynamics and multi-user performance of a base station having an antenna array including multiple antenna elements are disclosed. The system includes a measurement probe antenna positioned in a mid-field of the antenna array, a reference antenna having a fixed position with respect to the base station antenna array, and a coupling probe array including multiple coupling probe antennas positioned in a reactive field of the base station antenna array for coupling RF signals of the antenna elements to selected coupling probe antennas to form a high dimension radiation channel matrix between the antenna array and the coupling probe array. The system further includes a channel emulator configured to receive the measured antenna element patterns from the measurement probe antenna, to receive the RF signals coupled to the selected coupling probe antennas, to provide bi-directional channel models of channels between the base station and user devices.

公开(公告)号：US20200213016A1

公开(公告)日：2020-07-02

申请号：US16551244

申请日：2019-08-26

Applicant: Keysight Technologies, Inc.

Inventor： Ya Jing ,  Hong-Wei Kong ,  Zhu Wen

IPC: H04B17/10 ,  G01R29/10

Abstract: A method for testing an antenna array uses a probe antenna to measure an RF signal antenna pattern of the antenna array. The method includes measuring the RF signal antenna pattern at a first position and at a second position relative to the antenna array. The first position and the second position are located at different distances from the antenna array in a middle field of the antenna array. The middle field satisfies near field criteria for the antenna array and also satisfies far field criteria for each antenna element of the plurality of antenna elements in the antenna array. The method further includes determining, based on the first measurement and based on the second measurement, the RF signal antenna pattern at a third position relative to the antenna array located in a far field of the antenna array.

公开(公告)号：US10574369B2

公开(公告)日：2020-02-25

申请号：US15629211

申请日：2017-06-21

Applicant: Keysight Technologies, Inc.

Inventor： Ya Jing ,  Hong-Wei Kong

IPC: H04B17/318 ,  H04B7/0413 ,  H04W24/08

Abstract: A MIMO test system is provided that performs non-cable-conducted, over-the-air radiated calibration and test modes of operations. A DUT is located in an anechoic chamber having a plurality of probe antennas disposed therein. During the calibration mode, the test instrument causes predetermined signals to be transmitted over a transmission channel comprising a non-cable-conducted, OTA interface between probe antennas of the chamber and antenna ports of the DUT and obtains measurements of received power and relative phase. The test instrument uses the measurements to construct a radiation channel matrix associated with the transmission channel and obtains an inverse matrix of the radiation channel matrix. During the test mode, the test system performs a non-cable-conducted, OTA radiated test during which the test instrument applies the inverse matrix to DUT performance measurements obtained by the test instrument to calibrate out the radiation channel matrix from the DUT performance measurements.

公开(公告)号：US20180337738A1

公开(公告)日：2018-11-22

申请号：US15615442

申请日：2017-06-06

Applicant: Keysight Technologies, Inc.

Inventor： Zhu Wen ,  Ya Jing ,  Shao-Bo Chen ,  Hong-Wei Kong

IPC: H04B17/00 ,  H04B17/29 ,  H04B17/391 ,  H04B7/04 ,  H04B17/12

CPC classification number: H04B17/0082 ,  H04B7/04 ,  H04B17/0085 ,  H04B17/12 ,  H04B17/29 ,  H04B17/391

Abstract: A test system for testing a device under test includes: a signal processor configured to generate a plurality of independent signals and to apply first fading channel characteristics to each of the independent signals to generate a plurality of first faded test signals; a test system interface configured to provide the plurality of first faded test signals to one or more signal input interfaces of the device under test (DUT); a second signal processor configured to apply second fading channel characteristics to a plurality of output signals of the DUT to generate a plurality of second faded test signals, wherein the second fading channel characteristics are derived from the first fading channel characteristics; and one or more test instruments configured to measure at least one performance characteristic of the DUT from the plurality of second faded test signals.

公开(公告)号：US09917661B2

公开(公告)日：2018-03-13

申请号：US15153544

申请日：2016-05-12

Applicant: Keysight Technologies, Inc.

Inventor： Zhu Wen ,  Hong-Wei Kong ,  Ya Jing

IPC: H04B17/00 ,  H04B17/14 ,  H04B17/345 ,  H04B7/0413 ,  H04B10/2575 ,  H04B17/12

CPC classification number: H04B17/14 ,  H04B7/0413 ,  H04B10/2575 ,  H04B17/0085 ,  H04B17/12 ,  H04B17/345 ,  H04B2210/006

Abstract: A test system includes a single-channel signal generator configured to generate an autocorrelation test signal to be distributed to each of a plurality of RF channels of a device under test (DUT). A time offset network includes a plurality of time offset channels each corresponding to one of the plurality of RF channels of the DUT, and is configured to, in combination with the DUT, provide corresponding autocorrelation test signals each with a different time delay as respective RF channel test signals. A single-channel measurement instrument is configured to process a single-channel test signal, based upon a combination of the RF channel test signals, to independently measure at least one characteristic of each of the RF channels of the DUT. The time offset network may be configured to be coupled between the single-channel signal generator and the DUT. Or, the time offset network may be configured to be coupled between the DUT and the single-channel measurement instrument.

公开(公告)号：US20240214080A1

公开(公告)日：2024-06-27

申请号：US18031835

申请日：2020-10-22

Applicant: Keysight Technologies, Inc.

Inventor： Ya Jing ,  Thorsten Hertel ,  Zhu Wen ,  Li Cao

IPC: H04B17/10 ,  G01R29/10 ,  H04B17/11

CPC classification number: H04B17/102 ,  G01R29/10 ,  H04B17/11

Abstract: A method determines corrected TRP or TIS of an AUT in a near-field test chamber, the AUT having a phase center offset from a rotation center of the test chamber. The method includes performing EIRP or EIS measurements of the AUT at first sampling grid points on a first closed-surface geometric shape centered at the rotation center; mapping second sampling grid points to the first closed-surface geometric shape to provide mapped sampling grid points on the first closed-surface geometric shape, where the second sampling grid points are on a second closed-surface geometric shape centered at the phase center of the AUT; determining estimated EIRPs or EISs at the mapped sampling grid points using the EIRP or EIS measurements; scaling the estimated EIRPs or EISs at the mapped sampling grid points to provide scaled EIRPs or EISs; and calculating the corrected TRP or TIS based on the scaled EIRPs or EISs.

公开(公告)号：US20230258703A1

公开(公告)日：2023-08-17

申请号：US17059572

申请日：2020-10-22

Applicant: Keysight Technologies, Inc.

Inventor： Zhu Wen ,  Ya Jing ,  Li Cao ,  Thorsten Hertel

IPC: G01R29/08 ,  G01R29/10

CPC classification number: G01R29/0892 ,  G01R29/105

Abstract: A system and method are provided to determine at least one of equivalent isotropic radiated power (EIRP) or effective isotropic sensitivity (EIS) of an antenna under test (AUT) in a test chamber, the AUT including an antenna array with an array phase center that is offset from a center of a quiet zone of the test chamber. The method includes performing a local beam peak direction scan of an antenna pattern of the AUT using a probe antenna located at laterally offset positions at a near-field distance from the AUT to determine a beam peak direction; performing EIRP and/or EIS near-field measurements of the AUT in the determined beam peak direction using the probe antenna located at near-field distances from the AUT in a radial direction; deriving a far-field equivalent of the EIRP and/or EIS near-field measurement along the determined beam peak direction; and deriving the beam peak direction of the AUT.

公开(公告)号：US20210136867A1

公开(公告)日：2021-05-06

申请号：US17145768

申请日：2021-01-11

Applicant: Keysight Technologies, Inc.

Inventor： Steve G. Duffy ,  Xu Zhao ,  Hong-Wei Kong ,  Ya Jing

IPC: H04W88/06 ,  H04W76/15 ,  H04W36/14 ,  H04W24/06 ,  H04W36/24 ,  H04W36/28

Abstract: A test system includes: a signal processor configured to generate a plurality of orthogonal baseband sequences; a signal generator configured to supply the plurality of orthogonal baseband sequences to a corresponding plurality of RF transmitters of a device under test (DUT), wherein the RF transmitters each employ the corresponding orthogonal baseband sequence to generate a corresponding RF signal on a corresponding channel among a plurality of channels of the DUT such that the RF transmitters output a plurality of orthogonal RF signals at a same time; a combiner network configured to combine the plurality of orthogonal RF signals and to output a single signal under test; and a single channel measurement instrument configured to receive the single signal under test and to measure independently therefrom at least one characteristic of each of the RF transmitters. Orthogonal RF test signals may be used similarly to test RF receivers of the DUT.

公开(公告)号：US09992050B2

公开(公告)日：2018-06-05

申请号：US15388526

申请日：2016-12-22

Applicant: Keysight Technologies, Inc.

Inventor： Hong-Wei Kong ,  Ya Jing

IPC: H04L27/26 ,  H04B7/0413 ,  H04B7/06 ,  H04L7/00 ,  H04L7/04 ,  H04L27/227 ,  H04L27/38 ,  H04L27/00

CPC classification number: H04L27/2602 ,  H04B7/0413 ,  H04B7/06 ,  H04L7/0091 ,  H04L7/04 ,  H04L27/227 ,  H04L27/3818 ,  H04L2027/0016 ,  H04L2027/0024

Abstract: The multi-channel signal processing device includes a multi-channel continuous waveform (CW) phase shifter module configured to generate phase control and filter interference therein for multiple local oscillator (LO) signals at a same frequency, a multi-channel up-converter module configured to up-convert the multiple LO signals to a desired frequency and filter respective image signals therein, and a multi-channel wideband mixer module configured to receive and mix the up-converted LO signals at the desired frequency from the multi-channel up-converter module with radio frequency (RF) signals.

公开(公告)号：US20160212641A1

公开(公告)日：2016-07-21

申请号：US15001164

申请日：2016-01-19

Applicant: Keysight Technologies, Inc.

Inventor： Hong-Wei Kong ,  Ya Jing ,  Xu Zhao

IPC: H04W24/06 ,  H04B7/04

CPC classification number: H04B17/0087 ,  H04B7/0413 ,  H04B17/3911

Abstract: A test system for testing a device under test includes: a signal processor configured to generate a plurality of independent signals and to apply first fading channel characteristics to each of the independent signals to generate a plurality of first faded test signals; a test system interface configured to provide the plurality of first faded test signals to one or more signal input interfaces of the device under test (DUT); a second signal processor configured to apply second fading channel characteristics to a plurality of output signals of the DUT to generate a plurality of second faded test signals, wherein the second fading channel characteristics are derived from the first fading channel characteristics; and one or more test instruments configured to measure at least one performance characteristic of the DUT from the plurality of second faded test signals.

Abstract translation: 用于测试被测设备的测试系统包括：信号处理器，被配置为产生多个独立信号，并且将第一衰落信道特性应用于每个独立信号以产生多个第一衰落测试信号; 测试系统接口，其被配置为将所述多个第一衰落测试信号提供给被测器件（DUT）的一个或多个信号输入接口; 第二信号处理器，被配置为将第二衰落信道特性应用于DUT的多个输出信号以产生多个第二衰落测试信号，其中从第一衰落信道特性导出第二衰落信道特性; 以及一个或多个测试仪器，被配置为从多个第二衰落测试信号中测量DUT的至少一个性能特性。